KR970051602A - Relay test device - Google Patents
Relay test device Download PDFInfo
- Publication number
- KR970051602A KR970051602A KR1019950049482A KR19950049482A KR970051602A KR 970051602 A KR970051602 A KR 970051602A KR 1019950049482 A KR1019950049482 A KR 1019950049482A KR 19950049482 A KR19950049482 A KR 19950049482A KR 970051602 A KR970051602 A KR 970051602A
- Authority
- KR
- South Korea
- Prior art keywords
- test
- relay
- pattern
- change
- mode
- Prior art date
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
본 발명은 릴레이 테스트장치에 관한 것으로, 차량의 엔진후드실에 설치되는 릴레이에 대해 온도의 변화에 대한 특성의 변화를 테스트하기 위해 테스트릴에이(70)에 대한 테스트모드와 테스트패턴모드 및 테스트시간의 산정을 설정하는 조작패널(10)과, 그 조작패널(10)에 의해 설정되는 모드의 테스트패턴을 발생하는 테스트패턴발생기(30), 상기 테스트패턴을 기초로 타이머(40)에서 카운트되는 사이클주기에 걸쳐 상기 테스트릴레이(70)에 대한 테스트시퀀스를 제어함과 더불어 테스트시간을 산정하는 테스트제어부(20), 그 테스트제어부(20)의 제어하에 상기 테스트릴레이(70)의 테스트를 실행하는 테스트릴레이구동부(60)를 구비하여 구성되고, 상기 테스트패턴발생기(30)에서 발생되는 테스트패턴은 시간변화에 대한 온도의 변화패턴으로 형성되어, 테스트릴레이(70)에 대해 온도변화패턴을 적용하여 특성의 변화에 대한 테스트를 실행하도록 된 것이다.The present invention relates to a relay test apparatus, and a test mode, a test pattern mode, and a test time for a test relay 70 to test a change in a characteristic of a temperature change with respect to a relay installed in an engine hood chamber of a vehicle. The operation panel 10 for setting the calculation of the < RTI ID = 0.0 > and < / RTI > A test that controls the test sequence for the test relay 70 and calculates a test time over a period, and performs a test of the test relay 70 under the control of the test control unit 20. It is configured to include a relay driver 60, the test pattern generated by the test pattern generator 30 is formed as a change pattern of the temperature with respect to the time change, the test By applying a temperature change pattern for the relay 70 it is adapted to run the test for a change in the characteristic.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제1도는 본 발명의 바람직한 실시예에 따른 릴레이 테스트장치의 기눙블럭수성을 나타낸 도면,1 is a view showing the conventional block number of the relay test apparatus according to a preferred embodiment of the present invention,
제2도는 제1도에 도시된 테스트패턴발생기에서 발생되는 테스트패턴의 일예를 설명하는 도면이다.2 is a view for explaining an example of a test pattern generated in the test pattern generator shown in FIG.
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950049482A KR970051602A (en) | 1995-12-14 | 1995-12-14 | Relay test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019950049482A KR970051602A (en) | 1995-12-14 | 1995-12-14 | Relay test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR970051602A true KR970051602A (en) | 1997-07-29 |
Family
ID=66594811
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019950049482A KR970051602A (en) | 1995-12-14 | 1995-12-14 | Relay test device |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR970051602A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100386846B1 (en) * | 2001-07-04 | 2003-06-09 | 엘지산전 주식회사 | Method for high speed test of electronic time switch |
-
1995
- 1995-12-14 KR KR1019950049482A patent/KR970051602A/en not_active Application Discontinuation
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100386846B1 (en) * | 2001-07-04 | 2003-06-09 | 엘지산전 주식회사 | Method for high speed test of electronic time switch |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| E902 | Notification of reason for refusal | ||
| E601 | Decision to refuse application |