NL230659A - - Google Patents
Info
- Publication number
- NL230659A NL230659A NL230659DA NL230659A NL 230659 A NL230659 A NL 230659A NL 230659D A NL230659D A NL 230659DA NL 230659 A NL230659 A NL 230659A
- Authority
- NL
- Netherlands
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/261—Circuits therefor for testing bipolar transistors for measuring break-down voltage or punch through voltage therefor
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL230659A true NL230659A (en:Method) | 1900-01-01 |
Family
ID=1858671
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL230659D NL230659A (en:Method) |
Country Status (1)
| Country | Link |
|---|---|
| NL (1) | NL230659A (en:Method) |
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0
- NL NL230659D patent/NL230659A/xx unknown