NL113607C - - Google Patents

Info

Publication number
NL113607C
NL113607C NL113607DA NL113607C NL 113607 C NL113607 C NL 113607C NL 113607D A NL113607D A NL 113607DA NL 113607 C NL113607 C NL 113607C
Authority
NL
Netherlands
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of NL113607C publication Critical patent/NL113607C/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2632Circuits therefor for testing diodes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Rectifiers (AREA)
NL113607D 1957-08-22 NL113607C (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US679630A US3052840A (en) 1957-08-22 1957-08-22 Method of testing semiconducting rectifiers

Publications (1)

Publication Number Publication Date
NL113607C true NL113607C (ja)

Family

ID=24727687

Family Applications (2)

Application Number Title Priority Date Filing Date
NL113607D NL113607C (ja) 1957-08-22
NL285586D NL285586A (ja) 1957-08-22

Family Applications After (1)

Application Number Title Priority Date Filing Date
NL285586D NL285586A (ja) 1957-08-22

Country Status (2)

Country Link
US (1) US3052840A (ja)
NL (2) NL285586A (ja)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4142151A (en) * 1977-07-25 1979-02-27 General Electric Company Failed diode indicator
JP2644579B2 (ja) * 1988-06-03 1997-08-25 株式会社東京精密 半導体素子の検査方法及び装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1479284A (en) * 1920-01-07 1924-01-01 William J Hartwig Armature-winding-testing mechanism
US1696025A (en) * 1920-11-20 1928-12-18 Westinghouse Electric & Mfg Co Balancing means for hot-cathode rectifiers
US1723861A (en) * 1924-11-10 1929-08-06 Gen Electric Insulator tester
US1752991A (en) * 1925-12-11 1930-04-01 Bbc Brown Boveri & Cie Apparatus for detecting grounds
US2123859A (en) * 1933-02-13 1938-07-12 Allis Chalmers Mfg Co Rectifier protective system
US2158934A (en) * 1936-08-20 1939-05-16 Gen Electric Protective means for hot-cathode rectifiers
US2444458A (en) * 1944-04-29 1948-07-06 Standard Telephones Cables Ltd Rectifying system
US2547011A (en) * 1946-05-21 1951-04-03 Int Standard Electric Corp Electric fault alarm circuits
US2447658A (en) * 1946-09-12 1948-08-24 Westinghouse Electric Corp Shunt capacitor bank
US2760142A (en) * 1954-08-25 1956-08-21 Syntron Co Equalizing series resistors for parallel circuits in rectifiers
US2820189A (en) * 1956-08-14 1958-01-14 Asea Ab Static current converter using voltage commutation

Also Published As

Publication number Publication date
US3052840A (en) 1962-09-04
NL285586A (ja)

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