KR970019069U - Flatness measuring device - Google Patents

Flatness measuring device

Info

Publication number
KR970019069U
KR970019069U KR2019950031831U KR19950031831U KR970019069U KR 970019069 U KR970019069 U KR 970019069U KR 2019950031831 U KR2019950031831 U KR 2019950031831U KR 19950031831 U KR19950031831 U KR 19950031831U KR 970019069 U KR970019069 U KR 970019069U
Authority
KR
South Korea
Prior art keywords
measuring device
flatness measuring
flatness
measuring
Prior art date
Application number
KR2019950031831U
Other languages
Korean (ko)
Other versions
KR200155940Y1 (en
Inventor
장선원
김현숙
임채중
Original Assignee
포항종합제철주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 포항종합제철주식회사 filed Critical 포항종합제철주식회사
Priority to KR2019950031831U priority Critical patent/KR200155940Y1/en
Publication of KR970019069U publication Critical patent/KR970019069U/en
Application granted granted Critical
Publication of KR200155940Y1 publication Critical patent/KR200155940Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • G01B5/0004—Supports

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
KR2019950031831U 1995-10-31 1995-10-31 Flatness measuring device KR200155940Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950031831U KR200155940Y1 (en) 1995-10-31 1995-10-31 Flatness measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950031831U KR200155940Y1 (en) 1995-10-31 1995-10-31 Flatness measuring device

Publications (2)

Publication Number Publication Date
KR970019069U true KR970019069U (en) 1997-05-26
KR200155940Y1 KR200155940Y1 (en) 1999-09-01

Family

ID=19427831

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950031831U KR200155940Y1 (en) 1995-10-31 1995-10-31 Flatness measuring device

Country Status (1)

Country Link
KR (1) KR200155940Y1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102418946B1 (en) * 2022-05-18 2022-07-07 (주)세원테크 Apparatus for measuring flatness of plate workpiece

Also Published As

Publication number Publication date
KR200155940Y1 (en) 1999-09-01

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20020521

Year of fee payment: 4

LAPS Lapse due to unpaid annual fee