KR960035626U - Device spacing control device of semiconductor device inspector - Google Patents

Device spacing control device of semiconductor device inspector

Info

Publication number
KR960035626U
KR960035626U KR2019950007512U KR19950007512U KR960035626U KR 960035626 U KR960035626 U KR 960035626U KR 2019950007512 U KR2019950007512 U KR 2019950007512U KR 19950007512 U KR19950007512 U KR 19950007512U KR 960035626 U KR960035626 U KR 960035626U
Authority
KR
South Korea
Prior art keywords
inspector
spacing control
semiconductor
control device
semiconductor device
Prior art date
Application number
KR2019950007512U
Other languages
Korean (ko)
Other versions
KR0122278Y1 (en
Inventor
김두철
Original Assignee
미래산업주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 미래산업주식회사 filed Critical 미래산업주식회사
Priority to KR2019950007512U priority Critical patent/KR0122278Y1/en
Publication of KR960035626U publication Critical patent/KR960035626U/en
Application granted granted Critical
Publication of KR0122278Y1 publication Critical patent/KR0122278Y1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019950007512U 1995-04-14 1995-04-14 Tester for a semiconductor device KR0122278Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019950007512U KR0122278Y1 (en) 1995-04-14 1995-04-14 Tester for a semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019950007512U KR0122278Y1 (en) 1995-04-14 1995-04-14 Tester for a semiconductor device

Publications (2)

Publication Number Publication Date
KR960035626U true KR960035626U (en) 1996-11-21
KR0122278Y1 KR0122278Y1 (en) 1999-02-01

Family

ID=19411292

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019950007512U KR0122278Y1 (en) 1995-04-14 1995-04-14 Tester for a semiconductor device

Country Status (1)

Country Link
KR (1) KR0122278Y1 (en)

Also Published As

Publication number Publication date
KR0122278Y1 (en) 1999-02-01

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Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20090507

Year of fee payment: 12

EXPY Expiration of term