NL7601653A - METHOD AND DEVICE FOR AUTOMATICALLY DETERMINATION OF THE THICKNESS OF DEPOSITED LAYERS. - Google Patents

METHOD AND DEVICE FOR AUTOMATICALLY DETERMINATION OF THE THICKNESS OF DEPOSITED LAYERS.

Info

Publication number
NL7601653A
NL7601653A NL7601653A NL7601653A NL7601653A NL 7601653 A NL7601653 A NL 7601653A NL 7601653 A NL7601653 A NL 7601653A NL 7601653 A NL7601653 A NL 7601653A NL 7601653 A NL7601653 A NL 7601653A
Authority
NL
Netherlands
Prior art keywords
thickness
deposited layers
automatically determination
determination
automatically
Prior art date
Application number
NL7601653A
Other languages
Dutch (nl)
Original Assignee
Vyzk Ustav Organ Syntez
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vyzk Ustav Organ Syntez filed Critical Vyzk Ustav Organ Syntez
Publication of NL7601653A publication Critical patent/NL7601653A/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D35/00—Filtering devices having features not specifically covered by groups B01D24/00 - B01D33/00, or for applications not specifically covered by groups B01D24/00 - B01D33/00; Auxiliary devices for filtration; Filter housing constructions
    • B01D35/14—Safety devices specially adapted for filtration; Devices for indicating clogging
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • G01B5/06—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness
    • G01B5/066—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness for measuring thickness of coating

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
NL7601653A 1975-02-20 1976-02-18 METHOD AND DEVICE FOR AUTOMATICALLY DETERMINATION OF THE THICKNESS OF DEPOSITED LAYERS. NL7601653A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS109875A CS175132B1 (en) 1975-02-20 1975-02-20

Publications (1)

Publication Number Publication Date
NL7601653A true NL7601653A (en) 1976-08-24

Family

ID=5344458

Family Applications (1)

Application Number Title Priority Date Filing Date
NL7601653A NL7601653A (en) 1975-02-20 1976-02-18 METHOD AND DEVICE FOR AUTOMATICALLY DETERMINATION OF THE THICKNESS OF DEPOSITED LAYERS.

Country Status (8)

Country Link
JP (1) JPS51107850A (en)
CH (1) CH602979A5 (en)
CS (1) CS175132B1 (en)
DD (1) DD123121A1 (en)
DE (1) DE2606968A1 (en)
FR (1) FR2301803A1 (en)
GB (1) GB1544276A (en)
NL (1) NL7601653A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114909976A (en) * 2022-07-18 2022-08-16 山东兰图地理信息工程有限公司 Survey and drawing device for collecting thickness of underwater silt

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH592465A5 (en) * 1975-07-28 1977-10-31 Chemap Ag
DE3733761A1 (en) * 1987-10-06 1989-04-20 Passavant Werke Method and device for indicating precipitated layers in separators
DE4129687C2 (en) * 1991-09-08 2002-11-14 Helmut Fischer Gmbh & Co Device for measuring the thickness of thin layers
JPH06167328A (en) * 1992-05-26 1994-06-14 Mayekawa Mfg Co Ltd Measuring apparatus for thickness of ice
DE4224263A1 (en) * 1992-07-23 1994-01-27 Gea Happel Klimatechnik Device for measuring the deposits of a filter or sieve
GB2314629B (en) * 1996-06-27 1998-06-17 Scient Limited Method and apparatus for monitoring washing plant efficiency
CN111288871A (en) * 2020-04-09 2020-06-16 兰杰 Hydraulic engineering pipeline measuring device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114909976A (en) * 2022-07-18 2022-08-16 山东兰图地理信息工程有限公司 Survey and drawing device for collecting thickness of underwater silt
CN114909976B (en) * 2022-07-18 2022-09-13 山东兰图地理信息工程有限公司 Survey and drawing device for collecting thickness of underwater silt

Also Published As

Publication number Publication date
FR2301803B3 (en) 1978-11-10
FR2301803A1 (en) 1976-09-17
CH602979A5 (en) 1978-08-15
DD123121A1 (en) 1976-11-20
GB1544276A (en) 1979-04-19
JPS51107850A (en) 1976-09-24
DE2606968A1 (en) 1976-09-02
CS175132B1 (en) 1977-04-29

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Legal Events

Date Code Title Description
BV The patent application has lapsed