NL7801071A - DEVICE FOR INSPECTING DISTANCES IN A IMAGE. - Google Patents

DEVICE FOR INSPECTING DISTANCES IN A IMAGE.

Info

Publication number
NL7801071A
NL7801071A NL7801071A NL7801071A NL7801071A NL 7801071 A NL7801071 A NL 7801071A NL 7801071 A NL7801071 A NL 7801071A NL 7801071 A NL7801071 A NL 7801071A NL 7801071 A NL7801071 A NL 7801071A
Authority
NL
Netherlands
Prior art keywords
inspecting
distances
image
inspecting distances
Prior art date
Application number
NL7801071A
Other languages
Dutch (nl)
Original Assignee
Danielsson Erik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from SE7701565A external-priority patent/SE405050B/en
Priority claimed from SE7713716A external-priority patent/SE409767B/en
Application filed by Danielsson Erik filed Critical Danielsson Erik
Publication of NL7801071A publication Critical patent/NL7801071A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
NL7801071A 1977-02-11 1978-01-30 DEVICE FOR INSPECTING DISTANCES IN A IMAGE. NL7801071A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
SE7701565A SE405050B (en) 1977-02-11 1977-02-11 DEVICE FOR CONTROLING THE DISTANCE BETWEEN OBJECTS IN A TWO-DIMENSIONAL DISCREETIZED IMAGE
SE7713716A SE409767B (en) 1977-12-02 1977-12-02 DEVICE FOR CONTROLING THE DISTANCE BETWEEN OBJECTS IN A TWO-DIMENSIONAL DISCREETIZED IMAGE

Publications (1)

Publication Number Publication Date
NL7801071A true NL7801071A (en) 1978-08-15

Family

ID=26656782

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7801071A NL7801071A (en) 1977-02-11 1978-01-30 DEVICE FOR INSPECTING DISTANCES IN A IMAGE.

Country Status (8)

Country Link
US (1) US4170003A (en)
JP (1) JPS53121651A (en)
CH (1) CH631854A5 (en)
DE (1) DE2805754C2 (en)
FR (1) FR2380597B1 (en)
GB (1) GB1564181A (en)
IT (1) IT1093286B (en)
NL (1) NL7801071A (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4661984A (en) * 1977-06-03 1987-04-28 Bentley William A Line inspection system
DE2929846A1 (en) * 1979-07-23 1981-03-12 Siemens AG, 1000 Berlin und 8000 München OPTO-ELECTRONIC TESTING SYSTEM FOR AUTOMATIC CHECKING OF CHARACTERISTICS, THEIR INTERMEDIATE PRODUCTS AND PRINTING TOOLS
US4571497A (en) * 1982-08-19 1986-02-18 Eastman Kodak Company Method for continuously measuring the perimeter of wrapped objects
US4567372A (en) * 1982-08-19 1986-01-28 Eastman Kodak Company Method for continuously measuring the perimeter of wrapped objects of generally uniform cross-section
US4578810A (en) * 1983-08-08 1986-03-25 Itek Corporation System for printed circuit board defect detection
US4776022A (en) * 1985-04-09 1988-10-04 Aoi Systems, Inc. System for printed circuit board defect detection
DE4200173A1 (en) * 1992-01-07 1993-07-08 Tema Teubner & Mandewirth Gmbh Tensile testing of e.g. steel specimen - involves recording graduation changes of specimen markings

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3255437A (en) * 1961-01-23 1966-06-07 John W Ralls Electronic recognition
GB1063140A (en) * 1964-10-08 1967-03-30 Atomic Energy Authority Uk Improvements in or relating to tool-setting gauges
US3671941A (en) * 1969-05-31 1972-06-20 Iwatsu Electric Co Ltd Apparatus for judging and processing branches and or crossings for use in automatic curve tracing system
US3890596A (en) * 1970-11-12 1975-06-17 Philips Corp Method of and device for determining significant points of characters
DE2256617C3 (en) * 1971-11-19 1978-08-31 Hitachi, Ltd., Tokio Facility for analyzing a template
JPS4934385A (en) * 1972-07-28 1974-03-29
GB1431438A (en) * 1972-09-11 1976-04-07 Nat Res Dev Pattern recognition systems and apparatus
JPS5218136A (en) * 1975-08-01 1977-02-10 Hitachi Ltd Signal processing unit

Also Published As

Publication number Publication date
DE2805754A1 (en) 1978-08-17
DE2805754C2 (en) 1986-09-11
CH631854A5 (en) 1982-08-31
IT7820161A0 (en) 1978-02-10
GB1564181A (en) 1980-04-02
FR2380597A1 (en) 1978-09-08
JPS53121651A (en) 1978-10-24
US4170003A (en) 1979-10-02
FR2380597B1 (en) 1985-09-27
IT1093286B (en) 1985-07-19

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Legal Events

Date Code Title Description
A85 Still pending on 85-01-01
BA A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
BV The patent application has lapsed