NL235425A - - Google Patents

Info

Publication number
NL235425A
NL235425A NL235425DA NL235425A NL 235425 A NL235425 A NL 235425A NL 235425D A NL235425D A NL 235425DA NL 235425 A NL235425 A NL 235425A
Authority
NL
Netherlands
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of NL235425A publication Critical patent/NL235425A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL235425D 1958-01-25 NL235425A (cg-RX-API-DMAC7.html)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS41558 1958-01-25

Publications (1)

Publication Number Publication Date
NL235425A true NL235425A (cg-RX-API-DMAC7.html)

Family

ID=5336166

Family Applications (1)

Application Number Title Priority Date Filing Date
NL235425D NL235425A (cg-RX-API-DMAC7.html) 1958-01-25

Country Status (7)

Country Link
US (1) US3030507A (cg-RX-API-DMAC7.html)
BE (1) BE575053R (cg-RX-API-DMAC7.html)
CH (1) CH403341A (cg-RX-API-DMAC7.html)
DE (1) DE1239501B (cg-RX-API-DMAC7.html)
FR (1) FR1223504A (cg-RX-API-DMAC7.html)
GB (1) GB911201A (cg-RX-API-DMAC7.html)
NL (1) NL235425A (cg-RX-API-DMAC7.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3213278A (en) * 1962-04-13 1965-10-19 Philips Corp X-ray spectrograph having plural detectors
US3617705A (en) * 1968-03-27 1971-11-02 Tokyo Shibaura Electric Co Method of measuring stress with x-rays
JPS4919239B1 (cg-RX-API-DMAC7.html) * 1969-03-07 1974-05-16
FR2223684B1 (cg-RX-API-DMAC7.html) * 1973-03-30 1975-08-22 Radiologie Cie Gle
US4561062A (en) * 1983-02-18 1985-12-24 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of Energy, Mines And Resources Stress measurement by X-ray diffractometry
US7202475B1 (en) * 2003-03-06 2007-04-10 Kla-Tencor Technologies Corporation Rapid defect composition mapping using multiple X-ray emission perspective detection scheme
CN116380308B (zh) * 2023-04-27 2023-12-12 浙江大学 一种透光材料内应力分布的x射线衍射检测方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE12911C (de) * J. W. H. jourdan in Altona Vorrichtung zum Abdichten schadhafter Dampfkessel-Siederöhren
US2259708A (en) * 1937-06-14 1941-10-21 Schiebold Ernst Testing materials by x-ray
US2207867A (en) * 1939-07-14 1940-07-16 Maurice A Loebell Apparatus for visualizing organs
US2462374A (en) * 1944-10-04 1949-02-22 Philips Lab Inc Stress analysis by x-ray diffraction
US2648011A (en) * 1951-08-16 1953-08-04 Good James Nathan Apparatus for electronic spectrometric analysis of back-reflection diffraction

Also Published As

Publication number Publication date
US3030507A (en) 1962-04-17
BE575053R (fr) 1959-05-15
DE1239501B (de) 1967-04-27
GB911201A (en) 1962-11-21
FR1223504A (fr) 1960-06-17
CH403341A (de) 1965-11-30

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