NL6715104A - - Google Patents

Info

Publication number
NL6715104A
NL6715104A NL6715104A NL6715104A NL6715104A NL 6715104 A NL6715104 A NL 6715104A NL 6715104 A NL6715104 A NL 6715104A NL 6715104 A NL6715104 A NL 6715104A NL 6715104 A NL6715104 A NL 6715104A
Authority
NL
Netherlands
Application number
NL6715104A
Other versions
NL148742B (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL6715104A publication Critical patent/NL6715104A/xx
Publication of NL148742B publication Critical patent/NL148742B/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
NL676715104A 1966-11-07 1967-11-07 SETTING DEVICE FOR SETTING A SAMPLE IN AN ELECTRON MICROSCOPE. NL148742B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AU13542/66A AU407449B2 (en) 1966-11-07 1966-11-07 Apparatus for positioning specimens in electron microscopes or electron diffraction cameras

Publications (2)

Publication Number Publication Date
NL6715104A true NL6715104A (en) 1968-05-08
NL148742B NL148742B (en) 1976-02-16

Family

ID=3703838

Family Applications (1)

Application Number Title Priority Date Filing Date
NL676715104A NL148742B (en) 1966-11-07 1967-11-07 SETTING DEVICE FOR SETTING A SAMPLE IN AN ELECTRON MICROSCOPE.

Country Status (5)

Country Link
US (1) US3476936A (en)
AU (1) AU407449B2 (en)
DE (1) DE1589647C3 (en)
GB (1) GB1160598A (en)
NL (1) NL148742B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3952203A (en) * 1972-07-21 1976-04-20 Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. Object adjustment device for a charged particle beam apparatus
WO1981003580A1 (en) * 1980-06-09 1981-12-10 Burevestnik Sample chamber for electron-sounding instrument
US5923040A (en) * 1997-12-01 1999-07-13 Micron Technologies, Inc. Wafer sample retainer for an electron microscope

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2499019A (en) * 1949-01-29 1950-02-28 Rca Corp Adjustable specimen support for electron-optical instruments
US3240934A (en) * 1962-02-14 1966-03-15 Jeol Ltd Specimen holding device with means to tilt, rotate and shift the specimen

Also Published As

Publication number Publication date
US3476936A (en) 1969-11-04
DE1589647B2 (en) 1979-10-04
NL148742B (en) 1976-02-16
GB1160598A (en) 1969-08-06
AU407449B2 (en) 1970-11-03
AU1354266A (en) 1969-07-10
DE1589647A1 (en) 1970-05-14
DE1589647C3 (en) 1980-07-10

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Legal Events

Date Code Title Description
VJC Lapsed due to non-payment of the due maintenance fee for the patent or patent application
NL80 Abbreviated name of patent owner mentioned of already nullified patent

Owner name: COMMONWEALTH