MX9705729A - Metodo para probar circuitos de radiofrecuencia sin desconectarlos y para la redireccion del flujo de la señal de radiofrecuencia. - Google Patents
Metodo para probar circuitos de radiofrecuencia sin desconectarlos y para la redireccion del flujo de la señal de radiofrecuencia.Info
- Publication number
- MX9705729A MX9705729A MX9705729A MX9705729A MX9705729A MX 9705729 A MX9705729 A MX 9705729A MX 9705729 A MX9705729 A MX 9705729A MX 9705729 A MX9705729 A MX 9705729A MX 9705729 A MX9705729 A MX 9705729A
- Authority
- MX
- Mexico
- Prior art keywords
- circuit element
- microstrip line
- circuit
- invasive
- techniques
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/315—Contactless testing by inductive methods
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
Se describen métodos y sistemas para probar circuitos de radiofrecuencia (RF) sin desconectarlos y/o para la redireccion de la señal de RF (radiofrecuencia). Estos métodos y sistemas se utilizan en conjuncion con un circuito de RF que tiene un primer elemento del circuito, un segundo elemento del circuito, una línea de microtira que acopla el primer elemento del circuito al segundo elemento del circuito, de tal manera que la energía de RF fluya a lo largo de la línea de microtira desde el primer elemento del circuito al segundo elemento del circuito y una compuerta de prueba de RF para probar el circuito de RF. Una primera impedancia eléctrica separable se coloca en proximidad física a la línea de microtira para producir un primer desequilibrio de impedancia en la línea de microtira, de tal manera que algo de la energía de RF se refleja mediante el desequilibrio de regreso al primer elemento del circuito. Una segunda impedancia eléctrica separable se coloca en proximidad física a la línea de microtira, de tal manera que la línea de microtira se acopla a la compuerta de prueba de RF.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/692,846 US5821758A (en) | 1996-08-01 | 1996-08-01 | Techniques for non-invasive RF circuit testing and RF signal flow redirection |
US08692846 | 1996-08-01 |
Publications (2)
Publication Number | Publication Date |
---|---|
MXPA97005729A MXPA97005729A (es) | 1998-02-01 |
MX9705729A true MX9705729A (es) | 1998-02-28 |
Family
ID=24782271
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX9705729A MX9705729A (es) | 1996-08-01 | 1997-07-29 | Metodo para probar circuitos de radiofrecuencia sin desconectarlos y para la redireccion del flujo de la señal de radiofrecuencia. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5821758A (es) |
JP (1) | JPH1090340A (es) |
BR (1) | BR9704251A (es) |
MX (1) | MX9705729A (es) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6394346B1 (en) | 1999-10-07 | 2002-05-28 | Cubic Corporation | Contactless smart card high production encoding machine |
US6956448B1 (en) | 2002-12-17 | 2005-10-18 | Itt Manufacturing Enterprises, Inc. | Electromagnetic energy probe with integral impedance matching |
JP2004220141A (ja) * | 2003-01-10 | 2004-08-05 | Renesas Technology Corp | Icインレットの製造方法、idタグ、idタグリーダおよびそれらのデータ読み出し方法 |
TW200643429A (en) * | 2005-04-20 | 2006-12-16 | Matsushita Electric Ind Co Ltd | Solid electrolytic capacitor inspection device and inspection method |
US8742777B2 (en) | 2010-12-29 | 2014-06-03 | The Board Of Trustees Of The University Of Alabama For And On Behalf Of The University Of Alabama | Method and system for testing an electric circuit |
WO2014094819A1 (en) | 2012-12-17 | 2014-06-26 | Advantest (Singapore) Pte. Ltd. | Rf probe |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4565966A (en) * | 1983-03-07 | 1986-01-21 | Kollmorgen Technologies Corporation | Method and apparatus for testing of electrical interconnection networks |
US5420500A (en) * | 1992-11-25 | 1995-05-30 | Hewlett-Packard Company | Pacitive electrode system for detecting open solder joints in printed circuit assemblies |
US5488313A (en) * | 1993-07-16 | 1996-01-30 | Litton Systems, Inc. | Test probe and circuit board arrangement for the circuit under test for microstrip circuitry |
-
1996
- 1996-08-01 US US08/692,846 patent/US5821758A/en not_active Expired - Lifetime
-
1997
- 1997-07-29 MX MX9705729A patent/MX9705729A/es unknown
- 1997-07-31 JP JP9206671A patent/JPH1090340A/ja active Pending
- 1997-08-01 BR BR9704251A patent/BR9704251A/pt active Search and Examination
Also Published As
Publication number | Publication date |
---|---|
BR9704251A (pt) | 1998-11-03 |
JPH1090340A (ja) | 1998-04-10 |
US5821758A (en) | 1998-10-13 |
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