LU71735A1 - - Google Patents

Info

Publication number
LU71735A1
LU71735A1 LU71735A LU71735A LU71735A1 LU 71735 A1 LU71735 A1 LU 71735A1 LU 71735 A LU71735 A LU 71735A LU 71735 A LU71735 A LU 71735A LU 71735 A1 LU71735 A1 LU 71735A1
Authority
LU
Luxembourg
Application number
LU71735A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of LU71735A1 publication Critical patent/LU71735A1/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
LU71735A 1974-02-12 1975-01-28 LU71735A1 (en:Method)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US442269A US3909131A (en) 1974-02-12 1974-02-12 Surface gauging by remote image tracking

Publications (1)

Publication Number Publication Date
LU71735A1 true LU71735A1 (en:Method) 1975-06-24

Family

ID=23756179

Family Applications (1)

Application Number Title Priority Date Filing Date
LU71735A LU71735A1 (en:Method) 1974-02-12 1975-01-28

Country Status (14)

Country Link
US (1) US3909131A (en:Method)
JP (1) JPS50115857A (en:Method)
BE (1) BE824932A (en:Method)
BR (1) BR7500618A (en:Method)
CA (1) CA1011102A (en:Method)
DE (1) DE2502941A1 (en:Method)
DK (1) DK39975A (en:Method)
FR (1) FR2261504A1 (en:Method)
GB (1) GB1492694A (en:Method)
IE (1) IE42667B1 (en:Method)
IT (1) IT1031667B (en:Method)
LU (1) LU71735A1 (en:Method)
NL (1) NL7501648A (en:Method)
SE (1) SE401263B (en:Method)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3986774A (en) * 1975-05-08 1976-10-19 United Technologies Corporation Gauging surfaces by remotely tracking multiple images
JPS53110553A (en) * 1977-03-08 1978-09-27 Sony Corp Measurement apparatus of gradients of curved faces
US4373804A (en) * 1979-04-30 1983-02-15 Diffracto Ltd. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
JPS5654307A (en) * 1979-10-09 1981-05-14 Inoue Japax Res Inc Measuring instrument for work precision
US4299491A (en) * 1979-12-11 1981-11-10 United Technologies Corporation Noncontact optical gauging system
JPS57139607A (en) * 1981-02-23 1982-08-28 Hitachi Ltd Position measuring equipment
US4830486A (en) * 1984-03-16 1989-05-16 Goodwin Frank E Frequency modulated lasar radar
US4983043A (en) * 1987-04-17 1991-01-08 Industrial Technology Institute High accuracy structured light profiler
JP2542653B2 (ja) * 1987-12-10 1996-10-09 ファナック株式会社 非接触倣い方法
US4916536A (en) * 1988-11-07 1990-04-10 Flir Systems, Inc. Imaging range finder and method
USH687H (en) 1989-04-17 1989-10-03 The United States Of America As Represented By The Secretary Of The Navy Video microimaging system
US5231470A (en) * 1991-09-06 1993-07-27 Koch Stephen K Scanning system for three-dimensional object digitizing
JPH05172562A (ja) * 1991-12-24 1993-07-09 Nec Corp 姿勢センサ装置
DE4318739C2 (de) * 1993-06-05 1997-07-03 Lamtech Lasermestechnik Gmbh Interferometer und Verfahren zur Messung der Topographie von Prüflingsoberflächen
US5648844A (en) * 1995-11-20 1997-07-15 Midland Manufacturing Corp. Laser liquid level gauge with diffuser
KR100888599B1 (ko) * 2007-03-08 2009-03-12 삼성전자주식회사 광디스크 재생 방법 및 이를 이용한 광디스크 재생 장치
CA2911841A1 (en) * 2012-03-24 2013-10-03 Laser Projection Technologies, Inc. Lasergrammetry system and methods
WO2015021173A1 (en) 2013-08-06 2015-02-12 Laser Projection Technologies, Inc. Virtual laser projection system and method
PL3575741T3 (pl) * 2018-05-29 2025-01-20 Manroland Goss Web Systems Gmbh Sposób bezdotykowego pomiaru konturu krawędzi przedmiotu obrabianego
CN109443236A (zh) * 2018-11-28 2019-03-08 合肥常青机械股份有限公司 一种零件外形质量自动化检测系统

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3671126A (en) * 1970-02-19 1972-06-20 Ati Inc Noncontacting optical probe

Also Published As

Publication number Publication date
SE7501513L (en:Method) 1975-08-13
DE2502941A1 (de) 1975-08-14
IT1031667B (it) 1979-05-10
FR2261504A1 (en:Method) 1975-09-12
BR7500618A (pt) 1975-11-18
DK39975A (en:Method) 1975-10-06
GB1492694A (en) 1977-11-23
CA1011102A (en) 1977-05-31
JPS50115857A (en:Method) 1975-09-10
IE42667L (en) 1975-08-12
US3909131A (en) 1975-09-30
AU7735275A (en) 1976-07-22
NL7501648A (nl) 1975-08-14
SE401263B (sv) 1978-04-24
IE42667B1 (en) 1980-09-24
BE824932A (fr) 1975-05-15

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