LU502264B1 - High-Energy Particulate Resistors - Google Patents
High-Energy Particulate Resistors Download PDFInfo
- Publication number
- LU502264B1 LU502264B1 LU502264A LU502264A LU502264B1 LU 502264 B1 LU502264 B1 LU 502264B1 LU 502264 A LU502264 A LU 502264A LU 502264 A LU502264 A LU 502264A LU 502264 B1 LU502264 B1 LU 502264B1
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- Luxembourg
- Prior art keywords
- resistor
- particulate material
- contact
- yoke
- pressure
- Prior art date
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- 239000011236 particulate material Substances 0.000 claims abstract description 96
- 239000007788 liquid Substances 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 14
- 229910052751 metal Inorganic materials 0.000 claims description 10
- 239000002184 metal Substances 0.000 claims description 10
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 9
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 9
- 238000011049 filling Methods 0.000 claims description 7
- 238000004381 surface treatment Methods 0.000 claims description 7
- 239000012212 insulator Substances 0.000 claims description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 4
- 229910052799 carbon Inorganic materials 0.000 claims description 4
- 238000004519 manufacturing process Methods 0.000 claims description 4
- 239000002923 metal particle Substances 0.000 claims description 4
- 238000010248 power generation Methods 0.000 claims description 4
- 238000003825 pressing Methods 0.000 claims description 4
- 229910052582 BN Inorganic materials 0.000 claims description 3
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims description 3
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 239000003921 oil Substances 0.000 claims description 3
- 150000003839 salts Chemical class 0.000 claims description 3
- 239000004576 sand Substances 0.000 claims description 3
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 2
- 238000012544 monitoring process Methods 0.000 claims description 2
- 238000007788 roughening Methods 0.000 claims description 2
- 239000000377 silicon dioxide Substances 0.000 claims description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 2
- 229910002804 graphite Inorganic materials 0.000 claims 1
- 239000010439 graphite Substances 0.000 claims 1
- 238000002156 mixing Methods 0.000 abstract description 8
- 239000002245 particle Substances 0.000 description 60
- 239000000463 material Substances 0.000 description 12
- 239000007787 solid Substances 0.000 description 12
- 239000003990 capacitor Substances 0.000 description 8
- 239000000919 ceramic Substances 0.000 description 7
- 230000008859 change Effects 0.000 description 6
- 239000004020 conductor Substances 0.000 description 6
- 238000009826 distribution Methods 0.000 description 5
- 239000000203 mixture Substances 0.000 description 4
- 239000004033 plastic Substances 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 239000002131 composite material Substances 0.000 description 3
- 238000013016 damping Methods 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonia chloride Chemical compound [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- FAPWRFPIFSIZLT-UHFFFAOYSA-M Sodium chloride Chemical compound [Na+].[Cl-] FAPWRFPIFSIZLT-UHFFFAOYSA-M 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 239000011230 binding agent Substances 0.000 description 2
- 229920001940 conductive polymer Polymers 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000013528 metallic particle Substances 0.000 description 2
- 238000012856 packing Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910001369 Brass Inorganic materials 0.000 description 1
- XMWRBQBLMFGWIX-UHFFFAOYSA-N C60 fullerene Chemical class C12=C3C(C4=C56)=C7C8=C5C5=C9C%10=C6C6=C4C1=C1C4=C6C6=C%10C%10=C9C9=C%11C5=C8C5=C8C7=C3C3=C7C2=C1C1=C2C4=C6C4=C%10C6=C9C9=C%11C5=C5C8=C3C3=C7C1=C1C2=C4C6=C2C9=C5C3=C12 XMWRBQBLMFGWIX-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 description 1
- 235000019270 ammonium chloride Nutrition 0.000 description 1
- 238000005422 blasting Methods 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 239000002041 carbon nanotube Substances 0.000 description 1
- 229910021393 carbon nanotube Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 239000012611 container material Substances 0.000 description 1
- 229910000365 copper sulfate Inorganic materials 0.000 description 1
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 229920001971 elastomer Polymers 0.000 description 1
- 239000000806 elastomer Substances 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 239000008393 encapsulating agent Substances 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 229910003472 fullerene Inorganic materials 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- -1 it comprises dry Chemical compound 0.000 description 1
- 239000011133 lead Substances 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 239000013618 particulate matter Substances 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- 229920001197 polyacetylene Polymers 0.000 description 1
- 229920000767 polyaniline Polymers 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920000128 polypyrrole Polymers 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 238000004382 potting Methods 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000005488 sandblasting Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 239000011780 sodium chloride Substances 0.000 description 1
- 235000002639 sodium chloride Nutrition 0.000 description 1
- AKHNMLFCWUSKQB-UHFFFAOYSA-L sodium thiosulfate Chemical compound [Na+].[Na+].[O-]S([O-])(=O)=S AKHNMLFCWUSKQB-UHFFFAOYSA-L 0.000 description 1
- 235000019345 sodium thiosulphate Nutrition 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000002459 sustained effect Effects 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000002604 ultrasonography Methods 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C10/00—Adjustable resistors
- H01C10/10—Adjustable resistors adjustable by mechanical pressure or force
- H01C10/106—Adjustable resistors adjustable by mechanical pressure or force on resistive material dispersed in an elastic material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C1/00—Details
- H01C1/14—Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/06—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base
- H01C17/065—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thick film techniques, e.g. serigraphy
- H01C17/06506—Precursor compositions therefor, e.g. pastes, inks, glass frits
- H01C17/06513—Precursor compositions therefor, e.g. pastes, inks, glass frits characterised by the resistive component
- H01C17/0652—Precursor compositions therefor, e.g. pastes, inks, glass frits characterised by the resistive component containing carbon or carbides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/06—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base
- H01C17/065—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thick film techniques, e.g. serigraphy
- H01C17/06506—Precursor compositions therefor, e.g. pastes, inks, glass frits
- H01C17/06513—Precursor compositions therefor, e.g. pastes, inks, glass frits characterised by the resistive component
- H01C17/06533—Precursor compositions therefor, e.g. pastes, inks, glass frits characterised by the resistive component composed of oxides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/06—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base
- H01C17/065—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thick film techniques, e.g. serigraphy
- H01C17/06506—Precursor compositions therefor, e.g. pastes, inks, glass frits
- H01C17/06513—Precursor compositions therefor, e.g. pastes, inks, glass frits characterised by the resistive component
- H01C17/0656—Precursor compositions therefor, e.g. pastes, inks, glass frits characterised by the resistive component composed of silicides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/06—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base
- H01C17/065—Apparatus or processes specially adapted for manufacturing resistors adapted for coating resistive material on a base by thick film techniques, e.g. serigraphy
- H01C17/06506—Precursor compositions therefor, e.g. pastes, inks, glass frits
- H01C17/06573—Precursor compositions therefor, e.g. pastes, inks, glass frits characterised by the permanent binder
- H01C17/06586—Precursor compositions therefor, e.g. pastes, inks, glass frits characterised by the permanent binder composed of organic material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C10/00—Adjustable resistors
- H01C10/10—Adjustable resistors adjustable by mechanical pressure or force
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
- H01C17/26—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by converting resistive material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C8/00—Non-adjustable resistors consisting of loose powdered or granular conducting, or powdered or granular semi-conducting material
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Thermistors And Varistors (AREA)
Abstract
A high-energy resistor has a resistive body comprising unbound particulate material. The resistance value of the resistor can be determined in part by a mixing ratio of components in the unbound particulate material. For a selected mixing ratio, the resistance of the assembled resistor can be adjusted to obtain a selected resistance value by changing pressure on the unbound particulate material. Such adjustment can be made readily by a user.
Description
High-Energy Particulate Resistors LUS02264
[0001] High-energy, high-power resistors may be used in applications involving high voltages and high currents and/or where high-energy electrical pulses occur or may occur (e.g., in emergency shunting of current, rapid discharging of high-power capacitors, current limiting in high-power circuits, operation of apparatus for plasma confinement or particle acceleration).
Some systems that may use high-energy resistors include systems that produce intense magnetic fields that may be generated with a plurality of current-carrying coils that are driven with high electrical currents and high voltages. Such magnetic fields may be used to confine high-energy particles and/or to accelerate particles or objects to high velocities. In some cases, high magnetic fields may be used to confine a plasma. Other systems that may use high-energy resistors include power generation and transmission systems and systems that perform high-power resistive damping.
[0002] The described implementations relate to high-energy resistors having resistive volumes, bodies, or cores comprising unbound particulate material instead of a liquid or a solid bound resistive core. The unbound particulate material can include two or more particulate materials and a mixing ratio of the two or more particulate materials can determine, at least in part, the resistance value of the high-energy resistor. A wide range of resistance values are possible (e.g., from 1 microohm to 1 megaohm or even higher resistance values) depending, in part, on the mixing ratio. Additionally, for a selected mixing ratio, the resistance can be tuned with pressure applied to the unbound particulate material after assembly to obtain a desired resistance value to high accuracy. High accuracy can be achieved for very low resistance values and maintained for high-power applications. The tuning of the resistance can provide precise customizability of resistance value to match a target application. In some implementations, multiple resistors can be sized and assembled together to withstand energy levels of at least 100,000 Joules and peak 1 power levels of at least 10,000 watts. The resistors can be used in systems that produce intense LU502264 magnetic fields, power generation systems, and power transmission systems. The particulate resistors are durable and can maintain an accuracy of resistance value within +1 % or less over the lifetime of the resistor, which can be up to tens of thousands of hours or hundreds of thousands of hours or even longer in high-power or high-energy applications. High-power applications can include peak powers over 50 megawatts per pulse in pulsed operation or over 10 watts in continuous current operation. High-energy applications can include peak energies over 5,000 Joules per pulse in pulsed operation. In some examples, the pulse duration can be from 0.1 millisecond to 1 second with a maximum duty cycle up to 50 %. Resistor lifetimes can be longer for power and/or energy levels below these values. Further, if a resistance value of the resistor changes with time, the resistance can be tuned in place to restore the targeted resistance value instead of replacing the resistor. With in-place tuning, the accuracy of resistance value can be maintained even longer.
[0003] Some implementations relate to a resistor comprising a container and unbound particulate material filling a volume of the container and forming a resistive body. The resistor can further include an assembly to support and electrically connect to the resistive body. The unbound particulate material can include an insulative particulate material and a conductive particulate material dispersed throughout the insulative particulate material.
[0004] Some implementations relate to a resistor having a resistive body comprising unbound particulate material and an assembly to support and electrically connect to the resistive body.
The unbound particulate material can include an insulative particulate material and a conductive particulate material dispersed throughout the insulative particulate material.
[0005] Some implementations relate to a method of making a resistor having a resistive body of unbound particulate material. The method can include acts of: filling a container of a resistor assembly with the unbound particulate material, wherein the resistor assembly 1s configured to connect to an electrical circuit; arranging a first contact to contact the unbound particulate material at a first location with respect to the container; arranging a second contact to contact the unbound particulate material at a second location with respect to the container; and increasing an amount of pressure applied by the first contact and/or the second contact to the unbound particulate material to obtain a selected resistance value. 2
[0006] All combinations of the foregoing concepts and additional concepts discussed in greater LU502264 detail below (provided such concepts are not mutually inconsistent) are contemplated as being part of the inventive subject matter disclosed herein. In particular, all combinations of claimed subject matter appearing at the end of this disclosure are contemplated as being part of the inventive subject matter disclosed herein. The terminology explicitly employed herein that also may appear in any disclosure incorporated by reference should be accorded a meaning most consistent with the particular concepts disclosed herein.
[0007] The skilled artisan will understand that the drawings primarily are for illustrative purposes and are not intended to limit the scope of the inventive subject matter described herein.
The drawings are not necessarily to scale; in some instances, various aspects of the inventive subject matter disclosed herein may be shown exaggerated or enlarged in the drawings to facilitate an understanding of different features. In the drawings, like reference characters generally refer to like features (e.g., functionally similar and/or structurally similar components).
[0008] FIG. 1 depicts a conventional high-energy resistor of the related art.
[0009] FIG. 2 depicts, in elevation view, an example of a high-energy particulate resistor.
[0010] FIG. 3 depicts, in elevation view, another example of a high-energy particulate resistor.
[0011] FIG. 4 plots an estimated dependence of resistance on pressure applied to the resistor’s unbound particulate material.
[0012] FIG. S illustrates an example of a circuit in which one or more particulate resistors can be used.
[0013] I. Solid Core Resistors
[0014] FIG. 1 depicts a high-energy resistor assembly 100 that uses a conventional resistor core 110. Typically, the resistor core 110 is a single solid piece of material (often a matrix of carbon 3 and a ceramic bound together to form a solid core) that is manufactured to have a target LU502264 resistance value. The resistor core can be in the shape of a disc, rod, tube, or rectangular bar and may or may not have metal contacts 130 attached to the resistor core 110. If contacts 130 are not attached to the resistive core 110, then a clamp 120 may be used to press the contacts 130 against the resistive core. À conductor 140 may attach to each contact 130 via a conductive tab 145 and fastener 150. Another type of conventional resistor is a so-called “water resistor” or “liquid resistor” that has a liquid core comprising an ionic solution of water and a salt such as copper sulfate, ammonium chloride, sodium thiosulfate, or sodium chloride.
[0015] The inventors have recognized and appreciated that some high-energy applications (e.g., involving a sequence of pulses, each having energy levels over 5,000 Joules and full-width-half- maximum durations from 0.5 millisecond to 20 milliseconds) need resistors having very low resistance values (e.g., less than 1 milliohm) and having high resistance accuracy from resistor to resistor (e.g., a standard deviation of resistance value for a plurality of resistors and/or resistance error from a target value that is less than 1 %). The inventors have recognized a problem with conventional ceramic resistors having very low resistance values for high-power and high-energy applications. Solid core, ceramic resistors are prone to fracturing under operating conditions desired by the inventors. Because of the low resistance value and increase in content of conductive material (such as carbon), the solid resistor core 110 becomes structurally weak.
Further, the contacts 130 must be applied with sufficient force to reduce contact resistance between the resistor core 110 and contacts 130 to a level that is less than the target resistance value. Also, if the contacts are not applied with sufficient pressure, arcing between the contacts 130 and the resistor core 110 can occur for some high-voltage applications, which can change the resistance and/or damage the resistor. In some cases, the amount of pressure needed from the contacts 130 to achieve the correct resistance and/or avoid arcing results in breakage of the resistor core 110. Additionally, the resistance values of resistors having a solid resistor core can vary more than an acceptable error tolerance for some high-energy systems at very low resistance values. Although liquid resistors may not have the problems associated with contacts, these resistors are undesirable because they require maintenance, suffer from changes in resistance value due to chemical reactions, and the electrolyte poses a leak hazard in a high- voltage electrical environment. Further, conventional high-energy solid or liquid-core resistors are high-cost and can have a substantial lead time associated with their fabrication and delivery 4 for custom applications. Developers of high-energy systems or those pursuing research and LU502264 development applications with high-energy systems may not be able to obtain resistors of different sizes, resistance value, and power capacity on a quick-turnaround basis, hindering research and development efforts. Moreover, and irrespective of cost, the inventors have not currently been able to find commercially-available resistors capable of operating in their high- energy system that provide a desired resistance accuracy, let alone withstand physical forces in the system without breakage.
[0016] II. A. First Example of a Particulate Resistor
[0017] FIG. 2 depicts, in elevation view, an example of a high-energy particulate resistor assembly 200. A cross section of the resistor assembly is illustrated. The resistor assembly comprises an unbound particulate material 212 which forms the resistive body 210. The unbound particulate material is held within a container 220 and fills a volume within the container. A first contact 230 can be applied at a first location with respect to the container to electrically contact the particulate material 212. A second contact 232 can be applied at a second location with respect to the container 220 to electrically contact the particulate material 212, thereby providing two terminals or attachment points for two terminals of the resistor assembly 200. A first clamp jaw 250 and a second clamp jaw 252 (electrically insulated from the first clamp jaw) can press against the first contact 230 and the second contact 232 and thereby apply pressure on the unbound particulate material 212.
[0018] II. B. Example Particulate Material
[0019] The unbound particulate material 212 does not constitute a single solid piece of material.
The unbound particulate material 212 preferably has a texture and consistency resembling desert sand or powder (e.g., it comprises dry, unbound solid particles that can be poured into and out of the container 220). There is no binding agent added or sintering performed to bind the particles together in the container 220. The particles can move with respect to each other when the resistive body 210 is being compressed, while and/or after filling of the container 220, to reach a final working state. In the final working state, the resistive body can be under a fixed pressure and the particles may not move with respect to each other. However, upon removal of the pressure, the unbound particulate material can be poured out of the container.
[0020] In some cases, the unbound particulate material 212 can be a mixture of two or more LU502264 classes of particles: conductive (generally understood to be 10” Siemens/meter (S/m) or larger), semiconductive (generally understood to be between 10’ S/m and 10"! S/m), and/or insulative (generally understood to be 10"!* S/m and lower). Within each class, there can be one or more types of particles. Example types of conductive particles include, but are not limited to, carbon particles (e.g., carbon powder, graphite powder or particles, fullerenes, carbon nanotubes), aluminum powder, metal particles (e.g., colloidal metal particles, metal filings), and conductive polymer particles (e.g., polypyrrole, polyacetylene, polyaniline). In some cases, graphite powder (available from MSE Supplies LLC of Tucson, Arizona) can be used for the conductive particles.
Examples of insulative particle types include, but are not limited to, sand, silica, silicon nitride, alumina, a salt, and boron nitride. In some cases, aluminum oxide blasting media (available from W. W. Grainger, Inc. of Lake Forest, Illinois) can be used for the insulative particles.
Boron nitride can be a desirable insulative material for high-power applications because of its high thermal conductivity, which can aid in dissipating heat from the resistive body. Examples of semiconductive particle types include, but are not limited to, undoped or lightly doped semiconductor particles such as undoped or lightly doped silicon or polysilicon particles, undoped or lightly doped germanium particles, etc. A light doping concentration is generally understood to be an impurity concentration of 10!° cm” or less, or one impurity atom per 100 billion semiconductor atoms or less. Preferably, the particles have a stable chemical composition (i.e., do not change conductivity over time) and do not chemically interact with and/or degrade components of the resistor assembly.
[0021] For some implementations, a resistive body can include metallic particles and lightly doped or undoped semiconductive particles. In some cases, the metallic particles and semiconductive particles may be bound together by heating the mixture to eutectically bond the metal particles to the semiconductive particles and form a solid matrix without an added binder.
The eutectically bound matrix may be significantly stronger than a conventional carbon-ceramic bound resistor core.
[0022] When only conductive and insulating particles are used to form the resistive body, a ratio by weight of the conductive particulate material to the insulative particulate material can be (for example) any ratio from 0.5:99.5 to 99.5:0.5, from 15:85 to 35:65 in some cases, from 40:60 to 60:40 in some cases, from 65:35 to 85:15 in some cases. Higher and lower ratios may be 6 possible. When only semiconductive and insulating particles are used to form the resistive body, LU502264 a ratio by weight of the semiconductive particulate material to the insulative particulate material can be (for example) any ratio from 1:99 to 99:1, from 15:85 to 35:65 in some cases, from 40:60 to 60:40 in some cases, from 65:35 to 85:15 in some cases. Higher and lower ratios may be possible. When only conductive and semiconductive particles are used to form the resistive body, a ratio by weight of the conductive particulate material to the semiconductive particulate material can be (for example) any ratio from 1:99 to 99:1, from 15:85 to 35:65 in some cases, from 40:60 to 60:40 in some cases, from 65:35 to 85:15 in some cases. Higher and lower ratios may be possible. When conductive, semiconductive, and insulative particles are used, one or two of the particle classes can have, for example, a weight percentage as low as 0.5 % of the total weight of the unbound particulate material 212. Further, one of the particle classes may have, for example, a weight percentage as high as 99 % of the total weight of the particulate material.
[0023] The mixing ratio of the unbound particulate material determines, at least in part, a resistance of the resistor. Because a wide range of mixing ratios are possible and because a wide range of conductivities are possible for the particles and because a wide range of resistor sizes are possible, a single resistor can be designed to have a resistance value in a range from 10 microohms (10° Q) to 100 megaohms (10% ©) or more. However, a particulate resistor can be designed to have a resistance value in any one of several subranges within these values, such as in a range from 10° Q to 10* Q, from 10* Q to 107 Q, from 107 Qto 1 Q, from 1 Q to 10° Q, from 10? Q to 10* Q, or from 10* Q to 10° Q, or from 10° Q to 10° Q.
[0024] The sizes of particles making up the unbound particulate material 212 can vary within the resistive body 210. There can be up to billions or more unbound particles in the resistive body.
Each particle 214 (illustrated as a magnified view in FIG. 2) can have any shape (oblong, spherical, random) with a maximum diameter or maximum transverse dimension Wy... There can be a distribution of particle sizes in the resistive body 210. For example, the smallest particles in a resistive body 210 may have a maximum transverse dimension Wmnax measuring down to 25 microns (for example) while the largest particles in the same resistive body can have a maximum transverse dimension Wmax measuring up to 800 microns (for example). Particles with sizes between these two values can also be present in the resistive body 210. In some cases, the particle sizes may be within any subrange, or the full range, of values between 25 microns 7 and 800 microns (e.g., from 25 microns to 100 microns, from 50 microns to 200 microns, LU502264 from100 microns to 300 microns, from 200 microns to 500 microns, or from 400 microns to 800 microns). In some implementations, smaller particles can be included, for example, having a maximum diameter or maximum transverse dimension less than 25 microns. In some implementations, particles with maximum transverse dimensions greater than 800 microns may be included in the resistive body.
[0025] In some implementations, filtering can be used to obtain a more uniform distribution of particle sizes and/or a desired particle size range (e.g., a peak or average size value with a narrow size distribution). The size distribution (full width half maximum points) for filtered particles may be any distribution value in a range from, for example, + 50 % to as small as + 10 % of the peak or average size value. Filtering can be performed for each of the particle classes. As such, the peak or average size and size distribution can be selected independently and differ for two or more particle classes within a resistive body 210.
[0026] When packed into the container 220, there can be voids between the particles such that the resistive body 210 has a porosity. In some cases, the volume of the voids in the resistive body can comprise (for example) up to 6 % of the total volume of the resistive body 210 or may have any value in a sub-range between 1 % and 80 % of the total volume of the resistive body.
A total volume of the resistive body is the volume occupied by the particles in the resistive body plus the total volume of the voids.
[0027] According to some implementations, the particulate material may be layered into the container 220. Each layer may contain only one particular particle class of the three classes (conductive, semiconductive, insulative) or can contain a mixture of particles from the three classes. There may be any number of layers in the resistive body 210, and there can be different resistances of the layers.
[0028] II. C. Use of Liquids in Particulate Resistors
[0029] For some applications, insulative oil (e.g., a high-voltage transformer oil available from
Phillips 66 Company), water, or other insulating liquid may be included in the resistive body 210 and permeate throughout the unbound particulate material 212. The insulating liquid may fill interstitial voids between unbound particles and may (for example) comprise up to 70 % of the weight of the resistive body 210. Higher weight percentages of the insulating liquid may be 8 possible, such as up to 90 %. In some cases, the weight of the insulating liquid may comprise up LU502264 to 10 %, up to 30 %, up to 50 % of the weight of the resistive body. The insulating liquid can be introduced into the resistive body through at least one hole in the container 220 and/or contact(s) 230, 232 after addition of the unbound particulate material. The insulating liquid can be introduced under pressure and/or using a vacuum and the hole(s) later sealed. Alternatively, an insulating liquid/particle slurry can be mixed and loaded into the container. Excess liquid can be pressed out through a sieve or filter with a mechanical press while installing, or prior to installing, the contacts 230, 232. In some cases, seals 231 can be included to retain the insulating liquid and/or small particles in the container 220. The seals can be formed from an elastic or malleable material. When seals are used, particles with maximum transverse dimensions smaller than 25 microns may be included in the resistive body 210.
[0030] For some high-voltage applications, the resistor assembly 200 can be immersed in an insulative liquid. In such applications, seals 231 may or may not be used. For example, the seals may not be included if the resistive body 210 is permeated with an insulating liquid and particles are large enough to not leak out between the container/contact interfaces. Inclusion of an insulating liquid in the resistive body and/or immersion of the resistor assembly 200 in an insulative liquid can aid in heat dissipation from the resistive body 210.
[0031] II. D. Container and Contacts for Particulate Resistors
[0032] The container 220 (a component of the resistor assembly) can be made from an insulating material, such as a glass, quartz, insulating ceramic, composite material, or plastic. The container can be a tube with a circular or oval cross-section, though other cross-sectional shapes can be used (e.g, square, rectangular, hexagonal, octagonal, polygonal). The contacts 230, 232 can have a same shape as the cross-sectional shape of the container 220 and can be sized to fit inside the container with a close tolerance (e.g., up to 5 mils or approximately 125 microns clearance), so as to prevent leakage of the particles out of the container 220. Larger tolerances can be used for larger particle sizes (e.g. tolerances up to 250 microns). In some cases, the contacts 230 can be slightly larger than the container’s inner diameter (if the container is made from a plastic or composite material) so that the periphery of the contact seals against the container’s inner wall when inserted into the container 220. 9
[0033] An overall size of the container 220 and contacts 230 can be determined based upon LU502264 power or energy levels of an application in which the particulate resistor will be used. Larger sizes can be used for higher power or higher energy applications. For some applications, an inner diameter D (for a cylindrical resistor) or maximum width (for resistors having rectangular or polygonal cross sections) of the container can be from 2 cm to 100 cm, though smaller or larger sizes are possible. A length Z of the container 220 can be from 2 cm to 200 cm, though smaller or longer lengths are possible.
[0034] The contacts 230, 232 can comprise a conductive metal that comes into physical and electrical contact with the unbound particulate material 212. Example metals include, but are not limited to, aluminum, copper, gold, tungsten, nickel, molybdenum, brass, stainless steel, etc.
The contacts 230, 232 can be solid metal. In some implementations, the conductive metal can be coated, attached, or otherwise disposed on another conductive material or an insulative material such as a ceramic, hard plastic, or composite material to form a contact 230, 232.
[0035] The contacts 230, 232 can each be configured to attach a conductor 140. For example, a fastener 150 can provide for attaching a conductor or conductive tab 145 that attaches to the cable 140. The fastener can comprise a nut and bolt, threaded stud, press-fit stud, post, clip, tab, connector, efc. The contacts 230, 232 are electrically connected to each other only through the resistive body 210 when not connected to an external circuit.
[0036] The contacts can be pressed against the unbound particulate material 212 in the resistive body 210 under high pressure. For example, a first clamping jaw 250 can press the first contact 230 against the unbound particulate material 212 and a second clamping jaw 252 can press the second contact 232 against the unbound particulate material 212 at a different location with respect to the container 220. The first contact 230 and first clamping jaw 250 can be on an opposite side of the resistive body 210 than the second contact 232 and second clamping jaw 252. The clamping jaws 250, 252 can be part of an adjustable clamp or can be fixed in place after applying an appropriate amount of pressure to the unbound particulate material 212.
Alternatively, the clamping jaws can be part of a flexure or spring assembly that applies a desired force on the contacts 230, 232. The flexure or spring assembly can allow separation of the jaws to insert the resistive body 210 and contacts 230, 232 during assembly, followed by release of the jaws to apply a predetermined force on the clamping jaws 250, 252.
[0037] II. E. Second Example of a Particulate Resistor LU502264
[0038] FIG. 3 depicts, in elevation view, another example of a high-energy particulate resistor assembly 202. À cross section of the resistor assembly is illustrated and shows details of a clamping assembly 300. The clamping assembly includes a first yoke 302, second yoke 304, bolts 306, nuts 308, and washers 309. The clamping assembly 300 can further include a pressure indicator assembly comprising a pressure bolt 346, pressure nut 348, indicator washer 345, spring washers 344, and force spreader 342. The resistor assembly 202 can further include a first flange 330 and second flange 332, insulator 320, and insulative sleeves 322 for the bolts 306.
[0039] The first and second flanges 330, 332 can be formed from a metal (e.g., aluminum) and placed in physical and/or electrical contact with the first and second contacts 230, 232. In some cases, the first and second flanges 330, 332 can be screwed, bolted, registered with pins, or registered with other features to the respective contacts 230, 232. Alternatively, the first and second flanges 330, 332 can be integrally formed from a same piece of metal as the respective contacts 230, 232. The first and second flanges 330, 332 can each include one or more holes 335 (clear and/or threaded) for mounting the resistor assembly 202 in an apparatus and/or for making electrical connection of a conductor 140 to each contact 230, 232.
[0040] The clamping assembly 300 and resistor assembly may be assembled as follows. The force spreader 342 and spring washers 344 can be placed on the pressure bolt 346, which 1s then inserted through the first yoke 302. The pressure nut 348 and indicator washer 345 can then be placed on the pressure bolt 346. A press or the pressure nut 348 can then be used to apply a selected force to compress the spring washers 344 between the first yoke 302 and force spreader 342. The press may have a force indicator. Alternatively, a force may be determined from an amount of compression of the spring washers 344.
[0041] If a press is used, once the desired force on the spring washers is reached the pressure nut 348 can be tightened by hand until it holds the indicator washer 345 securely against the first yoke 302. The first yoke 302 with pressure bolt 346 and pressure nut 348 firmly in place can then be removed from the press.
[0042] The second contact 232 can be inserted into one end of the container 220, for example, and the unbound particulate material 212 added into the container. The first contact 230 can be inserted into an opposing end of the container 220. The first flange 330 and second flange 332 11 can be placed against the first contact 230 and second contact 232. The insulator 320 can be LU502264 installed, which electrically isolates the first flange 330 and first contact 230 from the rest of the resistor assembly.
[0043] The second yoke 304 can then be placed and bolted to the first yoke 302 with bolts 306, nuts 308, and washers 309. Lock washers can be used. The nuts 308 can be tightened to clamp the insulator 320, flanges 330, 332, and contacts 230, 232 against the unbound particulate material 212. Bolt insulators 322 can be placed over the bolts 306 to prevent electrical shorting between the bolts 306 and first flange 330 and/or first contact 230. The bolt insulators 322 can be plastic, glass, quartz, or ceramic tubes.
[0044] The bolts 306 can then be tightened further until the indicator washer 345 loosens. When the indicator washer loosens, the desired force (e.g., the force read from a gauge on the press when assembling the first yoke 302, pressure bolt 346, force spreader 342, and spring washers 344) is applied by the contact areas of the first contact 230 and second contact 232 to the unbound particulate material 212.
[0045] IL F. Tuning the Resistance or Particulate Resistors
[0046] After assembly of the high-energy resistor, the resistor can be tuned to a desired resistance (as described below). In some cases, at least a portion of the resistor assembly 200, 202 can be encapsulated. For example, some or all of the resistor assembly may be covered with a high-voltage potting resin or an elastomer. An encapsulant that has some flexibility may allow for further tuning of the resistance value after encapsulation.
[0047] In some cases, a high-energy resistor can be configured to provide automated or semi- automated adjustment of resistance value. For example, actuators can connect to and rotate bolts 306 or nuts 308 to change a pressure applied to the unbound particulate material 212 and thereby tune the resistance value. In some cases, an actuator can be one or more piezoelectric transducers (PZ Ts) that expand and contract in response to an applied voltage. The PZTs can be positioned between the first flange 330 and the first contact 230, for example, to increase and decrease an amount of pressure applied to the unbound particulate material 212. In some implementations, the actuators or PZTs can be computer controlled. In some cases, automated or semi-automated adjustment of resistance value can be performed in real-time while the resistor is in use in a circuit. 12
[0048] Actuators can be controlled in an automated or semi-automated manner using a computer LU502264 (e.g., a personal computer, laptop, or tablet) or another intelligent controller. Examples of other intelligent controllers include a microprocessor, microcontroller, programmable logic controller, field-programmable gate array, and digital signal controller. The intelligent controller can include and/or be in communication with memory which stores code that can be executed by the intelligent controller.
[0049] In some implementations, a surface treatment 312 can be applied to the first contact 230 and second contact 232 of a resistor assembly 200, 202 to improve electrical connectivity and reduce contact resistance between the contacts 230, 232 and the unbound particulate matter 212.
In some cases, the surface treatment comprises roughening the surface of the contacts (e.g., abrading, knurling, etching, sand blasting). Alternatively or additionally, a malleable conductive coating can be applied to the surfaces of the contacts 230, 232 that press against the unbound particulate material 212. À malleable coating can comprise a soft metal (e.g., lead, copper, gold, silver). For some implementations, the surface treatment 312 comprises a conductive paste or a conductive polymer that 1s coated onto the contacting surface of the contacts 230, 232.
[0050] To improve pressure uniformity throughout the unbound particulate material 212, several steps of packing can be employed when adding the unbound particulate material to the container 220. For example, one-quarter or some other fraction of the unbound particulate material can be added initially to the container 220 and then pressed into the container against a contact to a desired final pressure. Then, another fraction of the unbound particulate material can be added to the container and pressed again. The steps of adding a portion of the unbound particulate material and pressing can be repeated until all of the unbound particulate material 1s in the container. Then final assembly of the resistor assembly 202 can proceed. During the steps of pressing, ultrasound or other means for vibrating the container and particulate material 212 can be applied to the container 202 in some cases to assist with packing the unbound particulate material.
[0051] FIG. 4 plots an estimated change in resistance value of a resistive body 210 (e.g., for a resistor assembly as depicted in FIG. 2 or FIG. 3) as a function of pressure applied to its particulate material 212 by the contacts 230, 232. At low pressures, the resistance value changes rapidly with pressure (e.g., changing by more than a factor of 5 for a doubling of pressure). At 13 high pressures, the resistance value can change more slowly with pressure (e.g., up to a factor of LU502264 2 with a doubling of pressure). The plot of FIG. 4 is an example for descriptive purposes only and is not limiting of resistor performance. Although FIG. 4 illustrates a maximum pressure of 600 psi, higher pressures may be used in some implementations (e.g., any value up to 10,000 psi or more) to obtain a desired resistance. The amount of applied pressure that can be applied to a particulate resistor may be determined by strengths of materials used (e.g., tensile strength of bolts, shear limit of bolt or nut threads, strength of container 220, strength of plates) and geometry of the particulate resistor. As may be appreciated, the total resistance for a particulate resistor will be determined by the applied pressure, the mixing ratio of its particulate components (e.g., ratio of conductive and/or semiconductive particles to insulative particles), conductivity of the conductive and/or semiconductive particles, and the length of the resistive body. Ranges of pressure that may be applied to the particulate material 212 by the contacts 230, 232 to tune the resistor to an operational point may any subrange within a range from 10 psi to 10,000 psi or greater. Example subranges over which a particulate resistor can be tuned can be from 10 psi to 100 psi, from 10 psi to 500 psi, from 10 psi to 1000 psi, from 10 psi to 2000 psi, from 10 psi to 5000 psi, from 100 psi to 500 psi, from 100 psi to 1000 psi, from 100 psi to 2000 psi, from 100 psi to 5000 psi, from 1000 psi to 2000 psi, from 1000 psi to S000 psi, or from 1000 psi to 10000 psi.
[0052] Because the resistance of the resistive body can change in a predictable manner with applied pressure, the resistance can be readily adjusted or tuned at the factory and/or by a user.
For example, a user can tighten or loosen the bolts 306 or nuts 308 for the resistor assembly 202 shown in FIG. 3 while monitoring the resistance until a desired resistance value is obtained.
Even if the resistance changes with age of the device, a user can tune the resistance to the desired value. Tuning can be done in place by disconnecting one or both leads to the resistor that connect(s) to a circuit that includes the resistor. The resistance can then be measured across the resistive body while bolts 306 or nuts 308. In this manner, highly accurate resistance values can be obtained and maintained for the high-energy resistors, even for low and very low resistance values. For example, the accuracy can be specified as a tolerance (e.g., + 1 %) which represents a range of values the resistor can have with respect to a specified value (e.g., 100 microohms).
In some cases, resistance tolerance for a particulate resistor can be any value in a range from + 0.01 % to + 5 % (e.g., a value in a range from + 0.1 % to + 1 % or from + 0.01 % to + 0.1 %), 14 though smaller tolerances may be possible. Narrower tolerances and wider tolerances may be LU502264 achieved in some cases. Further, the accuracy of resistance over the lifetime of the resistor can be improved with tuning of the resistance value (e.g., tuned as the resistor ages). For example, the accuracy of the resistance value over the lifetime of the particulate resistor can be any value in a range from + 0.01 % to + 5 % (e.g., a value in a range from + 0.1 % to + 1 % or from + 0.01 % to + 0.1 %), though greater accuracy may be possible.
[0053] The tuning range of a particulate resistor can be large and determined, at least in part, by a range of pressure applied to its particulate material 212 by the contacts 230, 232. The tuning range can depend upon the conductivity of particulates used to form the resistive body. For example, a particulate resistor designed to have a very low resistance value (less than 1 ohm) at a maximum applied pressure may have a larger tuning range than a particulate resistor designed to have a very high resistance value (over 100 kiloohms). The tuning range of a particulate resistor can be a factor in a range from 0.9 to 10*. A tuning range of a factor of 0.1 means that a particulate resistor can be tuned from a first resistance value R to a second resistance value of 0.1R: for example, from a value of 10,000 ohms to 1,000 ohms. However, a particulate resistor can have a tuning factor in any one of several subranges within these values, such as in a range from 0.9 to 0.1, from 0.9 to 10”, from 0.9 to107, or from 0.9 to10*.
[0054] II. G. Example Circuits and Applications for Particulate Resistors
[0055] FIG. 5 depicts an example of a supply circuit 520 that can include particulate resistors
R1, R2 of any one of the above-described embodiments. The supply circuit 520 can be used to drive current through an electromagnetic coil 530. The supply circuit 520 can include a capacitor C1 that can be used to store a large amount of energy. The capacitor C1 can be charged to a high energy state by a current source or voltage source 505, which may or may not be part of the supply circuit. The particulate resistor R1 can be used to control a charging rate of the capacitor C1. A second particulate resistor R2 can be used to control a discharge rate from the capacitor C1 and behavior of the current pulse applied to the coil 530 (e.g., damping of oscillations). The voltage source 505 and capacitor C1 can connect in series with a switch 510 that closes to apply voltage Vsupp to the coil 530 when switched from an open state to a closed state. When the switch is in an open state, the capacitor C1 can be charged.
[0056] Other circuits that can include particulate resistors of the above-described embodiments LU502264 include, but are not limited to, circuits supporting high voltages (e.g., in 10,000 volts or more), high currents (e.g., 1,000 amps or more) and/or high-energy electrical pulses (e.g., 5,000 Joules or more). À circuit containing a particulate resistor may perform emergency shunting of high currents, discharging of high-power capacitors, current limiting in high-power circuits or high- power resistive damping. Such circuits can be used in systems that produce intense magnetic fields (e.g., 1 Tesla or more) where the fields can be generated with a plurality of current- carrying coils that are driven with high electrical currents and high voltages. The circuits can also be used in high-power generation and transmission systems.
[0057] Although the above implementations describe single resistors that can be made to withstand high voltages, high power, high currents, and/or high energy levels, the particulate resistors can be made smaller in size for some applications. For example, some applications may not involve high voltages, high power, high currents, and/or high energy levels and therefore the resistors can be sized to withstand less severe operating conditions. Alternatively, a plurality of resistors can be used in a high-voltage, high-power, high-current, and/or high-energy-level environment to distribute the loading on each particulate resistor. In such cases, each particulate resistor can be sized to withstand less severe operating conditions. For example, five particulate resistors, each sized to withstand up to 1,000 Joule pulses, connected in parallel can be used in an application involving electrical pulses having up to 4,500 Joules in each pulse. The pulse duration may be as short as 0.1 millisecond and as long as one second FWHM with a maximum duty cycle up to 50 %. Accordingly, multiple particulate resistors can be sized and assembled to handle pulses having energy levels (for example) from 200 J to 1 kJ in some cases, from 1kJ to kJ in some cases, and yet from 10 kJ to 100 kJ in some cases. Shorter pulse durations may also be possible and other ranges between 200 J and 100 kJ are possible. Smaller energy levels are also possible and higher energy levels are possible depending on the number of resistors used. The particulate resistors described above can be used in circuits operating at low or medium energy, power, and/or voltage levels. For example, a single particulate resistor can be sized to withstand an energy level up to 0.25 J, upto 0.5 J, up to 1 J, up to 2 J, upto SJ, up to 10
J, up to 50 J, up to 100 J, up to 200 J, up to 500 J, up to 1,000 J per pulse, up to 5,000 J per pulse, up to 10,000 J per pulse, up to 50,000 J per pulse, up to 100,000 J per pulse, up to 500,000 J per pulse. Depending on the pulse duration, the peak power level sustained by a particulate resistor 16 designed to withstand the above example energy levels can be a value from 0.25 Watt (0.25 J, 1 LU502264 second pulse duration), to 1,000 megawatts (500,000 J, 0.5 millisecond pulse duration) or greater.
[0058] Under continuous current operating conditions, a maximum power that can be continuously dissipated by a single particulate resistor can depend on the resistor geometry, materials used, and heat sinking of the resistor. À single resistor may be able to sustain continuous power levels of up to up to 0.25 watt, up to 0.5 watt, 1 watt, up to 10 watts, up to 50 watts, or up to 100 watts or greater.
[0059] III. Conclusion
[0060] While various inventive embodiments have been described and illustrated herein, those of ordinary skill in the art will readily envision a variety of other means and/or structures for performing the function and/or obtaining the results and/or one or more of the advantages described herein, and each of such variations and/or modifications is deemed to be within the scope of the inventive embodiments described herein. More generally, those skilled in the art will readily appreciate that all parameters, dimensions, materials, and configurations described herein are meant to be exemplary and that the actual parameters, dimensions, materials, and/or configurations will depend upon the specific application or applications for which the inventive teachings is/are used. Those skilled in the art will recognize or be able to ascertain, using no more than routine experimentation, many equivalents to the specific inventive embodiments described herein. It is, therefore, to be understood that the foregoing embodiments are presented by way of example only and that, within the scope of the appended claims and equivalents thereto, inventive embodiments may be practiced otherwise than as specifically described and claimed. Inventive embodiments of the present disclosure are directed to each individual feature, system, article, material, kit, and/or method described herein. In addition, any combination of two or more such features, systems, articles, materials, kits, and/or methods, if such features, systems, articles, materials, kits, and/or methods are not mutually inconsistent, is included within the inventive scope of the present disclosure.
[0061] Also, various inventive concepts may be embodied as one or more methods, of which an example has been provided. The acts performed as part of the method may be ordered in any suitable way. Accordingly, embodiments may be constructed in which acts are performed in an 17 order different than illustrated, which may include performing some acts simultaneously, even LU502264 though shown as sequential acts in illustrative embodiments.
[0062] All definitions, as defined and used herein, should be understood to control over dictionary definitions, definitions in documents incorporated by reference, and/or ordinary meanings of the defined terms.
[0063] The indefinite articles “a” and “an,” as used herein in the specification and in the claims, unless clearly indicated to the contrary, should be understood to mean “at least one.”
[0064] The phrase “and/or,” as used herein in the specification and in the claims, should be understood to mean “either or both” of the components so conjoined, i.e., components that are conjunctively present in some cases and disjunctively present in other cases. Multiple components listed with “and/or” should be construed in the same fashion, i.e., “one or more” of the components so conjoined. Other components may optionally be present other than the components specifically identified by the “and/or” clause, whether related or unrelated to those components specifically identified. Thus, as a non-limiting example, a reference to “A and/or
B”, when used in conjunction with open-ended language such as “comprising” can refer, in one embodiment, to A only (optionally including components other than B); in another embodiment, to B only (optionally including components other than A); in yet another embodiment, to both A and B (optionally including other components); etc.
[0065] As used herein in the specification and in the claims, “or” should be understood to have the same meaning as “and/or” as defined above. For example, when separating items in a list, “or” or “and/or” shall be interpreted as being inclusive, 1.e., the inclusion of at least one, but also including more than one, of a number or list of components, and, optionally, additional unlisted items. Only terms clearly indicated to the contrary, such as “only one of” or “exactly one of,” or, when used in the claims, “consisting of,” will refer to the inclusion of exactly one component of a number or list of components. In general, the term “or” as used herein shall only be interpreted as indicating exclusive alternatives (7.e., “one or the other but not both”) when preceded by terms of exclusivity, such as “either,” “one of,” “only one of,” or “exactly one of.” “Consisting essentially of,” when used in the claims, shall have its ordinary meaning as used in the field of patent law. 18
[0066] As used herein in the specification and in the claims, the phrase “at least one,” in LU502264 reference to a list of one or more components, should be understood to mean at least one component selected from any one or more of the components in the list of components, but not necessarily including at least one of each and every component specifically listed within the list of components and not excluding any combinations of components in the list of components.
This definition also allows that components may optionally be present other than the components specifically identified within the list of components to which the phrase “at least one” refers, whether related or unrelated to those components specifically identified. Thus, as a non-limiting example, “at least one of À and B” (or, equivalently, “at least one of A or B,” or, equivalently “at least one of A and/or B”) can refer, in one embodiment, to at least one, optionally including more than one, À, with no B present (and optionally including components other than B); in another embodiment, to at least one, optionally including more than one, B, with no À present (and optionally including components other than A); in yet another embodiment, to at least one, optionally including more than one, A, and at least one, optionally including more than one, B (and optionally including other components); etc.
[0067] In the claims, as well as in the specification above, all transitional phrases such as “comprising,” “including,” “carrying,” “having,” “containing,” “involving,” “holding,” “composed of,” and the like are to be understood to be open-ended, 1.e., to mean including but not limited to. Only the transitional phrases “consisting of” and “consisting essentially of” shall be closed or semi-closed transitional phrases, respectively, as set forth in the United States Patent
Office Manual of Patent Examining Procedures, Section 2111.03. 19
Claims (30)
1. A resistor comprising: a resistive body comprising unbound particulate material; and an assembly to support the resistive body and provide electrical connection to the resistive body.
2. The resistor of claim 1, wherein the unbound particulate material comprises: an insulative particulate material; and a conductive particulate material dispersed throughout the insulative particulate material.
3. The resistor of claim 2, wherein the insulative particulate material comprises sand.
4. The resistor of claim 2, wherein the insulative particulate material comprises silica, silicon nitride, alumina, boron nitride, or some combination thereof.
5. The resistor of claim 2, wherein the conductive particulate material comprises carbon.
6. The resistor of claim 2, wherein the conductive particulate material comprises aluminum powder, metal particles, graphite, a conductive salt, or some combination thereof.
7. The resistor of claim 1, wherein the resistive body does not contain a liquid.
8. The resistor of claim 1, further comprising an insulative oil permeating the unbound particulate material.
9. The resistor of claim 1 having a resistance of not more than 1 milliohm.
10. The resistor of claim 1, wherein the assembly comprises: a container to contain the unbound particulate material, a first contact to electrically contact the unbound particulate material at a first location with respect to the container; and a second contact to electrically contact the unbound particulate material at a second location with respect to the container.
11. The resistor of claim 10, further comprising: LU502264 a surface treatment applied to a surface of the first contact to physically contact the unbound particulate material.
12. The resistor of claim 11, wherein the surface treatment comprises a roughening of the surface.
13. The resistor of claim 11, wherein the surface treatment comprises a metal coating applied to the surface.
14. The resistor of claim 11, wherein the surface treatment comprises a conductive paste applied to the surface.
15. The resistor of claim 10, further comprising: a clamp to press the first contact and the second contact against the unbound particulate material.
16. The resistor of claim 15, wherein a pressure applied by the clamp to the first contact and the second contact is configured to be adjusted by a user of the resistor.
17. The resistor of claim 15, wherein a pressure applied by the clamp to the first contact and the second contact is configured to be adjusted by an automated or semi-automated actuator.
18. The resistor of claim 10, further comprising: a first yoke coupled to the first contact; a second yoke coupled to the second contact; an insulator between the first yoke and the first contact to electrically isolate at least the first yoke from the first contact; and two or more bolts with two or more nuts connecting the first yoke and the second yoke, wherein tightening of the two or more nuts increases a force applied by the first yoke and the second yoke to the first contact and the second contact.
19. The resistor of claim 18, further comprising: a pressure indicator assembly coupled between the first yoke and the first contact or between the second yoke and the second contact. 21
20. The resistor of claim 19, wherein the pressure indicator assembly comprises: LU502264 a pressure bolt passing through the first yoke or the second yoke; one or more spring washers on the pressure bolt and located between the first yoke and the second yoke; an indicator washer on the pressure bolt and located on an opposite side of the first yoke or the second yoke than the one or more spring washers; and a pressure nut to tighten the indicator washer against the first yoke or the second yoke.
21. The resistor of claim 18, further comprising: a flange coupled to the first contact or the second contact, the flange having one or more holes for making an electrical connection to the resistor and/or for mounting the resistor.
22. The resistor of claim 1, in combination with a circuit that includes the resistor.
23. The resistor and circuit of claim 22, wherein the circuit is included in a power generation system.
24. A method of making a resistor having a resistive body of unbound particulate material, the method comprising: filling a container of a resistor assembly with the unbound particulate material to form the resistive body, wherein the resistor assembly is configured to connect to an electrical circuit; arranging a first contact to contact the unbound particulate material at a first location with respect to the container; arranging a second contact to contact the unbound particulate material at a second location with respect to the container; and increasing an amount of pressure applied by the first contact and the second contact to the unbound particulate material to obtain a selected resistance value.
25. The method of 24, wherein the amount of pressure is increased until a resistance measured between the first contact and the second contact reaches the selected resistance value.
26. The method of 24, wherein filling the container comprises: filling a first portion of the container with a first portion of the unbound particulate material; 22 applying pressure to the unbound particulate material to pack the first portion of the LU502264 unbound particulate material into the container; filling a second portion of the container with a second portion of the unbound particulate material; and applying pressure to the unbound particulate material to pack the second portion of the unbound particulate material into the container.
27. The method of 24, wherein increasing the amount of pressure comprises: monitoring a pressure indicator to detect when a target amount of pressure 1s applied to the unbound particulate material; and stop increasing the amount of pressure when the pressure indicator indicates that the target amount of pressure is applied.
28. The method of 27, wherein the pressure indicator is an indicator washer.
29. The method of 24, further comprising installing the resistor in a circuit.
30. A method of making an electrical circuit for a high-energy application, the method comprising: adding a high-energy power source to the electrical circuit; adding a load for the high-energy power source to the electrical circuit; and adding a particulate resistor the electrical circuit. 23
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LU502264A LU502264B1 (en) | 2022-06-14 | 2022-06-14 | High-Energy Particulate Resistors |
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LU502264A LU502264B1 (en) | 2022-06-14 | 2022-06-14 | High-Energy Particulate Resistors |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989004953A1 (en) * | 1987-11-20 | 1989-06-01 | Labino Patent Ab | A pressure responsive potentiometer |
DE4228297A1 (en) * | 1992-08-26 | 1994-03-03 | Siemens Ag | Changeable high current resistor, especially for use as a protective element in power switching technology, and switching using the high current resistor |
WO1995034081A1 (en) * | 1994-06-08 | 1995-12-14 | Raychem Corporation | Electrical devices containing conductive polymers |
WO1998049694A2 (en) * | 1997-04-14 | 1998-11-05 | Abb Ab | Variable electric resistor |
DE102017217265A1 (en) * | 2017-09-28 | 2019-03-28 | Robert Bosch Gmbh | Spark plug resistance element with finer non-conductive particles |
US20190341176A1 (en) * | 2018-05-07 | 2019-11-07 | Seiko Epson Corporation | Pressure-sensitive device, hand, and robot |
-
2022
- 2022-06-14 LU LU502264A patent/LU502264B1/en active IP Right Grant
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989004953A1 (en) * | 1987-11-20 | 1989-06-01 | Labino Patent Ab | A pressure responsive potentiometer |
DE4228297A1 (en) * | 1992-08-26 | 1994-03-03 | Siemens Ag | Changeable high current resistor, especially for use as a protective element in power switching technology, and switching using the high current resistor |
WO1995034081A1 (en) * | 1994-06-08 | 1995-12-14 | Raychem Corporation | Electrical devices containing conductive polymers |
WO1998049694A2 (en) * | 1997-04-14 | 1998-11-05 | Abb Ab | Variable electric resistor |
DE102017217265A1 (en) * | 2017-09-28 | 2019-03-28 | Robert Bosch Gmbh | Spark plug resistance element with finer non-conductive particles |
US20190341176A1 (en) * | 2018-05-07 | 2019-11-07 | Seiko Epson Corporation | Pressure-sensitive device, hand, and robot |
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