KR970024622A - Frequency Sampling Method - Google Patents

Frequency Sampling Method Download PDF

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Publication number
KR970024622A
KR970024622A KR1019950039109A KR19950039109A KR970024622A KR 970024622 A KR970024622 A KR 970024622A KR 1019950039109 A KR1019950039109 A KR 1019950039109A KR 19950039109 A KR19950039109 A KR 19950039109A KR 970024622 A KR970024622 A KR 970024622A
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KR
South Korea
Prior art keywords
sampling frequency
value
frequency
new
level
Prior art date
Application number
KR1019950039109A
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Korean (ko)
Inventor
김철홀
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019950039109A priority Critical patent/KR970024622A/en
Publication of KR970024622A publication Critical patent/KR970024622A/en

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  • Measuring Frequencies, Analyzing Spectra (AREA)

Abstract

본 발명은 주파수샘플링방법에 관한 것으로서, 기준 샘풀링주파수 및 그 레벨값이 설정된 상태에서 주파수가 증가한 아날로그파형의 새로운 샘플링주파수와 그 레벨값을 간단한 르로그램만으로 용이하게 검출할 수 있도록 하기 위하여, 기준 샘플링주파수와 레벨값을 갖는 아날로그파형의 주파수샘플링방법에 있어서 : 임의의 파형에 대한 샘플링주파수의 갯수에 따라 기준 샘플링주파수의 값을 이용하여 새로운 샘플링주파수값을 검출하고 ; 상기 검출된 새로운 샘플링주파수값에 따라 아래의 식을 이용하여 새로운 샘플링주파수 레벨을 검출하도록 하였다(제2도).BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a frequency sampling method. In order to easily detect a new sampling frequency and its level value of an analog waveform having an increased frequency in a state where a reference sampling frequency and its level value are set, A frequency sampling method of an analog waveform having a sampling frequency and a level value, the method comprising: detecting a new sampling frequency value using a value of a reference sampling frequency according to the number of sampling frequencies for an arbitrary waveform; According to the detected new sampling frequency value, a new sampling frequency level is detected using the following equation (FIG. 2).

단, 여기서 XN은 새로운 샘플링주파수값이고,Where X N is the new sampling frequency value,

XN-1은 XN이전의 기준 샘플링주파수값이며,X N-1 is the reference sampling frequency value before X N ,

XN+1은 XN이후의 기준 샘플링주파수값이고,X N + 1 is the reference sampling frequency value after X N ,

YN은 새로운 샘플링주파수의 레벨값이며,Y N is the level value of the new sampling frequency,

XN-1은 YN이전의 샘플링주파수의 레벨값이고,X N-1 is the level value of the sampling frequency before Y N ,

XN+1은 YN이후의 샘플링주파수의 레벨값이며,X N + 1 is the level value of the sampling frequency after Y N ,

N은 자연수이다.N is a natural number.

Description

주파수샘플링방법Frequency Sampling Method

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제2도는 본 발명에 의한 주파수샘플링방법을 나타내는 신호파형도이다.2 is a signal waveform diagram showing a frequency sampling method according to the present invention.

Claims (1)

기준 샘플주파수와 레벨값을 갖는 아날로그파형의 주파수샘플링방법에 있어서; 임의의 파형에 대한 샘플링주파수의 개수에 따라 기준 샘플링주파수의 값을 이용하여 새로운 샘플링주파수값을 검출하고 ; 상기 검출된 새로운 샘플링주파수값에 따라 아래의 식을 이용하여 새로운 샘플링주파수 레벨을 검출하도록 한 주파수샘플링방법.A frequency sampling method of an analog waveform having a reference sample frequency and a level value; Detecting a new sampling frequency value using a value of a reference sampling frequency according to the number of sampling frequencies for an arbitrary waveform; And a new sampling frequency level using the following equation according to the detected new sampling frequency value. 단, 여기서 XN은 새로운 샘플링주파수값이고,Where X N is the new sampling frequency value, XN-1은 XN이전의 기준 샘플링주파수값이며,X N-1 is the reference sampling frequency value before X N , XN+1은 XN이후의 기준 샘플링주파수값이고,X N + 1 is the reference sampling frequency value after X N , YN은 새로운 샘플링주파수의 레벨값이며,Y N is the level value of the new sampling frequency, XN-1은 YN이전의 샘플링주파수의 레벨값이고,X N-1 is the level value of the sampling frequency before Y N , XN+1은 YN이후의 샘플링주파수의 레벨값이며,X N + 1 is the level value of the sampling frequency after Y N , N은 자연수이다.N is a natural number. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950039109A 1995-10-31 1995-10-31 Frequency Sampling Method KR970024622A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950039109A KR970024622A (en) 1995-10-31 1995-10-31 Frequency Sampling Method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950039109A KR970024622A (en) 1995-10-31 1995-10-31 Frequency Sampling Method

Publications (1)

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KR970024622A true KR970024622A (en) 1997-05-30

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Application Number Title Priority Date Filing Date
KR1019950039109A KR970024622A (en) 1995-10-31 1995-10-31 Frequency Sampling Method

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KR (1) KR970024622A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101479292B1 (en) * 2013-08-20 2015-01-05 경일대학교산학협력단 Method of measuring bearing abrasion in rotating machine and apparatus thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101479292B1 (en) * 2013-08-20 2015-01-05 경일대학교산학협력단 Method of measuring bearing abrasion in rotating machine and apparatus thereof

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