KR980003658A - Tomographic Ultrasonic Microscope System - Google Patents

Tomographic Ultrasonic Microscope System Download PDF

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Publication number
KR980003658A
KR980003658A KR1019960021336A KR19960021336A KR980003658A KR 980003658 A KR980003658 A KR 980003658A KR 1019960021336 A KR1019960021336 A KR 1019960021336A KR 19960021336 A KR19960021336 A KR 19960021336A KR 980003658 A KR980003658 A KR 980003658A
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KR
South Korea
Prior art keywords
waves
resolution
ultrasonic
shear
present
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Application number
KR1019960021336A
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Korean (ko)
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KR100201787B1 (en
Inventor
고대식
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고대식
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Priority to KR1019960021336A priority Critical patent/KR100201787B1/en
Publication of KR980003658A publication Critical patent/KR980003658A/en
Application granted granted Critical
Publication of KR100201787B1 publication Critical patent/KR100201787B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details

Abstract

본 발명은 초음파 영상시스템의 하나인 토모그라픽 초음파현미경 시스템의 분해능을 개선시키기 위하여 횡파를 이용하는 방법을 제공함에 그 목적이 있다. 종래의 시스템은 종파만을 이용하도록 초음파의 입사각도를 10도로 고정시켰었기 때문에 분해능을 개선시키려면 동작주파수를 높이는 수밖에 없었다.An object of the present invention is to provide a method of using transverse waves to improve the resolution of a tomographic ultrasonic microscope system, which is one of the ultrasonic imaging systems. In the conventional system, the incidence angle of the ultrasonic waves is fixed to 10 degrees so that only the longitudinal wave is used. Therefore, the operation frequency has to be increased to improve the resolution.

본 발명에서는 동일한 동작주파수를 이용하면서 분해능을 2배 정도 개선시킬 수 있는 횡파를 이용한 방법을 제공하였다. 상기 목적을 달성하기 위하여 고체 내부에 횡파를 발생시키는 방법과 횡파를 검출하는 방법을 제시하였다. 횡파의 발생을 위하여 초음파의 입사각도를 변화시킬 수 있는 융통성이 있는 초음파변환기 장치를 설계하였으며 초음파의 모드변환 현상을 이용하여 횡파를 검출하는 방법을 해석하였다.The present invention provides a method using a transverse wave that can improve the resolution by about 2 times while using the same operating frequency. In order to achieve the above object, a method of generating shear waves in a solid interior and a method of detecting shear waves have been proposed. For the generation of shear waves, a flexible ultrasonic transducer that can change the angle of incidence of the ultrasonic waves is designed and the method of detecting the shear waves using the mode conversion phenomenon of ultrasonic waves is analyzed.

본 발명의 성능을 평가하기 위한 실험결과에서 횡파시스템의 토모그램 영상이 종래의 종파 시스템의 토모그램 영상보다 분해능과 코트라스트가 매우 개선됨을 확인하였다.In the experimental results for evaluating the performance of the present invention, it was confirmed that the tomogram image of the shear wave system is significantly improved in resolution and coat last than the tomogram image of the conventional longitudinal wave system.

Description

횡파를 이용한 토모그라픽 초음파현미경 시스템Tomographic Ultrasonic Microscope System

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 토모그라픽 초음파현미경 시스템의 구조를 나타내는 블럭선도.1 is a block diagram showing the structure of a tomographic ultrasonic microscope system.

Claims (1)

토모그라픽 초음파현미경 시스템에서 횡파를 이용할 수 있다는 것과 이를 위해 필요한 횡파의 발생 및 검출 방법, 그리고 본 발명 기술을 SLAM이나 초음파현미경 시스템에 그대로 적용하는 것. 즉 종래의 SLAM이나 초음파현미경 시스템은 종파만을 이용하였으나 본 발명의 횡파 기술을 이들 시스템에 그대로 적용시키면 약 2배의 분해능 개선시킬 수 있다.The use of shear waves in a tomographic ultrasonic microscope system, the method of generating and detecting the shear waves required for this, and the application of the present invention to a SLAM or an ultrasonic microscope system. That is, the conventional SLAM or ultrasonic microscope system uses only longitudinal waves, but if the transverse wave technology of the present invention is applied to these systems as it is, the resolution can be improved by about 2 times. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019960021336A 1996-06-07 1996-06-07 Tomograpic ultrasonic microscope system using transverse wave KR100201787B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019960021336A KR100201787B1 (en) 1996-06-07 1996-06-07 Tomograpic ultrasonic microscope system using transverse wave

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019960021336A KR100201787B1 (en) 1996-06-07 1996-06-07 Tomograpic ultrasonic microscope system using transverse wave

Publications (2)

Publication Number Publication Date
KR980003658A true KR980003658A (en) 1998-03-30
KR100201787B1 KR100201787B1 (en) 1999-06-15

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Application Number Title Priority Date Filing Date
KR1019960021336A KR100201787B1 (en) 1996-06-07 1996-06-07 Tomograpic ultrasonic microscope system using transverse wave

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KR (1) KR100201787B1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100774939B1 (en) * 2000-05-23 2007-11-08 후지필름 가부시키가이샤 Dynamic change detecting method, dynamic change detecting apparatus and ultrasonic diagnostic apparatus
KR100795448B1 (en) * 2002-04-17 2008-01-16 펜탁스 가부시키가이샤 Optical device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101237856B1 (en) 2010-11-05 2013-02-28 한국표준과학연구원 Optical nanoscope apparatus and system thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100774939B1 (en) * 2000-05-23 2007-11-08 후지필름 가부시키가이샤 Dynamic change detecting method, dynamic change detecting apparatus and ultrasonic diagnostic apparatus
KR100795448B1 (en) * 2002-04-17 2008-01-16 펜탁스 가부시키가이샤 Optical device

Also Published As

Publication number Publication date
KR100201787B1 (en) 1999-06-15

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