MX2017012404A - Metodos y sistemas de analisis de elementos opticos que usan un filtro selectivo de angulo de banda ancha. - Google Patents
Metodos y sistemas de analisis de elementos opticos que usan un filtro selectivo de angulo de banda ancha.Info
- Publication number
- MX2017012404A MX2017012404A MX2017012404A MX2017012404A MX2017012404A MX 2017012404 A MX2017012404 A MX 2017012404A MX 2017012404 A MX2017012404 A MX 2017012404A MX 2017012404 A MX2017012404 A MX 2017012404A MX 2017012404 A MX2017012404 A MX 2017012404A
- Authority
- MX
- Mexico
- Prior art keywords
- optical element
- selective filter
- systems employing
- testing methods
- element testing
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 5
- 238000012360 testing method Methods 0.000 title abstract 3
- 230000005670 electromagnetic radiation Effects 0.000 abstract 3
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
-
- E—FIXED CONSTRUCTIONS
- E21—EARTH DRILLING; MINING
- E21B—EARTH DRILLING, e.g. DEEP DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
- E21B47/00—Survey of boreholes or wells
-
- E—FIXED CONSTRUCTIONS
- E21—EARTH DRILLING; MINING
- E21B—EARTH DRILLING, e.g. DEEP DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
- E21B49/00—Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells
- E21B49/08—Obtaining fluid samples or testing fluids, in boreholes or wells
- E21B49/087—Well testing, e.g. testing for reservoir productivity or formation parameters
- E21B49/088—Well testing, e.g. testing for reservoir productivity or formation parameters combined with sampling
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/10—Detecting, e.g. by using light barriers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
- G01N2021/215—Brewster incidence arrangement
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N2021/4704—Angular selective
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N2021/556—Measuring separately scattering and specular
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/068—Optics, miscellaneous
Landscapes
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Geology (AREA)
- Mining & Mineral Resources (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Fluid Mechanics (AREA)
- Environmental & Geological Engineering (AREA)
- Geophysics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Sampling And Sample Adjustment (AREA)
- Optical Transform (AREA)
Abstract
Un sistema de análisis de elementos ópticos incluye un filtro selectivo de ángulo de banda ancha colocado en un circuito óptico con un elemento óptico que se debe analizar. El sistema también incluye un transductor de radiación electromagnética que produce una señal en respuesta a radiación electromagnética que pasa a través del filtro selectivo de ángulo de banda ancha. El sistema también incluye un dispositivo de almacenamiento que almacena datos correspondientes a la señal producida desde el transductor de radiación electromagnética, en el que los datos indican una propiedad del elemento óptico en respuesta a un análisis.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2015/025866 WO2016167757A1 (en) | 2015-04-15 | 2015-04-15 | Optical computing devices comprising broadband angle-selective filters |
PCT/US2015/025922 WO2016167761A1 (en) | 2015-04-15 | 2015-04-15 | Parallel optical measurement system with broadband angle selective filters |
PCT/US2015/025869 WO2016167758A1 (en) | 2015-04-15 | 2015-04-15 | Optical computing devices comprising rotatable broadband angle-selective filters |
PCT/US2015/044908 WO2016167825A1 (en) | 2015-04-15 | 2015-08-12 | Optical element testing methods and systems employing a broadband angle-selective filter |
Publications (1)
Publication Number | Publication Date |
---|---|
MX2017012404A true MX2017012404A (es) | 2018-01-26 |
Family
ID=57125994
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2017012404A MX2017012404A (es) | 2015-04-15 | 2015-08-12 | Metodos y sistemas de analisis de elementos opticos que usan un filtro selectivo de angulo de banda ancha. |
MX2017011984A MX2017011984A (es) | 2015-04-15 | 2015-08-12 | Herramienta de analisis de muestras que emplea un filtro selectivo de angulo de banda ancha. |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2017011984A MX2017011984A (es) | 2015-04-15 | 2015-08-12 | Herramienta de analisis de muestras que emplea un filtro selectivo de angulo de banda ancha. |
Country Status (6)
Country | Link |
---|---|
US (2) | US20180045602A1 (es) |
BR (2) | BR112017019560A2 (es) |
DE (2) | DE112015006132T5 (es) |
GB (2) | GB2552276A (es) |
MX (2) | MX2017012404A (es) |
WO (2) | WO2016167826A1 (es) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BR112017019670A2 (pt) * | 2015-04-15 | 2018-05-15 | Halliburton Energy Services Inc | dispositivo de computação óptico, e, método de medição óptica |
US11204508B2 (en) | 2017-01-19 | 2021-12-21 | Lockheed Martin Corporation | Multiple band multiple polarizer optical device |
US10789467B1 (en) * | 2018-05-30 | 2020-09-29 | Lockheed Martin Corporation | Polarization-based disturbed earth identification |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
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US4692621A (en) * | 1985-10-11 | 1987-09-08 | Andros Anlayzers Incorporated | Digital anesthetic agent analyzer |
SE9700384D0 (sv) * | 1997-02-04 | 1997-02-04 | Biacore Ab | Analytical method and apparatus |
US5940183A (en) * | 1997-06-11 | 1999-08-17 | Johnson & Johnson Clinical Diagnostics, Inc. | Filter wheel and method using filters of varying thicknesses |
US7280214B2 (en) * | 2002-06-04 | 2007-10-09 | Baker Hughes Incorporated | Method and apparatus for a high resolution downhole spectrometer |
US7369233B2 (en) * | 2002-11-26 | 2008-05-06 | Kla-Tencor Technologies Corporation | Optical system for measuring samples using short wavelength radiation |
US7830512B2 (en) * | 2008-03-14 | 2010-11-09 | J.A. Woollam Co., Inc. | System and method for controlling intensity of a beam of electromagnetic radiation in ellipsometers and polarimeters |
US7271912B2 (en) * | 2003-04-15 | 2007-09-18 | Optiscan Biomedical Corporation | Method of determining analyte concentration in a sample using infrared transmission data |
US7408645B2 (en) * | 2003-11-10 | 2008-08-05 | Baker Hughes Incorporated | Method and apparatus for a downhole spectrometer based on tunable optical filters |
US7671973B2 (en) * | 2003-12-19 | 2010-03-02 | Koninklijke Philips Electronics N.V. | Optical analysis system using multivariate optical elements |
US7564552B2 (en) * | 2004-05-14 | 2009-07-21 | Kla-Tencor Technologies Corp. | Systems and methods for measurement of a specimen with vacuum ultraviolet light |
NO322775B1 (no) * | 2004-09-24 | 2006-12-11 | Tomra Systems Asa | Anordning og fremgangsmate for detektering av et medium |
US7206070B2 (en) * | 2004-11-15 | 2007-04-17 | Therma-Wave, Inc. | Beam profile ellipsometer with rotating compensator |
JP2006176831A (ja) * | 2004-12-22 | 2006-07-06 | Tokyo Electron Ltd | 蒸着装置 |
TWI416096B (zh) * | 2007-07-11 | 2013-11-21 | Nova Measuring Instr Ltd | 用於監控圖案化結構的性質之方法及系統 |
US20100160749A1 (en) * | 2008-12-24 | 2010-06-24 | Glusense Ltd. | Implantable optical glucose sensing |
US20120059232A1 (en) * | 2008-12-24 | 2012-03-08 | Glusense, Ltd. | Implantable optical glucose sensing |
US8164050B2 (en) * | 2009-11-06 | 2012-04-24 | Precision Energy Services, Inc. | Multi-channel source assembly for downhole spectroscopy |
WO2011100506A1 (en) * | 2010-02-12 | 2011-08-18 | First Solar, Inc. | Deposition rate control |
GB2501641B (en) * | 2011-02-11 | 2018-02-21 | Halliburton Energy Services Inc | Method for fabrication of a multivariate optical element |
US20130273237A1 (en) * | 2012-04-12 | 2013-10-17 | David Johnson | Method to Determine the Thickness of a Thin Film During Plasma Deposition |
US8879053B2 (en) * | 2012-04-26 | 2014-11-04 | Halliburton Energy Services, Inc. | Devices having an integrated computational element and a proximal interferent monitor and methods for determining a characteristic of a sample therewith |
EP2895913A4 (en) * | 2012-09-13 | 2016-05-18 | Halliburton Energy Services Inc | SPECTROMETER WITH A SPATIAL HETERODYNTE INTEGRATED CALCULATION ELEMENT |
EP2932416A4 (en) * | 2013-02-20 | 2017-01-04 | Halliburton Energy Services, Inc. | Optical design techniques for providing favorable fabrication characteristics |
US20150090909A1 (en) * | 2013-09-30 | 2015-04-02 | Capella Microsystems (Taiwan), Inc. | Selectable view angle optical sensor |
US9518916B1 (en) * | 2013-10-18 | 2016-12-13 | Kla-Tencor Corporation | Compressive sensing for metrology |
US10073191B2 (en) * | 2014-02-25 | 2018-09-11 | Massachusetts Institute Of Technology | Methods and apparatus for broadband angular selectivity of electromagnetic waves |
-
2015
- 2015-08-12 MX MX2017012404A patent/MX2017012404A/es unknown
- 2015-08-12 BR BR112017019560A patent/BR112017019560A2/pt not_active Application Discontinuation
- 2015-08-12 WO PCT/US2015/044910 patent/WO2016167826A1/en active Application Filing
- 2015-08-12 WO PCT/US2015/044908 patent/WO2016167825A1/en active Application Filing
- 2015-08-12 BR BR112017019476A patent/BR112017019476A2/pt not_active Application Discontinuation
- 2015-08-12 GB GB1714207.6A patent/GB2552276A/en not_active Withdrawn
- 2015-08-12 DE DE112015006132.0T patent/DE112015006132T5/de not_active Withdrawn
- 2015-08-12 GB GB1714213.4A patent/GB2551929A/en not_active Withdrawn
- 2015-08-12 MX MX2017011984A patent/MX2017011984A/es unknown
- 2015-08-12 US US15/556,385 patent/US20180045602A1/en not_active Abandoned
- 2015-08-12 US US15/556,340 patent/US20180100799A1/en not_active Abandoned
- 2015-08-12 DE DE112015006163.0T patent/DE112015006163T5/de not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
DE112015006163T5 (de) | 2017-10-26 |
WO2016167826A1 (en) | 2016-10-20 |
GB201714207D0 (en) | 2017-10-18 |
US20180045602A1 (en) | 2018-02-15 |
WO2016167825A1 (en) | 2016-10-20 |
BR112017019476A2 (pt) | 2018-05-15 |
BR112017019560A2 (pt) | 2018-05-02 |
GB201714213D0 (en) | 2017-10-18 |
GB2551929A (en) | 2018-01-03 |
GB2552276A (en) | 2018-01-17 |
MX2017011984A (es) | 2018-01-30 |
US20180100799A1 (en) | 2018-04-12 |
DE112015006132T5 (de) | 2017-11-02 |
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