NL7612146A - PROCEDURE FOR INCREASING RELIABILITY OF INTEGRATED MEMORY BUILDING BLOCKS AND FOR IMPROVING YIELD IN MANUFACTURING THEM. - Google Patents

PROCEDURE FOR INCREASING RELIABILITY OF INTEGRATED MEMORY BUILDING BLOCKS AND FOR IMPROVING YIELD IN MANUFACTURING THEM.

Info

Publication number
NL7612146A
NL7612146A NL7612146A NL7612146A NL7612146A NL 7612146 A NL7612146 A NL 7612146A NL 7612146 A NL7612146 A NL 7612146A NL 7612146 A NL7612146 A NL 7612146A NL 7612146 A NL7612146 A NL 7612146A
Authority
NL
Netherlands
Prior art keywords
procedure
manufacturing
building blocks
integrated memory
improving yield
Prior art date
Application number
NL7612146A
Other languages
Dutch (nl)
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of NL7612146A publication Critical patent/NL7612146A/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
NL7612146A 1975-11-04 1976-11-02 PROCEDURE FOR INCREASING RELIABILITY OF INTEGRATED MEMORY BUILDING BLOCKS AND FOR IMPROVING YIELD IN MANUFACTURING THEM. NL7612146A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19752549392 DE2549392C3 (en) 1975-11-04 1975-11-04 Method for increasing the reliability of integrated memory modules and for improving the yield of memory modules that appear to be error-free from the outside during their manufacture

Publications (1)

Publication Number Publication Date
NL7612146A true NL7612146A (en) 1977-05-06

Family

ID=5960852

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7612146A NL7612146A (en) 1975-11-04 1976-11-02 PROCEDURE FOR INCREASING RELIABILITY OF INTEGRATED MEMORY BUILDING BLOCKS AND FOR IMPROVING YIELD IN MANUFACTURING THEM.

Country Status (4)

Country Link
DE (1) DE2549392C3 (en)
FR (1) FR2331122A1 (en)
GB (1) GB1557684A (en)
NL (1) NL7612146A (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2934599C3 (en) * 1979-08-27 1982-04-08 Siemens AG, 1000 Berlin und 8000 München Circuit arrangement for the formation of check bits in an error correction device
US4319356A (en) * 1979-12-19 1982-03-09 Ncr Corporation Self-correcting memory system
US4317201A (en) * 1980-04-01 1982-02-23 Honeywell, Inc. Error detecting and correcting RAM assembly
US4380812A (en) * 1980-04-25 1983-04-19 Data General Corporation Refresh and error detection and correction technique for a data processing system
US4359771A (en) * 1980-07-25 1982-11-16 Honeywell Information Systems Inc. Method and apparatus for testing and verifying the operation of error control apparatus within a memory
US5177743A (en) * 1982-02-15 1993-01-05 Hitachi, Ltd. Semiconductor memory
JPS58139399A (en) * 1982-02-15 1983-08-18 Hitachi Ltd Semiconductor storage device
US4943967A (en) * 1982-02-15 1990-07-24 Hitachi, Ltd. Semiconductor memory with an improved dummy cell arrangement and with a built-in error correction code circuit
US4656605A (en) * 1983-09-02 1987-04-07 Wang Laboratories, Inc. Single in-line memory module
CA1232355A (en) * 1983-09-02 1988-02-02 Wang Laboratories, Inc. Single in-line memory module
US5798961A (en) * 1994-08-23 1998-08-25 Emc Corporation Non-volatile memory module

Also Published As

Publication number Publication date
DE2549392C3 (en) 1978-07-27
DE2549392B2 (en) 1977-12-01
FR2331122B3 (en) 1979-07-13
GB1557684A (en) 1979-12-12
DE2549392A1 (en) 1977-05-05
FR2331122A1 (en) 1977-06-03

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Legal Events

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BB A search report has been drawn up
BC A request for examination has been filed
BV The patent application has lapsed