KR970022359A - DC voltage testing device and method - Google Patents

DC voltage testing device and method Download PDF

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Publication number
KR970022359A
KR970022359A KR1019950037965A KR19950037965A KR970022359A KR 970022359 A KR970022359 A KR 970022359A KR 1019950037965 A KR1019950037965 A KR 1019950037965A KR 19950037965 A KR19950037965 A KR 19950037965A KR 970022359 A KR970022359 A KR 970022359A
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KR
South Korea
Prior art keywords
data
unit
measured
component
microcomputer
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KR1019950037965A
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Korean (ko)
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KR0164702B1 (en
Inventor
박남식
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배순훈
대우전자 주식회사
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Priority to KR1019950037965A priority Critical patent/KR0164702B1/en
Publication of KR970022359A publication Critical patent/KR970022359A/en
Application granted granted Critical
Publication of KR0164702B1 publication Critical patent/KR0164702B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

본 발명은 DC 전압 검사기에 관한 것으로서, 특히 전자제품의 생산라인 및 A/S수리시에 각종 IC부품의 불량검사를 용이하게 할 수 있도록 한 DC 전압 검사장치 및 방법에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a DC voltage inspector, and more particularly, to a DC voltage inspector and a method for facilitating defect inspection of various IC components during production lines and after-sales repairs of electronic products.

본 발명은 IC부품의 데이타를- 입력하고 측정할 IC를 설정하는 키입력부와, 프로그램에 의해 각부의 동작이 되도록 제어하는 마이콤과, IC부품의 전압을 측정함 수 있으며 측정값을 A/D변환부로 전달하는 측정부와, 저장부의 데이타와 측정부의 데이타를 비교하여 비교간 데이타를 마이콤에 출력하는 비교부와, 마이콤의 출력신호에 의해 비교한 데이타를 디스플레이하는 LCD표시부로 구성되어 IC부품 측정시 측정데이타를 LCD화면에 디스플레이하고 측정한 IC부품이 불량이면 경보음을 발생하여 사용자가 편리하고 신속하게 IC부품을 측정할 수 있는 기술에 관한 것이다.According to the present invention, a key input unit for inputting data of an IC component and setting an IC to be measured, a microcomputer controlling the operation of each unit by a program, a voltage of the IC component can be measured, and the measured value is A / D converted. It consists of a measuring unit which is transmitted to the unit, a comparing unit which compares the data of the storage unit with the data of the measuring unit and outputs the data between the comparisons to the microcomputer, and an LCD display unit which displays the data compared by the output signal of the microcomputer. The present invention relates to a technology that displays measurement data on the LCD screen and generates an alarm sound when the measured IC component is defective, thereby allowing the user to conveniently and quickly measure the IC component.

Description

DC 전압 검사장치 및 그 방법DC voltage testing device and method

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

제1도는 본 발명에 따른 DC 전압 검사장치를 개략적으로 도시한 도면,1 is a view schematically showing a DC voltage inspection device according to the present invention,

제2도는 본 발명에 따른 DC 전압 검사방법의 동작흐름도.2 is a flow chart of the DC voltage test method according to the present invention.

Claims (4)

DC 전압 검사장치에 있어서, IC부품의 데이타를 입력하고 측정할 IC를 설정하는 키입력부(10)와, 프로그램에 의해 각부의 동작이 되도록 제어하는 마이콤(30)과, IC부품의 전압을 측정할 수 있으며 측정값을 A/D변환부(60)로 전달하는 측정부(50)와, 저장부(40)의 데이타와 측정부(50)의 데이타를 비교하여 비교한 데이타를 마이콤(30)에 출력하는 비교부(70)와, 마이콤(30)의 출력신호에 의해 비교한 데이타를 디스플레이하는 LCD표시부(80)로 구성된 것을 특징으로 하는 DC 전압 검사장치.In the DC voltage inspection device, a key input unit 10 for inputting data of an IC component and setting an IC to be measured, a microcomputer 30 for controlling operation of each unit by a program, and a voltage of the IC component can be measured. It is possible to compare the data of the measurement unit 50, the storage unit 40 and the data of the measurement unit 50, which transmits the measured value to the A / D conversion unit 60 to the microcomputer 30 DC voltage testing device, characterized in that consisting of a comparator 70 for outputting and an LCD display unit (80) for displaying the data compared by the output signal of the microcomputer (30). 제1항에 있어서, 측정데이타값과 저장부(40)의 데이타중 설정된 데이타값이 일치하지 않으면 마이콤(30)의 음성데이타에 의해 경보음을 발생하는 음성신호발생부(90)를 포함하여 구성된 것을 특징으로 하는 DC 전압 검사장치.The apparatus of claim 1, further comprising a voice signal generator (90) which generates an alarm sound by the voice data of the microcomputer 30 when the measured data value and the data value set in the data of the storage unit 40 do not match. DC voltage testing device, characterized in that. DC 전압 검사방법에 있어서, 키입력부(10)를 통하여 IC부품의 데이타를 입력하면 저장부(40)에 데이타를 저장하고, 측정할 IC부품을 설정하는 제1단계와, IC부품을 측정하여 측정값과 저장부(40)에 있는 데이타에서 실정된 데이타값을 찾아 비교하는 제2단계와, 상기 제2단계에서 측정한 데이타값과 설정한 데이타값이 일치하면 LCD표시부(90)를 통하여 비교한 데이타를 디스플레이하는 제3단계와, 키입력부(10)를 통하여 다음 측정할 IC부품이 설정되어 있는지 판단하여 설정이 있으면 단계(104)로 진행하여 측정하는 제4단계와, 상기 제4단계에서 설정이 없으면 측정부(50)를 통하여 전달되는 측정한 데이타값이 있는지 판단하여 데이타값이 없으면 끝을 내는 제5단계로 이루어진 것을 특징으로 하는 DC 전압 검사 방법.In the DC voltage inspection method, when data of an IC component is input through the key input unit 10, the first step of storing the data in the storage unit 40, setting the IC component to be measured, and measuring and measuring the IC component A second step of finding and comparing the actual data value from the value and the data in the storage unit 40, and comparing the data value measured in the second step with the set data value through the LCD display unit 90 A third step of displaying data, and a fourth step of determining whether an IC component to be measured next is set by the key input unit 10, and if so, proceeding to step 104 and measuring in the fourth step, and setting in the fourth step. If there is no DC voltage test method, characterized in that the fifth step of determining whether there is a measured data value transmitted through the measuring unit 50 and ends if there is no data value. 제3항에 있어서, 상기 제2단계에서 측정한 데이타값과 설정한 데이타값이 일치하지 않으면 경보음을 발생하고 비교한 데이타를 디스플레이하는 제6단계를 포함하여 이루어진 것을 특징으로 하는 DC 전압 검사 방법.4. The method of claim 3, further comprising a sixth step of generating an alarm sound and displaying the compared data when the data value measured in the second step and the set data value do not match. . ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950037965A 1995-10-30 1995-10-30 Dc voltage test apparatus and its method KR0164702B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950037965A KR0164702B1 (en) 1995-10-30 1995-10-30 Dc voltage test apparatus and its method

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Application Number Priority Date Filing Date Title
KR1019950037965A KR0164702B1 (en) 1995-10-30 1995-10-30 Dc voltage test apparatus and its method

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KR970022359A true KR970022359A (en) 1997-05-28
KR0164702B1 KR0164702B1 (en) 1999-03-20

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100277895B1 (en) * 1998-03-02 2001-02-01 배일순 Multi-purpose Inspection System for Fluorescent Display Devices

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100277895B1 (en) * 1998-03-02 2001-02-01 배일순 Multi-purpose Inspection System for Fluorescent Display Devices

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