NZ759918B2 - Image contrast enhancement for optical microscopy - Google Patents
Image contrast enhancement for optical microscopy Download PDFInfo
- Publication number
- NZ759918B2 NZ759918B2 NZ759918A NZ75991818A NZ759918B2 NZ 759918 B2 NZ759918 B2 NZ 759918B2 NZ 759918 A NZ759918 A NZ 759918A NZ 75991818 A NZ75991818 A NZ 75991818A NZ 759918 B2 NZ759918 B2 NZ 759918B2
- Authority
- NZ
- New Zealand
- Prior art keywords
- light
- plasmonic layer
- layer
- transmitted
- plasmonic
- Prior art date
Links
- 238000000399 optical microscopy Methods 0.000 title 1
- 238000000034 method Methods 0.000 claims abstract 23
- 238000002198 surface plasmon resonance spectroscopy Methods 0.000 claims abstract 8
- 230000000737 periodic effect Effects 0.000 claims abstract 6
- 238000003384 imaging method Methods 0.000 claims abstract 3
- 230000001902 propagating effect Effects 0.000 claims abstract 3
- 239000010410 layer Substances 0.000 claims 21
- 230000003287 optical effect Effects 0.000 claims 5
- 239000011241 protective layer Substances 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 2
- 229910052581 Si3N4 Inorganic materials 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 1
- 229910052782 aluminium Inorganic materials 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 claims 1
- 230000002708 enhancing effect Effects 0.000 claims 1
- 229910052737 gold Inorganic materials 0.000 claims 1
- 229910052751 metal Inorganic materials 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 229910044991 metal oxide Inorganic materials 0.000 claims 1
- 150000004706 metal oxides Chemical class 0.000 claims 1
- 150000002739 metals Chemical class 0.000 claims 1
- 229910052759 nickel Inorganic materials 0.000 claims 1
- 229910052763 palladium Inorganic materials 0.000 claims 1
- 229910052697 platinum Inorganic materials 0.000 claims 1
- 229920000642 polymer Polymers 0.000 claims 1
- 238000000926 separation method Methods 0.000 claims 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims 1
- 229910052814 silicon oxide Inorganic materials 0.000 claims 1
- 229910052709 silver Inorganic materials 0.000 claims 1
- 238000001429 visible spectrum Methods 0.000 claims 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0092—Polarisation microscopes
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/34—Microscope slides, e.g. mounting specimens on microscope slides
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/008—Surface plasmon devices
Abstract
method of imaging an object including: supporting the object on a plasmonic layer of a sample holder, wherein the plasmonic layer defines a periodic array of sub-micron structures adjacent the object; exposing the sample holder to light such that: a first portion of the light is transmitted through either: (i) the plasmonic layer but not the object, or (ii) the plasmonic layer and a first section of the object; and a second portion of the light is transmitted through the plasmonic layer and at least a second section of the object; wherein the light interacts with at least the plasmonic layer such that: the first portion of the transmitted light is characterised by one or more first surface plasmon resonance peaks, and the second portion of the transmitted light is characterised by one or more second surface plasmon resonance peaks that are wavelength shifted from the first surface plasmon resonance peaks as a result of the object affecting plasmons propagating within the plasmonic layer; and constructing an image of the object from the first and the second portions of the transmitted light to thereby enable the object to be spatially resolved.
Claims (19)
1. A method of imaging an object including: supporting the object on a plasmonic layer of a sample holder, wherein the plasmonic layer defines a periodic array of sub-micron structures adjacent the object; exposing the sample holder to light such that: a first portion of the light is transmitted through either: (i) the plasmonic layer but not the object, or (ii) the plasmonic layer and a first section of the object; and a second n of the light is transmitted through the plasmonic layer and at least a second section of the ; wherein the light interacts with at least the plasmonic layer such that: the first portion of the transmitted light is characterised by one or more first surface plasmon resonance peaks, and the second portion of the transmitted light is characterised by one or more second surface plasmon resonance peaks that are wavelength d from the first surface plasmon resonance peaks as a result of the object ing plasmons propagating within the plasmonic layer; and constructing an image of the object from the first and the second portions of the transmitted light to thereby enable the object to be spatially resolved.
2. The method of claim 1, further including analysing the image to spatially resolve the object.
3. The method of claim 1 or claim 2, wherein the light has a ity of wavelengths in the range of 200 nm to 900 nm.
4. The method of any one of the preceding claims, wherein at least one of the first and the second surface n resonance peaks have a peak intensity at a wavelength in the range of 300 nm to 800 nm.
5. The method of any one of the preceding claims, wherein the sub-micron structures are at least one of: arranged in a periodic array with a separation n the sub-micron structures in the range of 200 nm to 500 nm; 1004906129 formed having a largest dimension in the range of 50 nm to 300 nm; formed as apertures through the plasmonic layer.
6. The method of claim 5, wherein the apertures are shaped as any one or more of: a circle, a torus, an ellipse, a cross, and a shape including a plurality of intersecting elongate arms.
7. The method of claim 6, wherein an angle between adjacent elongate arms is in a range of 30° to 90°.
8. The method of any one of the preceding claims, further including exposing the sample holder and the object to polarised light.
9. The method of claim 8, wherein the polarised light is linearly sed at a first polarisation angle with respect to a first axis of the periodic array of apertures, the periodic array having a first g of the sub-micron ures along the first axis that is different to a second g of sub-micron structures along a second axis, and the second axis being oriented at an angle to the first axis.
10. The method of claim 9, further including exposing the sample holder and object to linearly polarised light at a second polarisation angle with respect to the first axis.
11. The method according to any one of the preceding claims, including performing the method using an optical microscope.
12. The method according to any one of the preceding claims, wherein the plasmonic layer is formed from one or more metals selected from any one of: Al, Ag, Au, Ni, Pt and Pd.
13. The method of any one of the preceding claims, wherein the plasmonic layer has a thickness in the range of 20 nm to 300 nm.
14. The method of any one of the preceding claims, n the sample holder includes a ate connected to at least a portion of a first surface of the plasmonic layer to e ical support for the plasmonic layer.
15. The method of claim 14, wherein the ate is optically clear such that optical transmission through the substrate is greater than zero and the substrate chemically isolates the first surface.
16. The method of any one of the preceding claims, wherein the sample holder includes an optically clear protective layer bonded to a second side of the plasmonic layer to isolate the plasmonic layer.
17. The method of claim 16, wherein the optically clear protective layer includes at least one of: a ess less than 150 nm; a thickness less than 80 nm; or any one or more of: silicon oxide, silicon nitride, transparent metal oxide, and a polymer.
18. The method of any one of the preceding claims, wherein either the object includes a uniform thickness and/or density.
19. A method for enhancing image contrast of an object in a method of imaging an object in an l microscope, the image contrast being a contrast in colour, the method including: supporting the object on a plasmonic layer of a sample holder, wherein the nic layer s a periodic array of sub-micron structures adjacent the object; exposing the sample holder to light having wavelengths equal to or longer than the size of the sub-micron structures to provide plasmon polariton ation in the plasmonic layer such that: a first portion of the light is transmitted through the plasmonic layer but not the object; and a second portion of the light is transmitted h the plasmonic layer and the object; wherein the light has a plurality of wavelengths in the range of 200 nm to 900 nm and at least some of the transmitted light includes wavelengths in the visible spectrum; wherein the light interacts with the plasmonic layer and the object such that: the first portion of the transmitted light is characterised by one or more first surface plasmon resonance peaks, and the second portion of the transmitted light is terised by one or more second surface plasmon resonance peaks that are ngth shifted from the first surface plasmon 1004906129 resonance peaks as a result of the object affecting the plasmon polaritons propagating within the nic layer; and constructing an enhanced optical image of the object from the first and the second portions of the transmitted light to thereby enable the object to be spatially resolved, wherein ucting the enhanced optical image comprises projecting transmitted light from the first portion and the second portion onto an image plane using the optical microscope.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| AU2017901940A AU2017901940A0 (en) | 2017-05-22 | Image contrast enhancement for optical microscopy | |
| PCT/AU2018/050496 WO2018213881A1 (en) | 2017-05-22 | 2018-05-22 | Image contrast enhancement for optical microscopy |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| NZ759918A NZ759918A (en) | 2023-11-24 |
| NZ759918B2 true NZ759918B2 (en) | 2024-02-27 |
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