MY164870A - System for actuating a contactor of electronic components comprising a contact force control mechanism - Google Patents

System for actuating a contactor of electronic components comprising a contact force control mechanism

Info

Publication number
MY164870A
MY164870A MYPI20030094A MYPI20030094A MY164870A MY 164870 A MY164870 A MY 164870A MY PI20030094 A MYPI20030094 A MY PI20030094A MY PI20030094 A MYPI20030094 A MY PI20030094A MY 164870 A MY164870 A MY 164870A
Authority
MY
Malaysia
Prior art keywords
contactor
actuating
electronic components
control mechanism
force control
Prior art date
Application number
MYPI20030094A
Inventor
Heiniger Laurent
Froidevaux Claude
Përret Joël
Hostettler Pascal
Original Assignee
Ismeca Semiconductor Holding Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ismeca Semiconductor Holding Sa filed Critical Ismeca Semiconductor Holding Sa
Publication of MY164870A publication Critical patent/MY164870A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanisms For Operating Contacts (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

SYSTEM FOR ACTUATING A CONTRACTOR OF ELECTRONIC COMPONENT FOR THE ELECTRIC TESTING OF SAID COMPONENTS, WHOSE MOVEMENT IS CONTROLLED BY A MECHANISM LIMITING THE PRESSING FORCE OF THE CONTACTOR ON THE COMPONENT TO BE TESTED. (FIGURE 1)
MYPI20030094A 2002-02-20 2003-01-13 System for actuating a contactor of electronic components comprising a contact force control mechanism MY164870A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH00289/02A CH695122A5 (en) 2002-02-20 2002-02-20 System for actuating electronic component contactor containing contact force controlling mechanism

Publications (1)

Publication Number Publication Date
MY164870A true MY164870A (en) 2018-01-30

Family

ID=27792852

Family Applications (1)

Application Number Title Priority Date Filing Date
MYPI20030094A MY164870A (en) 2002-02-20 2003-01-13 System for actuating a contactor of electronic components comprising a contact force control mechanism

Country Status (3)

Country Link
CN (1) CN1320698C (en)
CH (1) CH695122A5 (en)
MY (1) MY164870A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103513069B (en) * 2012-06-21 2016-05-25 深圳麦逊电子有限公司 Test probe apparatus
TWI762186B (en) * 2021-02-08 2022-04-21 鴻勁精密股份有限公司 Connecting mechanism and handler using the same
CN114740237A (en) * 2021-08-09 2022-07-12 苏州联讯仪器有限公司 Probe structure for high frequency test

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4677375A (en) * 1985-06-14 1987-06-30 Hanwa Electronic Co., Ltd. Apparatus for testing integrated circuit
CH664110A5 (en) * 1985-11-08 1988-02-15 Ismeca S A AUTOMATIC MACHINE FOR PLACING COMPONENTS ON SUBSTRATES, PLACEMENT HEAD FOR THIS MACHINE.
US4956923A (en) * 1989-11-06 1990-09-18 The Micromanipulator Co., Inc. Probe assembly including touchdown sensor
JPH0416781A (en) * 1990-05-11 1992-01-21 Mitsubishi Electric Corp Apparatus for testing semiconductor device
KR0176627B1 (en) * 1995-12-30 1999-05-15 김광호 Probe apparatus for examining conductiveness of printed circuit board
DE19844428B4 (en) * 1998-09-28 2004-05-13 Atg Test Systems Gmbh & Co.Kg Test probe for a finger tester, a method for driving a test probe, finger tester for testing printed circuit boards and a method for testing printed circuit boards with a finger tester
FR2786275B1 (en) * 1998-11-20 2001-02-02 Adeunis R F TEST EQUIPMENT FOR FAST RADIO OR DIGITAL ELECTRONIC COMPONENTS

Also Published As

Publication number Publication date
CN1320698C (en) 2007-06-06
CN1440091A (en) 2003-09-03
CH695122A5 (en) 2005-12-15

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