MX2008007877A - Testing adapter - Google Patents

Abstract

The invention relates to a testing adapter suitable for testing a wireless telecommunication device. The testing adapter comprises a first contact member (102A) and a second contact member (102B), the first contact member (102A) and the second contact member (102B) having at least one degree of freedom relative to each other and arranged to provide an attachable and detachable mechanical coupling with a surface of a component recess of the wireless telecommunication device on the basis of the at least one degree of freedom.

Description

TEST ADAPTER COUNTRYSIDE The invention relates to a test adapter for testing a wireless telecommunication device.

BACKGROUND The manufacture of wireless telecommunication devices involves a complicated test procedure wherein a wireless telecommunication device is put into a test configuration and subjected to mechanical and electronic testing. The test procedure involves a mechanical contact between the test configuration and the wireless telecommunication device in order to place and operate the wireless telecommunication device. The formation of mechanical contact effects that were used at the time for the procedure and the test techniques required access to a test interface of the wireless telecommunication device. Therefore, it is useful to consider techniques for testing a wireless telecommunication device.

BRIEF DESCRIPTION OF THE INVENTION An object of the invention is to provide an improved test adapter. According to one aspect of the invention, a test adapter is provided for testing a wireless telecommunication device, the test adapter comprises a first contact member and a second contact member, the first contact member and the second contact member. The contacts have at least one relative degree of freedom from each other and are configured to provide a coupling and detachable mechanical coupling with a surface of a gap of the component of the wireless telecommunication device based on at least one degree of freedom. The invention provides several advantages. The use of the component gap as a mechanical contact surface between the test adapter and the wireless telecommunication device provides an efficient way to operate a wireless telecommunication device in a test environment. In addition, the use of the component gap as the mechanical contact surface reduces the exposure of the wireless telecommunication device cover to mechanical stress and visual defects.

LIST OF DRAWINGS Next, the invention will be described in more detail with reference to the embodiments and the accompanying drawings, in which Figure 1A shows a first example of a structure of a test adapter according to a first embodiment; Figure IB shows a second example of a structure of a test adapter according to a first embodiment; Figure 2 shows a third example of a structure of a test adapter according to a first embodiment; Figure 3 shows a first example of a structure of a test adapter according to a second embodiment; Figure 4 shows a second example of a structure of a test adapter according to a second embodiment; Figure 5 shows a third example of a structure of a test adapter according to a second embodiment; Figure 6 shows a first example of a structure of a test adapter according to a third modality; Figure 7 shows a second example of a structure of a test adapter according to a third embodiment; Figure 8 shows a third example of a structure of a test adapter according to a third embodiment; Figure 9 shows a fourth example of a structure of a test adapter according to a third embodiment; Figure 10 shows a first example of a structure of a test adapter according to a fourth embodiment; Figure 11 shows a second example of a structure of a test adapter according to a fourth embodiment; Figure 12 shows a third example of a structure of a test adapter according to a fourth embodiment, and Figure 13 shows an example of a structure of a test adapter according to a fifth embodiment. DESCRIPTION OF THE MODALITIES With reference to Figure 1, an example of the structure of a test adapter 100 of according to one embodiment of the invention. The test adapter 100 comprises a first contact member 102A and a second contact member 102B. The first contact member 102A and the second contact member 102B are dimensioned and located mutually so that the test adapter 100 may be fitted in a recess of the component 124 of a wireless telecommunication device 110. The wireless telecommunication device 110 also it can be referred to as a mobile telephone, a cellular phone, user equipment, a mobile station, a mobile terminal and / or a wireless telecommunication modem. The current solution, however, is not restricted to the listed devices, but can be applied to any wireless telecommunication device, connectable to a wireless telecommunication network. The first contact member 102A and the second contact member 102B have at least one degree of freedom 104 from each other, so that the relative position of the first contact member 102A and the second contact member 102B can be changed, thereby providing a coupling and detachable mechanical coupling between the test adapter 100 and a surface 120A-120D of the recess of the component 124.

The degree of freedom 104 may be a rotational degree of freedom, which allows relative rotation between the first contact member 102A and the second contact member 102B. The relative rotation can be rotated such that all dimensions of the test adapter 100 are changed during the relative rotation, thus allowing the test adapter 100 to engage and disengage from the recess of the component 124. At least one degree of freedom 104 it has a component parallel to a line between opposite portions of the surface 120A to 120D of the hollow of the component 124. The opposite portions are, for example, the portion 120C and the portion 120D. The relative position of the first contact member 102A and the second contact member 102B may be controlled by an actuator mechanism 112, which may be integrated in the first contact member 102A and / or the second contact member 102B. The test adapter 100 is pressed in an installation direction 106 into the recess of the component 124 in an uncoupled position from the test adapter 100. In the decoupled position, the spacing between the first contact member 102A and the second contact member 102B is not less than the separation between the opposite portions 120C, 120D of the hollow of component 124. Then, the separation between the first contact member 102A and the second contact member 102A is increased. When the separation is sufficient to provide the mechanical coupling, a coupled position is achieved, and the wireless telecommunication device 110 is mechanically supported by the test adapter 100. The coupled position makes it possible for the wireless telecommunication device 110 to be subjected to a test procedure. The test procedure may for example involve access to a user interface, data busbars and / or power connections of the wireless telecommunication device 110. The test procedure may also involve a visual inspection of the wireless telecommunication device 110 by a test system and / or test personnel. The test adapter 100 may be mounted to the test system, not shown in Figure 1A. The test system may include a place to place the test adapter 100 in an appropriate position for the test system and / or test personnel. The recess of the component 124 is typically a depression for a detachable and detachable component, such as a battery or a memory card. The recess of component 124 can also be referred to as a space for battery or a card slot, depending on the mode. The test adapter 100 can be adjusted according to the shape of the surface 120A to 120D of the recess of the component 124 to ensure sufficient mechanical coupling. The first contact member 102A and the second contact member 102B are made of solid material, such as plastic, ceramic or metal. With further reference to Figure 1A, the test adapter 100 may comprise at least one electrical contact member 114 for supplying an electrical coupling with an electrical contact 108, 116 located in the recess of the component 124. The electrical contact member 114 is connected to an electrical connector 122, the electrical connector 122 is further connected to the test system. The electrical contact members 114 provide electrical access from the test system to electrical test objects, such as power supply, SIM card slot (subscriber identity module), motherboard contact points or test pads , of the wireless telecommunication device 110. The electrical access makes it possible for the test signals to be input and the response signals to be sent from the wireless telecommunication device 110. The contact members 115 may be located according to the location of the electrical contacts 114, 116. Referring to FIG. IB, the test adapter 100 is shown from one side of the component recess. It is shown that the electrical contact members 118 make contact with the electrical contacts 116 located in the lower portion of the recess of the component 124. The electrical contact members 114, 118 may extend slightly from the first contact member 102A and the second contact member. contact 102B to ensure sufficient electrical coupling with the electrical contacts 108, 116. The electrical contacts 114, 118 may be equipped with a suspension mechanism, which limits the mechanical force between the electrical contact members, 114, 118 and the electrical contact 108, 116 when the test adapter 100 is in the engaged position. Figure 2 shows an example of the test adapter 100 connected to an external support 126, as a base. In this example, the test adapter 100 is in the coupled position, and the electrical contact members 114, 118 are connected to the electrical contacts 108, 116. With reference to the examples shown in FIGS. 3 to 12, in an embodiment of the invention, the test adapter 100 comprises a mechanism of force transformation coupled with the first contact member 102A and the second contact member 102B. The force transformation mechanism transforms a first force component 304 into a second force component 302, wherein the first force component 304 is generated when the test adapter 100 is pressed into the recess of the component 124. The second component of force 302 is parallel to a line between the opposite portions 120C, 120D of the hollow surface of component 124, thus providing a mechanical coupling between portion 120D and first contact member 102A and mechanical coupling between portion 120C of the hollow component 124 and the second contact member 102B. The test adapter 100 can be pressed into the recess of the component 124 by test personnel or by an automatic mechanism, such as a robotic arm. With reference to Figure 3, the force transformation mechanism can be implemented by placing the first contact member 102A and the second contact member 102B against each other and by introducing a folding contact 306 between the first contact member 102A and the second contact member 102B. In the decoupled position of the test adapter 100, a point of the test adapter in the vicinity of the collapsible contact 306 separates from the bottom of the gap of the component 124, and the end of the first contact member 102A and the end of the second contact member 102B are located in the vicinity of the bottom portion of the recess of the component 124. In this case, the first contact member 102A and the second member of contact 102B form a flexible, V-shaped test adapter 100, whose ends approach the opposite portions 120C, 120D of the hollow surface of the component 124 when the first force component 304 is applied to the test adapter 100. In one embodiment of the invention, the mechanical transmission mechanism comprises a first gear 300A connected to the first contact member 102A and a second gear 300B connected to the second contact member 102B. The first gear 300A and the second gear 300B are compatible with each other, for example, in terms of tooth size and tooth spacing. The first gear 300A and the second gear 300B are coupled together and arranged to transmit rotational force to each other. The gears 300A, 300B can replace the need for the collapsible contact 306, thus providing a rigid contact between the first contact member 102A and the second contact member 102B at a large scale of rotational angles between the first contact member 102A and the second contact member 102B.

With reference to an example shown in the figure 4, the test adapter 100 of Figure 3 is shown in the engaged position. The first contact member 102A is in contact with the surface portion 120D while the second contact member is in contact with the surface portion 120C, thereby coupling the test adapter 100 mechanically with the wireless telecommunication device 110. electrical contact 114 is in contact with electrical contact 108 of the recess of component 124. Figure 4 also shows a portion of an extension 400 of electrical contact member 114, extension 400 may be connected to a cable or other means for electrically connecting the electrical contact member 114 to the test system. With reference to an example shown in the figure , a test adapter configuration of Figures 3 and 4 is shown from another perspective. Figure 5 shows the extension 400 and further the electrical contact members 500 for connecting to the electrical contacts 118 located in the lower part of the recess of the component 124. Also, the positioning means 504 is shown to provide an accurate mechanical position of the adapter of test 100 in relation to the wireless telecommunication device 110.

With reference to an example shown in Figures 6 to 9, in one embodiment of the invention, the first contact member 102A comprises first guide means 600 for guiding the second, contact member 102B separated from the first contact member 102A when the adapter The test piece is pressed into the recess of the component 124, thus molding the mechanical coupling between the test adapter 100 and the surface 120C, 120D of the recess of the component 124. The first guide means 600 can be a groove 600 formed on the side of the first contact member 102A. The second contact member 102B may comprise an extension 602, such as a bar, extending from the body of the second contact member 102B to the groove 600. The guide means 600 may also be a projecting guide structure, such as a rail guide, which extends from the first contact member 102A. In such a case, the second contact member 102B comprises a contact structure compatible with the projecting guide structure. The guide means 600 may have curvature such that the second contact member 102B has a curved path when the second contact member 102B is moved along the guide means 600. When the first force component 304 is applied to the first contact member 102A, the second contact member 102B follows the curved path with respect to the first contact member 102A, thus generating a second force component 302, which increases the relative position of the first contact member 102A and the second contact member 102B. In Figure 6, the test adapter 100 is in the decoupled position while in Figure 7, the test adapter 100 arrives at the engaged position. In Figure 8, the test adapter of Figures 6 and 7 is in the engaged position. Figure 8 shows the electrical contact member 114 which is electrically coupled to the electrical contact 108. Also shown are the extension 400 of the electrical contact member 114 and an electrical contact member 800 connected to the electrical contacts 118 of the bottom of the hollow of component 124. Figure 9 shows the test adapter of figures 6 to 8 from another perspective. A plurality of extensions 400 of the electrical contact members 108 are also shown. The test adapter 100 may further comprise a plurality of electrical contact members 800 which are connected to the electrical contacts 118 located in the lower part of the component's recess. 124. With reference to the examples of figures 10 to 12, in one embodiment of the invention, the test adapter 100 comprises a body 920 coupled with the first contact member 102A and the second contact member 102B. The body 920 comprises a second guide means 926, 928, which guides the second contact member 102B separated from the first contact member 102A when the test adapter 100 is pressed into the recess of the component 124, thus forming the mechanical coupling between the adapter 100 and the surface 120C, 120D of the recess of the component 124. In one embodiment of the invention, the body 920 comprises the second guide means 926 for guiding the first contact member 102A, and the second contact member 102B is connected to the body 920. In such a case, the second guide means 928 for guiding the second contact member 102B may not exist. The second guide means 926, 928 may be a notch formed in the body 920. The second guide means 926, 928 may also be a projecting guide structure. The first contact member 102A and the second contact member 102B may have an extension 922 and 924, respectively, to be guided by the seconds guide means 926, 928. The guide means 926, 928 may have curvature so that the first contact member 102A and the second contact member 102B have curved paths when they move the first contact member 102A and the second contact member 102B along the guide means 926, 928. When the first force component 304 is applied to the body 920, the first contact member 102A and the second contact member 102B follow the curved paths, thus generating a second force component. 302, which increases the relative position of the first contact member 102A and the second contact member 102B. In Figure 10, the test adapter 100 is in the decoupled position while in Figures 11 and 12, the test adapter 100 is in the coupled positions. Figure 11 further shows the extension 400 and the electrical contact member 114 connected to the electrical contact 108. The electrical contact members 800 are shown making contact with the electrical contacts 118 located in the lower part of the recess of the component 124. With reference to Figure 12 shows another perspective of Figures 10 and 11. Figure 12 shows the gears 940A, 940B, whose function and structure can be similar to those described in conjunction with Figures 3 to 5.

With reference to Figure 13, in one embodiment of the invention, the first contact member 102A comprises a third guide means 944, such as guide rails, for guiding the second contact member 102B in the direction comprising a direction of the component, parallel to a line between the opposite portions 120C, 120D of the hollow surface of the component 124. The test adapter 100 further comprises a force transmission means 942 coupled with the first contact member 102A or the second contact member 102B. The force transmitting means 942 transmits an external force 948 to slide the first contact member 102A with respect to the second contact member 102B. The force transmission member 942 may comprise a bar extending from the first contact member 102A or the second contact member 102B, and a bearing 952 to provide a smooth support from an external structure 950. The second member of contact 102B may comprise an open notch, compatible with guide means 944 to provide sufficient mechanical contact between first contact member 102A and second contact member 102B. The test adapter 100 can also be pivoted axially to the outer structure 950. The force transmission means 942 is supported by the structure external 950 when the test adapter 100 is rotated about an axial pivot 940, thereby causing the first contact member 102A to slide along the third guide means 944. In the example of figure 13, the test adapter 100 is configured to provide the coupled position when the force directed to the force transmitting means 942 from the external support 950 is decreased. The strength of the external support 950 can be controlled by rotating the wireless telecommunication device 110 in the direction indicated by the arrow 946.

The test adapter 100 may further comprise a force means, such as a spring, for forcing the test adapter 100 to the engaged position when the external support 950 is not applied. The test adapter 100 is released from the engaged position when it supports the test adapter 100 to the external support 950. Although the invention has been described above with reference to an example in accordance with the accompanying drawings, it is clear that the invention is not restricted thereto, but can be modified in many ways within the scope of the invention. scope of the appended claims.

Claims (8)

1. Test adapter for testing a wireless telecommunication device, characterized in that the test adapter comprises a first contact member and a second contact member, the first contact member and the second contact member have at least one degree of freedom between if and are configured to provide a coupling and detachable mechanical coupling with a surface of a gap of the component of the wireless telecommunication device based on at least one degree of freedom.

2. Test adapter according to claim 1, characterized in that the test adapter further comprises at least one electrical contact member for providing an electrical coupling with an electrical contact located in the recess of the component.

3. Test adapter according to claim 1, characterized in that the second contact member and the first contact member are configured to provide mechanical coupling with a recess of the component selected from a group comprising: a battery space, a card slot.

4. Test adapter according to claim 1, characterized in that the test adapter comprises a force transformation mechanism coupled with the first contact member and the second contact member, for transforming a first force component into a second force component, in where the first force component is generated when the test adapter is pressed into the recess of the component, the second force component is parallel to a line between the opposite portions of the recess surface of the component, thus providing a mechanical coupling between the component. hollow surface of the component and the first contact member and a mechanical coupling between the hollow surface of the component and the second contact member.

5. Test adapter according to claim 4, characterized in that the mechanical transmission mechanism comprises a first gear connected to the first contact member and a second gear connected to the second contact member, the first gear and the second gear are configured to transmit a rotational force each.

6. Test adapter according to the claim 4, characterized in that the first contact member comprises first guide means for guiding the first contact member to the second contact member when the test adapter is pressed into the recess of the component, thus forming the mechanical coupling between the test adapter and the surface of the component gap.

7. Test adapter according to claim 4, characterized in that the test adapter comprises a body coupled with the first contact member and the second contact member, the body comprises second guide means for guiding the second contact member separated from the first contact member when the test adapter is pressed into the recess of the component, thus forming the mechanical coupling between the test adapter and the surface of the component recess.

8. Test adapter according to claim 1, characterized in that the first contact member comprises a third guiding means for guiding the second contact member in the direction comprising a direction of the component parallel to a line between the opposite portions of the hollow surface of the component, the test adapter also comprises a force transmission means coupled with the first contact member or the second contact member, to transmit an external force to slide the first contact member with respect to the second contact member, the test adapter is further rotated axially to a structure externally, the force transmitting means is configured to be supported by the external structure when the test adapter is rotated about an axial pivot, thereby causing the first contact member to slide along the third guide means.