NL6411805A - - Google Patents
Info
- Publication number
- NL6411805A NL6411805A NL6411805A NL6411805A NL6411805A NL 6411805 A NL6411805 A NL 6411805A NL 6411805 A NL6411805 A NL 6411805A NL 6411805 A NL6411805 A NL 6411805A NL 6411805 A NL6411805 A NL 6411805A
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEF0041119 | 1963-10-26 | ||
DEF0041118 | 1963-10-26 | ||
DEF0041117 | 1963-10-26 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL6411805A true NL6411805A (es) | 1965-04-27 |
Family
ID=27210326
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL6411805A NL6411805A (es) | 1963-10-26 | 1964-10-09 |
Country Status (2)
Country | Link |
---|---|
GB (1) | GB1081683A (es) |
NL (1) | NL6411805A (es) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA1262781A (en) * | 1985-12-31 | 1989-11-07 | Ronald Jenkins | Long wavelength x-ray diffractometer |
US5007072A (en) * | 1988-08-03 | 1991-04-09 | Ion Track Instruments | X-ray diffraction inspection system |
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1964
- 1964-10-09 NL NL6411805A patent/NL6411805A/xx unknown
- 1964-10-23 GB GB4337464A patent/GB1081683A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
GB1081683A (en) | 1967-08-31 |