NL182523C - METHOD AND DEVICE FOR SEPARATING SECONDARY IONS - Google Patents

METHOD AND DEVICE FOR SEPARATING SECONDARY IONS

Info

Publication number
NL182523C
NL182523C NLAANVRAGE7401050,A NL7401050A NL182523C NL 182523 C NL182523 C NL 182523C NL 7401050 A NL7401050 A NL 7401050A NL 182523 C NL182523 C NL 182523C
Authority
NL
Netherlands
Prior art keywords
secondary ions
separating secondary
separating
ions
Prior art date
Application number
NLAANVRAGE7401050,A
Other languages
Dutch (nl)
Other versions
NL182523B (en
NL7401050A (en
Inventor
Fernand Marcel Devienne
Original Assignee
Anvar
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anvar filed Critical Anvar
Publication of NL7401050A publication Critical patent/NL7401050A/xx
Publication of NL182523B publication Critical patent/NL182523B/en
Application granted granted Critical
Publication of NL182523C publication Critical patent/NL182523C/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/28Static spectrometers
    • H01J49/284Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
    • H01J49/286Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
NLAANVRAGE7401050,A 1973-01-26 1974-01-25 METHOD AND DEVICE FOR SEPARATING SECONDARY IONS NL182523C (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7302771A FR2215874A5 (en) 1973-01-26 1973-01-26

Publications (3)

Publication Number Publication Date
NL7401050A NL7401050A (en) 1974-07-30
NL182523B NL182523B (en) 1987-10-16
NL182523C true NL182523C (en) 1988-03-16

Family

ID=9113886

Family Applications (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE7401050,A NL182523C (en) 1973-01-26 1974-01-25 METHOD AND DEVICE FOR SEPARATING SECONDARY IONS

Country Status (7)

Country Link
US (1) US3916188A (en)
JP (1) JPS5820102B2 (en)
CH (1) CH577684A5 (en)
DE (1) DE2403575A1 (en)
FR (1) FR2215874A5 (en)
GB (1) GB1410315A (en)
NL (1) NL182523C (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3238474C2 (en) * 1982-10-16 1987-01-08 Finnigan MAT GmbH, 2800 Bremen Hybrid mass spectrometer
FR2622699B1 (en) * 1987-11-03 1991-10-18 Devienne Fernand METHOD FOR DETECTION OF A KNOWN M CHEMICAL BODY
JPH01213950A (en) * 1988-02-23 1989-08-28 Jeol Ltd Mass analyzer and ms/ms device using same
DE3905631A1 (en) * 1989-02-23 1990-08-30 Finnigan Mat Gmbh METHOD FOR THE MASS SPECTROSCOPIC EXAMINATION OF ISOTOPES AND ISOTOPE MASS SPECTROMETERS
FR2655149B1 (en) * 1989-11-24 1994-03-18 Devienne Fernand APPARATUS AND METHOD FOR DETECTION IN AN ATMOSPHERE FOR MONITORING A CHEMICAL BODY OF M KNOWN MASS AND OF WHICH THE DISSOCIATION FRAGMENTS ARE KNOWN.
DE4019005C2 (en) * 1990-06-13 2000-03-09 Finnigan Mat Gmbh Devices for analyzing high mass ions
US5466933A (en) * 1992-11-23 1995-11-14 Surface Interface, Inc. Dual electron analyzer
DE19544808C2 (en) * 1995-12-01 2000-05-11 Bruker Daltonik Gmbh Method for studying the structure of ions in a time-of-flight mass spectrometer
JP6647224B2 (en) * 2014-06-13 2020-02-14 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド Method for analysis of lipids using mass spectrometry

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3610921A (en) * 1968-05-01 1971-10-05 Perkin Elmer Corp Metastable mass analysis
US3673404A (en) * 1970-05-15 1972-06-27 Perkin Elmer Corp Ion kinetic energy analysis
US3769513A (en) * 1972-12-14 1973-10-30 Perkin Elmer Corp Ion kinetic energy spectrometer

Also Published As

Publication number Publication date
NL182523B (en) 1987-10-16
CH577684A5 (en) 1976-07-15
US3916188A (en) 1975-10-28
DE2403575A1 (en) 1974-08-08
JPS49111691A (en) 1974-10-24
GB1410315A (en) 1975-10-15
JPS5820102B2 (en) 1983-04-21
NL7401050A (en) 1974-07-30
FR2215874A5 (en) 1974-08-23

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Legal Events

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BA A request for search or an international-type search has been filed
BA A request for search or an international-type search has been filed
BB A search report has been drawn up
BB A search report has been drawn up
BC A request for examination has been filed
BC A request for examination has been filed
A85 Still pending on 85-01-01
V4 Discontinued because of reaching the maximum lifetime of a patent