KR970044968U - 3차원 측정용 지그 - Google Patents

3차원 측정용 지그

Info

Publication number
KR970044968U
KR970044968U KR2019950047052U KR19950047052U KR970044968U KR 970044968 U KR970044968 U KR 970044968U KR 2019950047052 U KR2019950047052 U KR 2019950047052U KR 19950047052 U KR19950047052 U KR 19950047052U KR 970044968 U KR970044968 U KR 970044968U
Authority
KR
South Korea
Prior art keywords
jig
measurement
Prior art date
Application number
KR2019950047052U
Other languages
English (en)
Other versions
KR0140177Y1 (ko
Inventor
심재형
Original Assignee
대우자동차주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 대우자동차주식회사 filed Critical 대우자동차주식회사
Priority to KR2019950047052U priority Critical patent/KR0140177Y1/ko
Publication of KR970044968U publication Critical patent/KR970044968U/ko
Application granted granted Critical
Publication of KR0140177Y1 publication Critical patent/KR0140177Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20—Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
KR2019950047052U 1995-12-26 1995-12-26 3차원 측정용 지그 KR0140177Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950047052U KR0140177Y1 (ko) 1995-12-26 1995-12-26 3차원 측정용 지그

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950047052U KR0140177Y1 (ko) 1995-12-26 1995-12-26 3차원 측정용 지그

Publications (2)

Publication Number Publication Date
KR970044968U true KR970044968U (ko) 1997-07-31
KR0140177Y1 KR0140177Y1 (ko) 1999-05-15

Family

ID=19438030

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950047052U KR0140177Y1 (ko) 1995-12-26 1995-12-26 3차원 측정용 지그

Country Status (1)

Country Link
KR (1) KR0140177Y1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100365477B1 (ko) * 2000-05-18 2002-12-26 메카텍스 (주) 반도체 디바이스 검사용 테스트 보드

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100365477B1 (ko) * 2000-05-18 2002-12-26 메카텍스 (주) 반도체 디바이스 검사용 테스트 보드

Also Published As

Publication number Publication date
KR0140177Y1 (ko) 1999-05-15

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
REGI Registration of establishment
LAPS Lapse due to unpaid annual fee