NO2946640T3 - - Google Patents

Info

Publication number
NO2946640T3
NO2946640T3 NO14700699A NO14700699A NO2946640T3 NO 2946640 T3 NO2946640 T3 NO 2946640T3 NO 14700699 A NO14700699 A NO 14700699A NO 14700699 A NO14700699 A NO 14700699A NO 2946640 T3 NO2946640 T3 NO 2946640T3
Authority
NO
Norway
Application number
NO14700699A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NO2946640T3 publication Critical patent/NO2946640T3/no

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B64AIRCRAFT; AVIATION; COSMONAUTICS
    • B64GCOSMONAUTICS; VEHICLES OR EQUIPMENT THEREFOR
    • B64G1/00Cosmonautic vehicles
    • B64G1/22Parts of, or equipment specially adapted for fitting in or to, cosmonautic vehicles
    • B64G1/66Arrangements or adaptations of apparatus or instruments, not otherwise provided for
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05HPLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
    • H05H1/00Generating plasma; Handling plasma
    • H05H1/0006Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature
    • H05H1/0068Investigating plasma, e.g. measuring the degree of ionisation or the electron temperature by thermal means
    • H05H1/0075Langmuir probes

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Remote Sensing (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Plasma & Fusion (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Plasma Technology (AREA)
NO14700699A 2013-01-16 2014-01-16 NO2946640T3 (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB1300799.2A GB201300799D0 (en) 2013-01-16 2013-01-16 Langmuir Probe
PCT/EP2014/050824 WO2014111476A1 (en) 2013-01-16 2014-01-16 Langmuir probe

Publications (1)

Publication Number Publication Date
NO2946640T3 true NO2946640T3 (no) 2018-01-13

Family

ID=47758077

Family Applications (1)

Application Number Title Priority Date Filing Date
NO14700699A NO2946640T3 (no) 2013-01-16 2014-01-16

Country Status (8)

Country Link
US (1) US10317437B2 (no)
EP (1) EP2946640B1 (no)
DK (1) DK2946640T3 (no)
ES (1) ES2645672T3 (no)
GB (1) GB201300799D0 (no)
NO (1) NO2946640T3 (no)
PL (1) PL2946640T3 (no)
WO (1) WO2014111476A1 (no)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108919332A (zh) * 2018-05-16 2018-11-30 中国科学技术大学 一种用于超高速飞行器等离子体参数诊断的双平装探针装置
CN108650769B (zh) * 2018-07-25 2020-01-03 北京航空航天大学 高精度朗缪尔探针
CN109319172B (zh) * 2018-09-28 2022-01-21 兰州空间技术物理研究所 一种航天器在轨表面带电效应控制方法
RU199908U1 (ru) * 2020-04-15 2020-09-25 федеральное государственное бюджетное образовательное учреждение высшего образования «Томский государственный университет систем управления и радиоэлектроники» Зонд ленгмюра для диагностики газо-металлической плазмы
CN113189409B (zh) * 2021-04-14 2023-04-11 中国科学院国家空间科学中心 一种用于测量空间站在轨充电电位的装置
CN113862604A (zh) * 2021-08-10 2021-12-31 北京航空航天大学 低真空条件下等离子喷涂用接触探针诊断装置和方法
CN114900934B (zh) * 2022-06-08 2024-04-26 山东大学 一种加装了补偿电极的朗缪尔探针及探测方法
CN116359623B (zh) * 2023-03-09 2024-04-05 中国科学院力学研究所 一种基于双探针计算非均匀等离子体电场强度的方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5031125A (en) 1989-04-06 1991-07-09 Rikagaku Kenkyusho Apparatus for measuring electron temperature
JPH0719670B2 (ja) 1991-10-31 1995-03-06 日本高周波株式会社 空間電位誤差を補正するトリプルプローブ・プラズマ測定装置
KR101063083B1 (ko) * 2006-05-31 2011-09-07 도쿄엘렉트론가부시키가이샤 플라즈마 cvd 방법, 질화 규소막의 형성 방법, 반도체 장치의 제조 방법 및 플라즈마 cvd 장치

Also Published As

Publication number Publication date
EP2946640B1 (en) 2017-08-16
ES2645672T3 (es) 2017-12-07
WO2014111476A1 (en) 2014-07-24
PL2946640T3 (pl) 2018-01-31
EP2946640A1 (en) 2015-11-25
GB201300799D0 (en) 2013-02-27
DK2946640T3 (da) 2017-11-20
US10317437B2 (en) 2019-06-11
US20150355243A1 (en) 2015-12-10

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