MX2018000640A - Accesorio para soportar inspeccion de carrete a carrete de dispositivos de semiconductor u otros componentes. - Google Patents

Accesorio para soportar inspeccion de carrete a carrete de dispositivos de semiconductor u otros componentes.

Info

Publication number
MX2018000640A
MX2018000640A MX2018000640A MX2018000640A MX2018000640A MX 2018000640 A MX2018000640 A MX 2018000640A MX 2018000640 A MX2018000640 A MX 2018000640A MX 2018000640 A MX2018000640 A MX 2018000640A MX 2018000640 A MX2018000640 A MX 2018000640A
Authority
MX
Mexico
Prior art keywords
shaft
reel
components
fixture
base
Prior art date
Application number
MX2018000640A
Other languages
English (en)
Inventor
T Fasolino Stephen
L Wheeler Jason
NG Joshua
Original Assignee
Raytheon Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Raytheon Co filed Critical Raytheon Co
Publication of MX2018000640A publication Critical patent/MX2018000640A/es

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H18/00—Winding webs
    • B65H18/08—Web-winding mechanisms
    • B65H18/10—Mechanisms in which power is applied to web-roll spindle
    • B65H18/103—Reel-to-reel type web winding and unwinding mechanisms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/611—Specific applications or type of materials patterned objects; electronic devices
    • G01N2223/6113—Specific applications or type of materials patterned objects; electronic devices printed circuit board [PCB]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/611—Specific applications or type of materials patterned objects; electronic devices
    • G01N2223/6116—Specific applications or type of materials patterned objects; electronic devices semiconductor wafer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/643—Specific applications or type of materials object on conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Un sistema incluye un sistema (200) de inspección de componentes que tiene una fuente (202) de radiación configurada para generar radiación y un detector (204) de radiación configurado para detectar la radiación después de que la radiación pasa a través de los componentes que van a inspeccionarse. El sistema también incluye un accesorio (100) configurado para recibir multiples carretes (502, 504) que se configuran para recibir una cinta (506) en la que se ubican los componentes. El accesorio incluye una base (102) configurada para asegurarse a un soporte, un eje (104), uno o más motores (108, 110) montados en el eje y configurados para hacer girar los carretes, y una o más juntas (106) que acoplan el eje y la base. Una o más juntas se configuran para permitir (i) la rotación del eje alrededor de un eje longitudinal del eje para cambiar la orientación del eje con respecto a la base y (ii) la rotación del eje para cambiar la dirección en la cual el eje se extiende lejos de la base.
MX2018000640A 2015-08-10 2016-06-10 Accesorio para soportar inspeccion de carrete a carrete de dispositivos de semiconductor u otros componentes. MX2018000640A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US14/822,723 US10167155B2 (en) 2015-08-10 2015-08-10 Fixture to support reel-to-reel inspection of semiconductor devices or other components
PCT/US2016/037052 WO2017027095A1 (en) 2015-08-10 2016-06-10 Fixture to support reel-to-reel inspection of semiconductor devices or other components

Publications (1)

Publication Number Publication Date
MX2018000640A true MX2018000640A (es) 2018-06-06

Family

ID=56322285

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2018000640A MX2018000640A (es) 2015-08-10 2016-06-10 Accesorio para soportar inspeccion de carrete a carrete de dispositivos de semiconductor u otros componentes.

Country Status (8)

Country Link
US (1) US10167155B2 (es)
EP (1) EP3335032A1 (es)
JP (1) JP6472935B2 (es)
KR (1) KR102038786B1 (es)
CN (1) CN108419444B (es)
CA (1) CA2992718C (es)
MX (1) MX2018000640A (es)
WO (1) WO2017027095A1 (es)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102048455B1 (ko) * 2018-11-20 2019-11-25 주식회사 나노드림 반도체 칩 마운트 테이프 릴을 위한 칩 카운터

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CA2108429A1 (en) * 1992-10-19 1994-04-20 Gerald W. Tarpley, Jr. Cassette tape player having circuit for detecting reverse rotation of tape-up reel
US6073342A (en) * 1996-11-27 2000-06-13 Fuji Machine Mfg., Co., Ltd. Circuit-substrate-related-operation performing system
WO2000058718A1 (en) 1999-03-31 2000-10-05 Proto Manufacturing Ltd X-ray diffraction apparatus and method
ATE456460T1 (de) * 2000-09-11 2010-02-15 Zipher Ltd Druckvorrichtung und -verfahren
JP2003297274A (ja) * 2002-03-28 2003-10-17 Nippon Light Metal Co Ltd 試料保持装置
WO2005041253A2 (en) 2003-07-16 2005-05-06 Superpower, Inc. Methods for forming superconductor articles and xrd methods for characterizing same
US6892976B2 (en) * 2003-07-18 2005-05-17 Semiconductor Components Industries, L.L.C. Semiconductor assembly method and equipment therefor
US7711088B2 (en) 2003-07-22 2010-05-04 X-Ray Optical Systems, Inc. Method and system for X-ray diffraction measurements using an aligned source and detector rotating around a sample surface
JP4405445B2 (ja) * 2005-08-04 2010-01-27 三井金属鉱業株式会社 電子部品実装用フィルムキャリアテープの外観検査方法および外観検査装置
US7684608B2 (en) * 2006-02-23 2010-03-23 Vistech Corporation Tape and reel inspection system
JP2007305182A (ja) * 2006-05-09 2007-11-22 Fujifilm Corp テープリール、テープカートリッジ、テープ貼付方法及びテープカートリッジ製造方法
WO2008062531A1 (fr) * 2006-11-24 2008-05-29 Shimadzu Corporation Equipement radiographique à rayons x
GB2448305B (en) * 2007-03-07 2009-03-11 Zipher Ltd Tape drive
US7627083B2 (en) 2007-03-13 2009-12-01 VJ Technologies Method and apparatus for automated, digital, radiographic inspection of aerospace parts
JP2009128090A (ja) * 2007-11-21 2009-06-11 Core Staff Inc テーピングｉｃ対応自動ｘ線検査装置
CN101491444B (zh) * 2008-01-25 2012-12-12 Ge医疗系统环球技术有限公司 X射线探测台和x射线成像设备
CN201780275U (zh) * 2009-11-27 2011-03-30 云南侨通包装印刷有限公司 一种镭射全息定位凸烫的检测装置
US8516739B2 (en) * 2011-04-23 2013-08-27 Travis White Apparatus and method for automatically jigging a fishing line
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Also Published As

Publication number Publication date
CN108419444A (zh) 2018-08-17
CN108419444B (zh) 2021-03-16
US20170043970A1 (en) 2017-02-16
EP3335032A1 (en) 2018-06-20
US10167155B2 (en) 2019-01-01
CA2992718A1 (en) 2017-02-16
KR20180030586A (ko) 2018-03-23
WO2017027095A1 (en) 2017-02-16
JP6472935B2 (ja) 2019-02-20
KR102038786B1 (ko) 2019-10-30
CA2992718C (en) 2023-03-28
JP2018525648A (ja) 2018-09-06

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