KR970054282A - Structure and Manufacturing Method of Solid State Imaging Device - Google Patents

Structure and Manufacturing Method of Solid State Imaging Device Download PDF

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Publication number
KR970054282A
KR970054282A KR1019950048239A KR19950048239A KR970054282A KR 970054282 A KR970054282 A KR 970054282A KR 1019950048239 A KR1019950048239 A KR 1019950048239A KR 19950048239 A KR19950048239 A KR 19950048239A KR 970054282 A KR970054282 A KR 970054282A
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South Korea
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poly
layer
photoelectric conversion
region
forming
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KR1019950048239A
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Korean (ko)
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KR0186184B1 (en
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박철호
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문정환
Lg 반도체 주식회사
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/148Charge coupled imagers
    • H01L27/14806Structural or functional details thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/762Charge transfer devices
    • H01L29/765Charge-coupled devices
    • H01L29/768Charge-coupled devices with field effect produced by an insulated gate
    • H01L29/76833Buried channel CCD

Abstract

본 발명은 고체촬상소자에 관한 것으로, 제1도전형 반도체 기판과, 상기 제1도전형 반도체 기판에 형성된 제2도전형 웰과, 상기 제2도전형 웰 영역에 복수개 배열되는 광전변환 영역과, 상기 광전변환영역 사이에 일방향으로 복수개 배열되는 전하전송 영역과, 상기 광전변환 영역을 제외한 전하전송 영역의 상측에 서로 절연되고 일부분이 겹쳐서 전하전송 영역과 동일 방향으로 배열되는 복수개의 제1,2폴리 게이트와, 상기 제1,2폴리 게이트 상측에 서로 절연되어 서로 다른 클럭신호를 각각의 제1,2폴리 게이트에 반복적으로 인가하는 복수의 폴리 클럭킹 라인과, 상기 광전변환 영역을 제외한 전하전송영역 상측에 제1,2폴리 게이트와 폴리 클럭킹 라인을 감싸고 형성되는 금속 차광층과, 상기 금속 차광층이 형성된 반도체 기판의 전면에 형성되는 표면 안정화를 위한 나이트 라이드층과, 상기 나이트 라이드층상에 형성되는 제1편탄층, 상기 제1평탄층상에 각각의 광전변환 영역에 대응하여 형성되어 특정 파장의 빛만을 선택적으로 투과시키는 칼라필터층과, 상기 칼라 필터층상에 형성되는 제2평탄층, 상기 제2평탄층상에 각각의 광전변환 영역에 대응하여 형성되어 빛을 접속하는 마이크로 렌즈로 이루어져, 소자의 특성을 향상시키고 금속차광층 이후의 후공정을 보다 용이하게 실시할 수 있다.The present invention relates to a solid state imaging device, comprising a first conductive semiconductor substrate, a second conductive well formed on the first conductive semiconductor substrate, a photoelectric conversion region arranged in plural in the second conductive well region, A plurality of charge transfer regions arranged in one direction between the photoelectric conversion regions, and a plurality of first and second polys insulated from one another and partially overlapping each other on the upper side of the charge transfer region except for the photoelectric conversion regions, A plurality of poly clocking lines insulated from each other on the gate and the upper side of the first and second poly gates to repeatedly apply different clock signals to the first and second poly gates, and an upper side of the charge transfer region except for the photoelectric conversion region. A metal light blocking layer formed around the first and second poly gates and the poly clocking line, and a surface formed on the front surface of the semiconductor substrate on which the metal light blocking layer is formed. A nitride layer for stabilization, a first kneading layer formed on the nitride layer, a color filter layer formed on the first planar layer corresponding to each photoelectric conversion region, and selectively transmitting only light having a specific wavelength; A second flat layer formed on the color filter layer and a micro lens formed on the second flat layer corresponding to each photoelectric conversion region to connect light, thereby improving the characteristics of the device and performing post-processing after the metal light shielding layer. It can be implemented more easily.

Description

고체촬상소자의 구조 및 제조방법Structure and Manufacturing Method of Solid State Imaging Device

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제3도는 본 발명에 고체촬상소자이 레이아웃도,3 is a layout view of the solid state image pickup device according to the present invention;

제4도 (a)는 제3도의 C-C′선에 따른 구조단면도, (b)는 제3도의 D-D′선에 따른 구조단면도.4 is a structural cross-sectional view taken along the line C-C 'of FIG. 3, and (b) is a structural cross-sectional view taken along the line D-D' of FIG.

Claims (6)

제1도전형 반도체 기판과, 상기 제1도전형 반도체 기판에 형성딘 제2도전형 웰과, 상기 제2도전형 웰 영역에 복수개 배열되는 광전변환 영역과, 상기 광전변환영역 사이에 일방향으로 복수개 배열되는 전하전송 영역과, 상기 광전변환 영역을 제외한 전하전송 영역의 상측에 서로 절연되고 일부분이 겹쳐서 전하전송 영역과 동일방향으로 배열되는 복수개의 제1,2폴리 게이트와, 상기 제1,2폴리 게이트 상측에 서로 절연되어 서로 다른 클럭신호를 각각의 제1,2폴리 게이트에 반복적으로 인가하는 복수의 폴리 클럭킹 라인과, 상기 광전변환 영역을 제외한 전하전송영역 상측에 제1,2폴리 게이트와 폴리 클럭킹 라인을 감싸고 형성되는 금속 차광층과, 상기 금속 차광층이 형성된 반도체 기판의 전면에 형성되는 표면 안정화를 위한 나이트 라이드층과, 상기 나이트 라이드층상에 형성되는 제1평탄층, 상기 제1평탄층상에 각각의 광전변환 영역에 대응하여 형성되어 특정파장의 빛만을 선택적으로 투과시키는 칼라필터층과, 상기 칼라 필터층상에 형성되는 제2평탄층, 상기 제2평탄층상에 각각의 광전변환 영역에 대응하여 형성되어 빛을 접속하는 마이크로 렌즈를 포함하여 구성됨을 특징으로 하는 고체촬상소자의 구조.A plurality of first conductive semiconductor substrates, a second conductive well formed on the first conductive semiconductor substrate, a plurality of photoelectric conversion regions arranged in the second conductive well region, and a plurality of photoelectric conversion regions in one direction A plurality of first and second poly gates arranged in the same direction as the charge transfer region, the charge transfer region being arranged and insulated from each other and partially overlapping each other on the upper side of the charge transfer region except for the photoelectric conversion region; A plurality of poly clocking lines insulated from each other on the gate and repeatedly applying different clock signals to each of the first and second poly gates, and first and second poly gates and poly on the charge transfer region except the photoelectric conversion region. A metal light shielding layer formed around the clocking line, a nitride layer for surface stabilization formed on a front surface of the semiconductor substrate on which the metal light shielding layer is formed, and A first flat layer formed on the nitride layer, a color filter layer formed on the first flat layer corresponding to each photoelectric conversion region to selectively transmit only light having a specific wavelength, and a second flat layer formed on the color filter layer And a microlens formed on the second planar layer corresponding to each photoelectric conversion region to connect light. 제1항에 있어서, 각각의 광전변환 영역을 서로 격리시키기 위한 채널 스톱층이 구성되는 것을 특징으로 하는 고체촬상소자의 구조.The structure of a solid state image pickup device according to claim 1, wherein a channel stop layer is provided for isolating each photoelectric conversion region from each other. 제1항에 있어서, 제1,2폴리 게이트 상측에는 폴리 클럭킹 라인과의 절연을 위한 절연막이 구성됨을 특징으로 하는 고체촬상소자의 구조.The structure of a solid state image pickup device according to claim 1, wherein an insulating film for insulating the poly clocking line is formed above the first and second poly gates. 제1항 또는 제3항에 있어서, 폴리 클럭킹 라인은 하측의 절연막에 제1,2폴리 게이트에 대응되어 형성되어진 콘택홀을 통하여 각각의 제1,2폴리 게이트에 반복적으로 접속되는 것을 특징으로 하는 고체촬상소자의 구조.The poly clocking line of claim 1 or 3, wherein the poly clocking line is repeatedly connected to each of the first and second poly gates through a contact hole formed in the lower insulating layer to correspond to the first and second poly gates. Structure of Solid State Imaging Device. 제1항에 있어서, 폴리 클럭킹 라인은 분리 구성되는 4개의 라인에 각각 V 1, V 2, V 3, V 4의 클럭신호가 인가되는 것을 특징으로 하는 고체촬상소자의 구조.2. The poly clocking lines of claim 1, wherein each of the poly clocking lines is V on four separate lines. 1 , V 2 , V 3 , V A structure of a solid state image pickup device, characterized in that four clock signals are applied. 제1도전형의 반도체 기판에 제2도전형 웰을 형성하는 공정과, 상기 제2도전형 웰 영역에 화소와 화소영역을 구분하기 위한 채널 스톱층을 형성하는 공정과, 상기 채널 스톱층에 수직한 일방향으로 베리드 이온주입으로 전하전송 영역을 형성하는 공정과, 전면에 게이트 절연막을 형성하고, 게이트 절연막상에 폴리 실리콘을 증착하고 전하 전송 영역의 특정 영역상에만 남도록 패터닝하여 제1폴리 게이트를 형성하는 공정과, 상기 제1폴리 게이트 상측에 층간 산화층을 형성하고, 폴리 실리콘을 증착하여 전하전송 영역의 제1폴리 게이트가 형성되지 않은 영역상에만 남도록 패터닝하여 제2폴리 게이트를 형성하는 공정과, 상기 제1,2폴리 게이트상에 층간산화층을 형성하고 제1,2폴리 게이트에 대응하여 콘택홀을 형성한 후 폴리 실리콘을 증착하고 패터닝하여 서로 격리되는 복수개의 폴리 클럭킹 라인을 형성하는 공정과, 이온주입 공정으로 전하전송 영역의 사이의 복수개의 광전변환 영역을 형성하고, 전면에 산화막을 증착한 후에 전하전송 영역상에만 금속 차광층을 형성하는 공정과, 전면에 표면 안정화를 위한 나이트 라이드를 증착하고 제1평탄층을 형성하는 공정과; 상기 제1평탄층상에 칼라 필터층, 제2평탄층, 마이크로 렌즈를 차례대로 형성하는 공정을 포함하여 구성됨을 특징으로 하는 고체촬상소자의 제조방법.Forming a second conductive well in a first conductive semiconductor substrate, forming a channel stop layer in the second conductive well region to separate pixels from the pixel region, and perpendicular to the channel stop layer Forming a charge transfer region by buried ion implantation in one direction, forming a gate insulating film on the front surface, depositing polysilicon on the gate insulating film, and patterning the first poly gate to remain only on a specific region of the charge transfer region. Forming a second poly gate by forming an interlayer oxide layer on the first poly gate and depositing polysilicon so as to remain on only the region where the first poly gate of the charge transfer region is not formed; Forming an interlayer oxide layer on the first and second poly gates, forming a contact hole corresponding to the first and second poly gates, and depositing polysilicon Forming a plurality of poly clocking lines isolated from each other, and forming a plurality of photoelectric conversion regions between the charge transfer regions by an ion implantation process, depositing an oxide film on the entire surface, and then forming a metal light shielding layer only on the charge transfer regions. Forming and depositing nitride on the entire surface for stabilizing the surface and forming a first flat layer; And forming a color filter layer, a second flat layer, and a micro lens in order on the first flat layer. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950048239A 1995-12-11 1995-12-11 Structure of solid state imaging device and its manufacture KR0186184B1 (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100720483B1 (en) * 2005-12-09 2007-05-22 동부일렉트로닉스 주식회사 Vertical color filter detector group and method for manufacturing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100720483B1 (en) * 2005-12-09 2007-05-22 동부일렉트로닉스 주식회사 Vertical color filter detector group and method for manufacturing the same

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