NO345903B1 - Chemical analysis method for measurement of tetrafluoromethane, cf4, with improved selectivity - Google Patents

Chemical analysis method for measurement of tetrafluoromethane, cf4, with improved selectivity

Info

Publication number
NO345903B1
NO345903B1 NO20170996A NO20170996A NO345903B1 NO 345903 B1 NO345903 B1 NO 345903B1 NO 20170996 A NO20170996 A NO 20170996A NO 20170996 A NO20170996 A NO 20170996A NO 345903 B1 NO345903 B1 NO 345903B1
Authority
NO
Norway
Prior art keywords
tetrafluoromethane
measurement
analysis method
chemical analysis
improved selectivity
Prior art date
Application number
NO20170996A
Other languages
Norwegian (no)
Other versions
NO20170996A1 (en
Inventor
Peter Geiser
Original Assignee
Neo Monitors As
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Neo Monitors As filed Critical Neo Monitors As
Priority to NO20170996A priority Critical patent/NO345903B1/en
Priority to PCT/NO2018/050153 priority patent/WO2018231065A1/en
Publication of NO20170996A1 publication Critical patent/NO20170996A1/en
Publication of NO345903B1 publication Critical patent/NO345903B1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
    • G01J3/433—Modulation spectrometry; Derivative spectrometry
    • G01J3/4338—Frequency modulated spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
    • G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
    • G01N33/0047—Organic compounds
    • G01N33/0049—Halogenated organic compounds
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3148—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using three or more wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G01N2021/396—Type of laser source
    • G01N2021/399—Diode laser
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G01N2201/12746—Calibration values determination
    • G01N2201/12753—Calibration values determination and storage

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
NO20170996A 2017-06-16 2017-06-16 Chemical analysis method for measurement of tetrafluoromethane, cf4, with improved selectivity NO345903B1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
NO20170996A NO345903B1 (en) 2017-06-16 2017-06-16 Chemical analysis method for measurement of tetrafluoromethane, cf4, with improved selectivity
PCT/NO2018/050153 WO2018231065A1 (en) 2017-06-16 2018-06-13 Chemical analysis method for measurement of tetrafluoromethane, cf4, with improved selectivity

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO20170996A NO345903B1 (en) 2017-06-16 2017-06-16 Chemical analysis method for measurement of tetrafluoromethane, cf4, with improved selectivity

Publications (2)

Publication Number Publication Date
NO20170996A1 NO20170996A1 (en) 2018-12-17
NO345903B1 true NO345903B1 (en) 2021-10-04

Family

ID=62791794

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20170996A NO345903B1 (en) 2017-06-16 2017-06-16 Chemical analysis method for measurement of tetrafluoromethane, cf4, with improved selectivity

Country Status (2)

Country Link
NO (1) NO345903B1 (en)
WO (1) WO2018231065A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113811758A (en) * 2019-05-15 2021-12-17 株式会社堀场制作所 Sample analyzer
US11079324B2 (en) * 2019-07-15 2021-08-03 Spectrasensors, Inc. Spectrometer with wide-scan tunable diode laser
CN117368424B (en) * 2023-12-08 2024-02-27 广东立腾医疗科技有限公司 Gas concentration detection compensation method and device, gas detection equipment and storage medium
CN117740731A (en) * 2024-02-08 2024-03-22 清华大学合肥公共安全研究院 Methane gas concentration detection method, storage medium, and electronic device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150053861A1 (en) * 2013-08-23 2015-02-26 Wicor Holding Ag Interference-compensating NDIR Gas Sensor for Measuring Acetylene
US20150253297A1 (en) * 2014-03-07 2015-09-10 City University Of Hong Kong Method and a device for detecting a substance

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060044562A1 (en) 2004-08-25 2006-03-02 Norsk Elektro Optikk As Gas monitor
JP2007192761A (en) * 2006-01-23 2007-08-02 Kankyo Semiconductors:Kk Absorption gas analyzer
JP2009236565A (en) * 2008-03-26 2009-10-15 Jasco Corp Automatic continuous quantifying and analyzing method of plurality of components and automatic continuous quantifying and analyzing apparatus
JP6253282B2 (en) * 2013-07-08 2017-12-27 理研計器株式会社 CF4 gas concentration measuring method and CF4 gas concentration measuring device
US9983126B2 (en) * 2015-02-06 2018-05-29 Block Engineering, Llc Quantum cascade laser (QCL) based gas sensing system and method
NO20150765A1 (en) 2015-06-11 2016-12-12 Neo Monitors As Gas monitor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150053861A1 (en) * 2013-08-23 2015-02-26 Wicor Holding Ag Interference-compensating NDIR Gas Sensor for Measuring Acetylene
US20150253297A1 (en) * 2014-03-07 2015-09-10 City University Of Hong Kong Method and a device for detecting a substance

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Geiser et al., «Quantum cascade laser based tetrafluoromethane and nitrogen oxide measurements for emission monitoring applications», 2014.07.17, Dated: 01.01.0001 *

Also Published As

Publication number Publication date
WO2018231065A1 (en) 2018-12-20
NO20170996A1 (en) 2018-12-17

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