NL6801386A - - Google Patents

Info

Publication number
NL6801386A
NL6801386A NL6801386A NL6801386A NL6801386A NL 6801386 A NL6801386 A NL 6801386A NL 6801386 A NL6801386 A NL 6801386A NL 6801386 A NL6801386 A NL 6801386A NL 6801386 A NL6801386 A NL 6801386A
Authority
NL
Netherlands
Application number
NL6801386A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL6801386A publication Critical patent/NL6801386A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0675Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using interferometry
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S148/00Metal treatment
    • Y10S148/054Flat sheets-substrates

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
NL6801386A 1967-01-31 1968-01-31 NL6801386A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP577167 1967-01-31

Publications (1)

Publication Number Publication Date
NL6801386A true NL6801386A (zh) 1968-08-01

Family

ID=11620371

Family Applications (1)

Application Number Title Priority Date Filing Date
NL6801386A NL6801386A (zh) 1967-01-31 1968-01-31

Country Status (5)

Country Link
US (1) US3501637A (zh)
DE (1) DE1673879A1 (zh)
FR (1) FR1563852A (zh)
GB (1) GB1182745A (zh)
NL (1) NL6801386A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107850555A (zh) * 2015-06-30 2018-03-27 康宁股份有限公司 使用静态条纹图案的干涉法滚降测量

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7141044B2 (ja) * 2019-05-15 2022-09-22 株式会社デンソー 膜厚測定方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3017512A (en) * 1959-06-29 1962-01-16 American Can Co Coating thickness gauge
US3109932A (en) * 1960-10-07 1963-11-05 Bell Telephone Labor Inc Measurement of impurity concentration in semiconducting material
US3206603A (en) * 1962-08-16 1965-09-14 Gen Electric Infrared flaw detector method and apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107850555A (zh) * 2015-06-30 2018-03-27 康宁股份有限公司 使用静态条纹图案的干涉法滚降测量

Also Published As

Publication number Publication date
GB1182745A (en) 1970-03-04
US3501637A (en) 1970-03-17
DE1673879A1 (de) 1971-10-28
FR1563852A (zh) 1969-04-18

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