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Priority to NL6514314ApriorityCriticalpatent/NL6514314A/xx
Publication of NL6514314ApublicationCriticalpatent/NL6514314A/xx
G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00—Measuring arrangements characterised by the use of optical techniques
G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object