NL7609845A - PROCEDURE FOR LOCALIZING A SHORT CIRCUIT IN A PRINT CHAIN PANEL AND DEVICE FOR APPLYING THIS PROCEDURE. - Google Patents

PROCEDURE FOR LOCALIZING A SHORT CIRCUIT IN A PRINT CHAIN PANEL AND DEVICE FOR APPLYING THIS PROCEDURE.

Info

Publication number
NL7609845A
NL7609845A NL7609845A NL7609845A NL7609845A NL 7609845 A NL7609845 A NL 7609845A NL 7609845 A NL7609845 A NL 7609845A NL 7609845 A NL7609845 A NL 7609845A NL 7609845 A NL7609845 A NL 7609845A
Authority
NL
Netherlands
Prior art keywords
procedure
localizing
applying
short circuit
chain panel
Prior art date
Application number
NL7609845A
Other languages
Dutch (nl)
Original Assignee
Ericsson L M Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson L M Pty Ltd filed Critical Ericsson L M Pty Ltd
Publication of NL7609845A publication Critical patent/NL7609845A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/315—Contactless testing by inductive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
NL7609845A 1975-09-05 1976-09-03 PROCEDURE FOR LOCALIZING A SHORT CIRCUIT IN A PRINT CHAIN PANEL AND DEVICE FOR APPLYING THIS PROCEDURE. NL7609845A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AU305175 1975-09-05

Publications (1)

Publication Number Publication Date
NL7609845A true NL7609845A (en) 1977-03-08

Family

ID=3693533

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7609845A NL7609845A (en) 1975-09-05 1976-09-03 PROCEDURE FOR LOCALIZING A SHORT CIRCUIT IN A PRINT CHAIN PANEL AND DEVICE FOR APPLYING THIS PROCEDURE.

Country Status (6)

Country Link
JP (1) JPS5238167A (en)
BE (1) BE845841A (en)
DE (1) DE2639831A1 (en)
FR (1) FR2323155A1 (en)
GB (1) GB1537870A (en)
NL (1) NL7609845A (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4186338A (en) * 1976-12-16 1980-01-29 Genrad, Inc. Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems
DE3022279A1 (en) * 1979-06-23 1981-01-08 Membrain Ltd METHOD AND DEVICE FOR LOCALIZING AN ERROR IN AN ELECTRONIC CIRCUIT
DE3049286C2 (en) * 1980-12-29 1983-11-10 Vsesojuznyj naučno-issledovatel'skij institut elektroizmeritel'nych priborov, Leningrad Device for contactless control of electrical impulse signals
DE3327446C2 (en) * 1983-07-29 1986-07-31 Siemens AG, 1000 Berlin und 8000 München Measuring method for locating faults in logic circuits and the circuit arrangement of a test transmitter for carrying out this method
GB2166248B (en) * 1984-10-30 1988-01-20 British Gas Corp Detecting resistance faults
DE3729500A1 (en) * 1987-09-03 1989-03-16 Siemens Ag Device for fault-finding in electronic circuits
US4833396A (en) * 1988-04-04 1989-05-23 Hughes Aircraft Company Lead frame short tester
DE19742055C2 (en) * 1997-09-24 2000-02-24 Ita Ingb Testaufgaben Gmbh Device for testing circuit boards
CN112946459A (en) * 2021-02-26 2021-06-11 天津中德应用技术大学 Device and method for detecting short-circuit fault point of finished printed circuit board

Also Published As

Publication number Publication date
JPS5238167A (en) 1977-03-24
BE845841A (en) 1976-12-31
DE2639831A1 (en) 1977-03-17
FR2323155A1 (en) 1977-04-01
GB1537870A (en) 1979-01-04

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Legal Events

Date Code Title Description
BV The patent application has lapsed