MY184557A - A successive approximation analog to digital converter and method for calibrating thereof - Google Patents

A successive approximation analog to digital converter and method for calibrating thereof

Info

Publication number
MY184557A
MY184557A MYPI2014002905A MYPI2014002905A MY184557A MY 184557 A MY184557 A MY 184557A MY PI2014002905 A MYPI2014002905 A MY PI2014002905A MY PI2014002905 A MYPI2014002905 A MY PI2014002905A MY 184557 A MY184557 A MY 184557A
Authority
MY
Malaysia
Prior art keywords
adc
calibrating
successive approximation
approximation analog
capacitance measurement
Prior art date
Application number
MYPI2014002905A
Inventor
Kong Yew Tan
Original Assignee
Mimos Berhad
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mimos Berhad filed Critical Mimos Berhad
Priority to MYPI2014002905A priority Critical patent/MY184557A/en
Priority to PCT/MY2015/050116 priority patent/WO2016056889A1/en
Publication of MY184557A publication Critical patent/MY184557A/en

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
    • H03M1/1042—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables the look-up table containing corrected values for replacing the original digital values
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

A Successive Approximation Analog to Digital Converter, SA-ADC (100) and a method for calibrating thereof has been disclosed. The SA-ADC (100) includes a capacitance measurement circuit (200) which performs frequency based capacitance measurement for calibrating the SA-ADC (100). The capacitance measurement circuit (200) is connected to a Digital to Analog Converter, DAC of SA-ADC (100) once only and thereafter the frequency based capacitance value of capacitors is repeatedly used in conversion cycles. Thus, the capacitance measurement circuit (200) improves conversion rate of conventional successive approximation analog to digital converters and eliminates the need for high accuracy DAC required in conventional SA-ADC.
MYPI2014002905A 2014-10-10 2014-10-10 A successive approximation analog to digital converter and method for calibrating thereof MY184557A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
MYPI2014002905A MY184557A (en) 2014-10-10 2014-10-10 A successive approximation analog to digital converter and method for calibrating thereof
PCT/MY2015/050116 WO2016056889A1 (en) 2014-10-10 2015-10-08 A successive approximation analog to digital converter and method for calibrating thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
MYPI2014002905A MY184557A (en) 2014-10-10 2014-10-10 A successive approximation analog to digital converter and method for calibrating thereof

Publications (1)

Publication Number Publication Date
MY184557A true MY184557A (en) 2021-04-02

Family

ID=55653419

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI2014002905A MY184557A (en) 2014-10-10 2014-10-10 A successive approximation analog to digital converter and method for calibrating thereof

Country Status (2)

Country Link
MY (1) MY184557A (en)
WO (1) WO2016056889A1 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10340939B1 (en) * 2018-05-09 2019-07-02 Texas Instruments Incorporated Successive approximation register analog-to-digital converter with kickback linearization
CN110995264B (en) * 2019-12-26 2023-04-28 上海贝岭股份有限公司 Calibration system for capacitor mismatch of CDAC and successive approximation ADC
CN111614354B (en) * 2020-05-14 2023-03-24 芯与物(上海)技术有限公司 Calibration circuit for capacitance weight of analog-to-digital converter
CN112290945B (en) * 2020-09-30 2023-03-28 西安电子科技大学 Digital background self-calibration circuit structure and method of single-channel high-speed high-precision SAR ADC
CN114696825B (en) * 2022-06-01 2022-09-20 浙江地芯引力科技有限公司 Analog-to-digital converter and capacitance weight calibration method and device
CN115940949B (en) * 2022-12-14 2023-07-25 合肥健天电子有限公司 Split capacitor structure successive approximation analog-to-digital converter calibration circuit and method
CN115913229B (en) * 2022-12-15 2023-10-03 江苏润石科技有限公司 Dynamic configuration method and circuit of comparator of SAR ADC, SAR ADC and chip
CN117375611A (en) * 2023-05-31 2024-01-09 中国移动通信有限公司研究院 ADC chip, capacitance deviation adjusting method, device and system

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3854815D1 (en) * 1988-09-30 1996-02-01 Siemens Ag Method for determining and processing correction values for self-calibrating A / D and D / A converters and arithmetic unit for carrying out the method
JPH05167449A (en) * 1991-12-12 1993-07-02 Toshiba Corp Successive comparison a/d converter
JPH0786947A (en) * 1993-09-09 1995-03-31 Hitachi Ltd A/d converter
JPH08237125A (en) * 1995-02-23 1996-09-13 Fujitsu Ltd A/d converter
JP3211793B2 (en) * 1999-01-08 2001-09-25 日本電気株式会社 AD converter
JP2011166240A (en) * 2010-02-04 2011-08-25 Tokai Rika Co Ltd System and device for detecting capacitance

Also Published As

Publication number Publication date
WO2016056889A1 (en) 2016-04-14

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