NO20041786L - Fremgangsmate for utforing av transmisjonsdiffraksjonsanalyse - Google Patents

Fremgangsmate for utforing av transmisjonsdiffraksjonsanalyse

Info

Publication number
NO20041786L
NO20041786L NO20041786A NO20041786A NO20041786L NO 20041786 L NO20041786 L NO 20041786L NO 20041786 A NO20041786 A NO 20041786A NO 20041786 A NO20041786 A NO 20041786A NO 20041786 L NO20041786 L NO 20041786L
Authority
NO
Norway
Prior art keywords
procedure
diffraction analysis
performing transmission
transmission diffraction
analysis
Prior art date
Application number
NO20041786A
Other languages
English (en)
Inventor
Erwin Blomsma
Adriaan Jan Van Langevelde
Original Assignee
Avantium Internat Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=8181012&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=NO20041786(L) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Avantium Internat Bv filed Critical Avantium Internat Bv
Publication of NO20041786L publication Critical patent/NO20041786L/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)
NO20041786A 2001-10-03 2004-05-03 Fremgangsmate for utforing av transmisjonsdiffraksjonsanalyse NO20041786L (no)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US32645301P 2001-10-03 2001-10-03
EP01203756A EP1308716A1 (en) 2001-10-03 2001-10-03 Method for performing a transmission diffraction analysis
PCT/EP2002/011193 WO2003031959A2 (en) 2001-10-03 2002-10-03 Method for performing a transmission diffraction analysis

Publications (1)

Publication Number Publication Date
NO20041786L true NO20041786L (no) 2004-05-03

Family

ID=8181012

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20041786A NO20041786L (no) 2001-10-03 2004-05-03 Fremgangsmate for utforing av transmisjonsdiffraksjonsanalyse

Country Status (6)

Country Link
US (1) US7079621B2 (no)
EP (2) EP1308716A1 (no)
JP (1) JP4551658B2 (no)
CA (1) CA2460647C (no)
NO (1) NO20041786L (no)
WO (1) WO2003031959A2 (no)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004057340A1 (en) * 2002-12-23 2004-07-08 Astex Technology Limited Synthesis and screening of ligands using x-ray crystallography
US7597852B2 (en) 2004-09-03 2009-10-06 Symyx Solutions, Inc. Substrate for sample analyses
NL2002196C2 (en) * 2008-11-11 2010-05-17 Avantium Int Bv SAMPLE ANALYZES APPARATUS AND A METHOD OR ANALYZING A SAMPLE.
JP5696052B2 (ja) * 2008-12-08 2015-04-08 ギリアード コネチカット， インコーポレイテッド イミダゾピラジンｓｙｋ阻害剤
ES2489965B2 (es) * 2013-02-27 2015-05-22 Fundació Institut De Ciències Fotòniques Sistema compacto de medición óptica con placa discretizada
KR101750745B1 (ko) * 2016-01-22 2017-06-27 한국과학기술연구원 투과형 엑스선 회절 분석장치용 퍼니스 및 이를 이용한 투과형 엑스선 회절 분석장치
US11435300B2 (en) 2017-05-16 2022-09-06 Fct Actech Pty Ltd. Method and apparatus for analysing particulate material

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3354308A (en) * 1965-04-30 1967-11-21 Philips Electronic Pharma Apparatus with means to measure the characteristic X-ray emission from and the density of a material
US3378684A (en) * 1965-06-16 1968-04-16 Gen Electric Fluid sample cell with means to keep constant pressure on the sample fluid
JPS484948Y1 (no) * 1969-08-20 1973-02-07
JPS5129032Y2 (no) * 1972-07-25 1976-07-22
US4821303A (en) * 1986-12-05 1989-04-11 The Dow Chemical Company Combined thermal analyzer and x-ray diffractometer
JPH076511Y2 (ja) * 1988-07-29 1995-02-15 理学電機株式会社 Ｘ線回折装置の高温用試料ホルダ
JPH07294400A (ja) * 1994-04-28 1995-11-10 Rigaku Corp Ｘ線回折装置の試料保持装置
GB2297835A (en) * 1995-02-08 1996-08-14 Secr Defence Three dimensional detection of contraband using x rays
US5629524A (en) * 1995-02-21 1997-05-13 Advanced Scientific Concepts, Inc. High speed crystallography detector
US6039804A (en) * 1998-09-09 2000-03-21 Emerald Biostructures, Inc. Crystallization tray
DE19839472C1 (de) * 1998-08-29 2000-11-02 Bruker Axs Analytical X Ray Sy Automatischer Probenwechsler für Röntgen-Diffraktometer
AU2368900A (en) * 1998-12-18 2000-07-03 Symyx Technologies, Inc. Apparatus and method for characterizing libraries of different materials using x-ray scattering
JP4005729B2 (ja) * 1999-01-21 2007-11-14 キッセイ薬品工業株式会社 アミノエチルフェノキシ酢酸誘導体二水和物の結晶多形
SK14062001A3 (sk) * 1999-04-05 2002-12-03 Millennium Pharmaceuticals, Inc. Pole obsahujúce najmenej 96 formulácií, pričom každá z formulácií obsahuje známu aktívnu zložku a jednu alebo viac ďalších zložiek, a jeho použitie
US6404849B1 (en) * 1999-08-11 2002-06-11 Abbott Laboratories Automated sample handling for X-ray crystallography
JP2003519698A (ja) * 2000-01-07 2003-06-24 トランスフォーム ファーマスーティカルズ，インコーポレイテッド 多様な固体形態のハイスループットでの形成、同定および分析
US6507636B1 (en) 2000-02-10 2003-01-14 Studiengesellschaft Kohle Mbh Rapid X-ray diffraction screening method of polymorph libraries created in multi-well plates
EP1172646A1 (en) * 2000-07-13 2002-01-16 Universiteit Leiden Screening crystallisation conditions of organic compounds
US20020067800A1 (en) 2000-10-19 2002-06-06 Janet Newman Apparatus and method for identification of crystals by in-situ X-ray diffraction
EP1490671B1 (en) * 2002-03-21 2012-05-09 Bruker AXS, Inc. Transmission mode X-ray diffraction screening system
US6956928B2 (en) * 2003-05-05 2005-10-18 Bruker Axs, Inc. Vertical small angle x-ray scattering system

Also Published As

Publication number Publication date
US7079621B2 (en) 2006-07-18
WO2003031959A3 (en) 2003-10-16
US20050069084A1 (en) 2005-03-31
JP4551658B2 (ja) 2010-09-29
JP2005504987A (ja) 2005-02-17
CA2460647A1 (en) 2003-04-17
EP1308716A1 (en) 2003-05-07
EP1432979A2 (en) 2004-06-30
CA2460647C (en) 2012-04-24
WO2003031959A2 (en) 2003-04-17

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