KR970007377A - Manual Sockets for Testing Electrical Characteristics of Semiconductor Devices - Google Patents

Manual Sockets for Testing Electrical Characteristics of Semiconductor Devices Download PDF

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Publication number
KR970007377A
KR970007377A KR1019950020666A KR19950020666A KR970007377A KR 970007377 A KR970007377 A KR 970007377A KR 1019950020666 A KR1019950020666 A KR 1019950020666A KR 19950020666 A KR19950020666 A KR 19950020666A KR 970007377 A KR970007377 A KR 970007377A
Authority
KR
South Korea
Prior art keywords
semiconductor device
socket
electrical characteristics
manual
rear frame
Prior art date
Application number
KR1019950020666A
Other languages
Korean (ko)
Other versions
KR0142706B1 (en
Inventor
문지영
Original Assignee
문정환
Lg 반도체 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 문정환, Lg 반도체 주식회사 filed Critical 문정환
Priority to KR1019950020666A priority Critical patent/KR0142706B1/en
Publication of KR970007377A publication Critical patent/KR970007377A/en
Application granted granted Critical
Publication of KR0142706B1 publication Critical patent/KR0142706B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)

Abstract

본 발명은 반도체소자를 수작업으로 검사할 경우 반도체소자가 손쉽게 메뉴얼소켓에 탈착될 수 있게 하여 리드휨 등 반도체소자의 손상을 방지할 수 있도록 함과 동시에 작업성을 향상시킨 것이다.The present invention is to improve the workability and at the same time to prevent damage to the semiconductor device, such as lead bending by allowing the semiconductor device to be easily detached to the manual socket when the semiconductor device is manually inspected.

이를 위해, 본 발명은 반도체소자(1)가 회로기판(6)에 대해 수직방향으로 세워져 삽입되도록 삽입홈(4)이 형성된 전방프레임(5)과, 상기 전방프레임(5)의 소자 삽입측 반대쪽으로 소켓리드(7)가 인출된 후방프레임(9)과, 상기 반도체소자(1)의검사 종료 후 반도체소자(1)가 소켓(9) 전방으로 탈거되도록 후방프레임(8)에 탄력설치되는 푸셔(10)로 구성되어 반도체소자(1) 장착면이 수평면에 대해 수직한 방향을 향하도록 회로기판(6)에 설치되는 반도체소자의 전기특성 검사용 메뉴얼소켓이다.To this end, according to the present invention, the front frame 5 in which the insertion groove 4 is formed so that the semiconductor element 1 is erected and inserted in a vertical direction with respect to the circuit board 6 and the opposite side of the element insertion side of the front frame 5 are formed. The rear frame 9 from which the socket lead 7 is drawn out, and the pusher elastically installed in the rear frame 8 so that the semiconductor element 1 is removed to the front of the socket 9 after the inspection of the semiconductor element 1 is finished. A manual socket for inspecting electrical characteristics of a semiconductor device, which is composed of (10) and is provided on the circuit board 6 so that the mounting surface of the semiconductor device 1 faces in a direction perpendicular to the horizontal plane.

Description

반도체소자의 전기특성 검사용 메뉴얼소켓Manual Sockets for Testing Electrical Characteristics of Semiconductor Devices

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제3도는 본 발명의 회로기판에 장착된 상태를 나타낸 사시도, 제4도는 제3도의 소켓이 결합되는 상태를 나타낸 횡단면도.Figure 3 is a perspective view showing a state mounted on the circuit board of the present invention, Figure 4 is a cross-sectional view showing a state in which the socket of Figure 3 is coupled.

Claims (2)

반도체소자가 회로기판에 대해 수직방향으로 세워져 삽입되도록 삽입홈이 형성된 전방프레임과, 상기 전방프레임의 소자 삽입측 반대쪽으로 소켓리드가 인출된 후방프레임과, 상기 반도체소자의 검사 종료 후 반도체소자가 소켓전방으로 탈거되도록 후방프레임에 탄력설치되는 푸셔로 구성되어 반도체소자 장착면이 수평면에 대해 수직한 방향을 향하도록 회로기판에 설치되는 것을 특징으로 하는 반도체소자의 전기특성 검사용 메뉴얼소켓.A front frame in which an insertion groove is formed so that the semiconductor device is vertically inserted into the circuit board, a rear frame in which the socket lead is drawn out to the opposite side of the element insertion side of the front frame, and the semiconductor device is a socket after completion of the inspection of the semiconductor device. A manual socket for inspecting electrical characteristics of a semiconductor device, comprising: a pusher elastically installed in a rear frame to be removed in a forward direction, and installed on a circuit board so that the mounting surface of the semiconductor device faces in a direction perpendicular to a horizontal plane. 제1항에 있어서, 상기 후방프레임에는 반도체소자 삽입시 반도체소자의 규격에 맞춰 삽입위치를 한정하도록 설치위치를 가변시킬 수 있는 스톱퍼가 설치되는 반도체소자의 전기특성 검사용 메뉴얼소켓.The manual socket for inspecting electrical characteristics of a semiconductor device according to claim 1, wherein the rear frame is provided with a stopper capable of varying the installation position so as to limit the insertion position according to the specification of the semiconductor device when the semiconductor device is inserted. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019950020666A 1995-07-13 1995-07-13 Manual socket for the electrical character tester of semiconductor device KR0142706B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019950020666A KR0142706B1 (en) 1995-07-13 1995-07-13 Manual socket for the electrical character tester of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019950020666A KR0142706B1 (en) 1995-07-13 1995-07-13 Manual socket for the electrical character tester of semiconductor device

Publications (2)

Publication Number Publication Date
KR970007377A true KR970007377A (en) 1997-02-21
KR0142706B1 KR0142706B1 (en) 1998-08-17

Family

ID=19420570

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950020666A KR0142706B1 (en) 1995-07-13 1995-07-13 Manual socket for the electrical character tester of semiconductor device

Country Status (1)

Country Link
KR (1) KR0142706B1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20010016520A (en) * 2000-12-16 2001-03-05 정의룡 Development of PCR-SSCP method for Identification of Hanwoo Meat
KR100352059B1 (en) * 2000-04-03 2002-09-11 여정수 DNA probe to identify the Korean Cattle, Hanwoo and method for identification thereof
KR100415080B1 (en) * 2000-11-07 2004-01-13 학교법인 영남학원 Primer related marbling score of Hanwoo and test process of marbling score using thereof
KR100925036B1 (en) * 2007-07-27 2009-11-03 경상대학교산학협력단 Method for individualization and brand discrimination test in pig uising microsatellite marker

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100352059B1 (en) * 2000-04-03 2002-09-11 여정수 DNA probe to identify the Korean Cattle, Hanwoo and method for identification thereof
KR100415080B1 (en) * 2000-11-07 2004-01-13 학교법인 영남학원 Primer related marbling score of Hanwoo and test process of marbling score using thereof
KR20010016520A (en) * 2000-12-16 2001-03-05 정의룡 Development of PCR-SSCP method for Identification of Hanwoo Meat
KR100925036B1 (en) * 2007-07-27 2009-11-03 경상대학교산학협력단 Method for individualization and brand discrimination test in pig uising microsatellite marker

Also Published As

Publication number Publication date
KR0142706B1 (en) 1998-08-17

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