NL6801386A - - Google Patents
Info
- Publication number
- NL6801386A NL6801386A NL6801386A NL6801386A NL6801386A NL 6801386 A NL6801386 A NL 6801386A NL 6801386 A NL6801386 A NL 6801386A NL 6801386 A NL6801386 A NL 6801386A NL 6801386 A NL6801386 A NL 6801386A
- Authority
- NL
- Netherlands
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0675—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using interferometry
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/054—Flat sheets-substrates
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP577167 | 1967-01-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL6801386A true NL6801386A (zh) | 1968-08-01 |
Family
ID=11620371
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL6801386A NL6801386A (zh) | 1967-01-31 | 1968-01-31 |
Country Status (5)
Country | Link |
---|---|
US (1) | US3501637A (zh) |
DE (1) | DE1673879A1 (zh) |
FR (1) | FR1563852A (zh) |
GB (1) | GB1182745A (zh) |
NL (1) | NL6801386A (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107850555A (zh) * | 2015-06-30 | 2018-03-27 | 康宁股份有限公司 | 使用静态条纹图案的干涉法滚降测量 |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7141044B2 (ja) * | 2019-05-15 | 2022-09-22 | 株式会社デンソー | 膜厚測定方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3017512A (en) * | 1959-06-29 | 1962-01-16 | American Can Co | Coating thickness gauge |
US3109932A (en) * | 1960-10-07 | 1963-11-05 | Bell Telephone Labor Inc | Measurement of impurity concentration in semiconducting material |
US3206603A (en) * | 1962-08-16 | 1965-09-14 | Gen Electric | Infrared flaw detector method and apparatus |
-
1968
- 1968-01-26 US US700760A patent/US3501637A/en not_active Expired - Lifetime
- 1968-01-29 DE DE19681673879 patent/DE1673879A1/de active Pending
- 1968-01-30 GB GB4692/68A patent/GB1182745A/en not_active Expired
- 1968-01-31 FR FR1563852D patent/FR1563852A/fr not_active Expired
- 1968-01-31 NL NL6801386A patent/NL6801386A/xx unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107850555A (zh) * | 2015-06-30 | 2018-03-27 | 康宁股份有限公司 | 使用静态条纹图案的干涉法滚降测量 |
Also Published As
Publication number | Publication date |
---|---|
GB1182745A (en) | 1970-03-04 |
US3501637A (en) | 1970-03-17 |
DE1673879A1 (de) | 1971-10-28 |
FR1563852A (zh) | 1969-04-18 |