LU33188A1 - Process for non-contact thickness measurement of strip-shaped, preferably hot-rolled, material by means of hard electromagnetic radiation - Google Patents
Process for non-contact thickness measurement of strip-shaped, preferably hot-rolled, material by means of hard electromagnetic radiationInfo
- Publication number
- LU33188A1 LU33188A1 LU33188DA LU33188A1 LU 33188 A1 LU33188 A1 LU 33188A1 LU 33188D A LU33188D A LU 33188DA LU 33188 A1 LU33188 A1 LU 33188A1
- Authority
- LU
- Luxembourg
- Prior art keywords
- rolled
- strip
- shaped
- electromagnetic radiation
- thickness measurement
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
- G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
Landscapes
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Toxicology (AREA)
- Electromagnetism (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEE8111A DE925197C (en) | 1953-11-11 | 1953-11-11 | Method for the non-contact thickness measurement of strip-shaped, preferably hot-rolled material by means of hard electromagnetic radiation |
Publications (1)
Publication Number | Publication Date |
---|---|
LU33188A1 true LU33188A1 (en) | 1954-12-30 |
Family
ID=7067318
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
LU33188D LU33188A1 (en) | 1953-11-11 | 1954-10-30 | Process for non-contact thickness measurement of strip-shaped, preferably hot-rolled, material by means of hard electromagnetic radiation |
Country Status (5)
Country | Link |
---|---|
CH (1) | CH327329A (en) |
DE (1) | DE925197C (en) |
FR (1) | FR1112614A (en) |
GB (1) | GB763667A (en) |
LU (1) | LU33188A1 (en) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1225396B (en) * | 1957-01-28 | 1966-09-22 | Dunlop Rubber Co | Device for continuous, non-contact surface weight determination of a strip |
US3019338A (en) * | 1957-08-28 | 1962-01-30 | Well Surveys Inc | Thickness detector for coal mining machine |
US3322962A (en) * | 1963-10-01 | 1967-05-30 | Kalle Ag | Method and apparatus for continuously measuring applied coatings employing photoelectric means |
FI62420C (en) * | 1981-05-29 | 1982-12-10 | Enso Gutzeit Oy | FOERFARANDE FOER ATT MAETA BELAEGGNINGSMAENGD |
GB9105639D0 (en) * | 1991-03-18 | 1991-05-01 | Data Measurement Corp | Dynamic alloy correction gauge |
-
1953
- 1953-11-11 DE DEE8111A patent/DE925197C/en not_active Expired
-
1954
- 1954-10-30 LU LU33188D patent/LU33188A1/en unknown
- 1954-11-02 GB GB31687/54A patent/GB763667A/en not_active Expired
- 1954-11-08 CH CH327329D patent/CH327329A/en unknown
- 1954-11-10 FR FR1112614D patent/FR1112614A/en not_active Expired
Also Published As
Publication number | Publication date |
---|---|
CH327329A (en) | 1958-03-15 |
GB763667A (en) | 1956-12-12 |
FR1112614A (en) | 1956-03-16 |
DE925197C (en) | 1955-03-14 |
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