LU48050A1 - - Google Patents
Info
- Publication number
- LU48050A1 LU48050A1 LU48050A LU48050A LU48050A1 LU 48050 A1 LU48050 A1 LU 48050A1 LU 48050 A LU48050 A LU 48050A LU 48050 A LU48050 A LU 48050A LU 48050 A1 LU48050 A1 LU 48050A1
- Authority
- LU
- Luxembourg
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| BE646014A BE646014A (US08080257-20111220-C00005.png) | 1964-04-01 | 1964-04-01 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| LU48050A1 true LU48050A1 (US08080257-20111220-C00005.png) | 1965-04-23 |
Family
ID=3846261
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| LU48050A LU48050A1 (US08080257-20111220-C00005.png) | 1964-04-01 | 1965-02-23 |
Country Status (6)
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4008683A (en) * | 1973-07-16 | 1977-02-22 | Varian Associates | Machine for treating wafer-form items |
| US4033904A (en) * | 1974-03-22 | 1977-07-05 | Varian Associates, Inc. | Interchangeable specimen trays and apparatus for a vacuum type testing system |
| DK135257B (da) * | 1975-07-09 | 1977-03-21 | Danfysik As | Apparat til ion-implantation i emner, især skiver af halvledermateriale. |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3073951A (en) * | 1960-07-28 | 1963-01-15 | Combustion Eng | Vacuum lock |
| US3099743A (en) * | 1961-07-07 | 1963-07-30 | Ichinokawa Takeo | Combined electron probe microanalyzer and x-ray diffraction instrument |
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1964
- 1964-04-01 BE BE646014A patent/BE646014A/xx unknown
-
1965
- 1965-02-23 LU LU48050A patent/LU48050A1/xx unknown
- 1965-03-23 DE DEC12880U patent/DE1960083U/de not_active Expired
- 1965-03-30 US US443822A patent/US3400265A/en not_active Expired - Lifetime
- 1965-04-01 SE SE4236/65A patent/SE306436B/xx unknown
- 1965-04-01 NL NL6504158A patent/NL6504158A/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| US3400265A (en) | 1968-09-03 |
| SE306436B (US08080257-20111220-C00005.png) | 1968-11-25 |
| DE1960083U (de) | 1967-05-11 |
| NL6504158A (US08080257-20111220-C00005.png) | 1965-10-04 |
| BE646014A (US08080257-20111220-C00005.png) | 1964-10-01 |
