KR960013101A - Simultaneous Test Method for Analog Subscriber Circuit and Line of Electronic Switching System - Google Patents

Simultaneous Test Method for Analog Subscriber Circuit and Line of Electronic Switching System Download PDF

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Publication number
KR960013101A
KR960013101A KR1019940023335A KR19940023335A KR960013101A KR 960013101 A KR960013101 A KR 960013101A KR 1019940023335 A KR1019940023335 A KR 1019940023335A KR 19940023335 A KR19940023335 A KR 19940023335A KR 960013101 A KR960013101 A KR 960013101A
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KR
South Korea
Prior art keywords
test
line
circuit
state
subscriber
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KR1019940023335A
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Korean (ko)
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KR970008998B1 (en
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황현주
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박성규
대우통신 주식회사
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Priority to KR94023335A priority Critical patent/KR970008998B1/en
Publication of KR960013101A publication Critical patent/KR960013101A/en
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Publication of KR970008998B1 publication Critical patent/KR970008998B1/en

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04Q—SELECTING
    • H04Q1/00—Details of selecting apparatus or arrangements
    • H04Q1/18—Electrical details
    • H04Q1/20—Testing circuits or apparatus; Circuits or apparatus for detecting, indicating, or signalling faults or troubles

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  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Monitoring And Testing Of Exchanges (AREA)

Abstract

본 발명은 전자자교환기(TDX-10)의 동일 셀프내에서 가입자회로 및 선로시험을 동시에 수용하는 전전자교환기의 아날로그 가입자회로 및 선로시험방법에 관한 것으로, 이를 해결하기 위하여 운용자에 의해 입력되는 회로(또는 선로)시험 요구를 받아 기능 수행중에 시험장비의 현재상태를 알기 위하여 OMP에서 데이터 베이스를 엑세스하여 TEC가 노말상태(정상), 어브노말상태(비정상), 비동작상태중 어느 한 상태를 판정하는 제1단계와, 제1단계의 판정결과에 따른 정보를 변경하여 저장하는 제2단계와, 제1단계아 상기 제2단계에 의해 가입자 회로시험 요구가 입력되었을때 선로시험중이면, 회로 및 선로의 동시 시험으로 변경하고, 상기 가입자 선로시험 요구가 입력되었을때의 회로시험중이면, 회로 및 선로 시험상태로 변경하는 제3단계로 이루어져 시험가능한 가입자 시험장비를 선택하도록 이루어져 있다.The present invention relates to an analog subscriber circuit and a line test method of an all-electronic exchanger that simultaneously accepts a subscriber circuit and a line test in the same self of an electronic switch (TDX-10), and a circuit input by an operator to solve this problem. In order to know the current state of the test equipment during the performance of a function by receiving a test request (or a line), the TEC determines whether the state is normal (normal), abnormal (normal) or non-operational state by accessing the database from the OMP. A second step of changing and storing information according to the determination result of the first step, and a first step or a line test when the subscriber circuit test request is input by the second step. The test consists of the third step of changing to the simultaneous test of the line and changing to the circuit and line test state if the circuit test is performed when the subscriber line test request is entered. It is designed to select possible subscriber test equipment.

Description

전전자교환기의 아날로그 가입자 회로 및 선로 동시시험방법Simultaneous Test Method for Analog Subscriber Circuit and Line of Electronic Switching System

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음As this is a public information case, the full text was not included.

Claims (3)

운용자에 의해 입력되는 회로(또는 선로) 시험 요구를 받아 기능 수행 중에 시험장비의 현재상태를 알기 위하여 OMP에서 데이터 베이스를 억세스하여 TEC가 노말상태(정상), 어브노말상태(비정상), 미실장 중 어느 한 상태를 판정하는 제1단계와, 상기 제1단계의 판정결과에 따른 정보를 변경하여 저장하는 제2단계와, 상기 제1단계와 상기 제2단계에 의해 가입자 회로시험 요구가 입력되었을 때 선로시험 중이면, 회로 및 선로의 동시시험으로 변경하고, 상기 가입자 선로시험 요구가 입력되었을 때 회로시험 중이면, 회로 및 선로 시험상태로 변경하는 제3단계로 이루어져 시험가능한 가입자 시험장비를 선택함을 특징으로 하는 전전자교환기의 아날로그 가입자 회로 및 선로 동시시험방법.In order to know the current state of the test equipment during the function execution by receiving the circuit (or line) test request input by the operator, the TEC accesses the database from the OMP so that the TEC is normal (normal), abnormal (normal), or not mounted. A first step of determining a state, a second step of changing and storing information according to the determination result of the first step, and a subscriber circuit test request is input by the first step and the second step If it is in line test, it is changed into simultaneous test of circuit and line, and if it is in circuit test when the subscriber line test request is input, the third step of changing to circuit and line test state is selected. Simultaneous test method for analog subscriber circuit and line of all electronic switch. 제1항에 있어서, 상기 가입자 회로 및 선로 동시시험방법은 시험 가입자 번호에 의해 데이터 베이스로부터 해당 테스트 버스 상태를 엑세스하여 테스트 버스상태를 검출하는 제4단계, 상기 제4단게에 의해 유휴이거나 가입자 회로시험 요구가 입력되었을 때 선로시험 중이면, 회로 및 선로의 동시시험으로 변경하고, 상기 가입자 선로시험 요구가 입력되었을 때 회로시험 중이면, 회로 및 선로의 동시시험으로 변경하여 저장하는 제5단계, 상기 제5단계에서 테스트 버스가 사용 중 상태인 경우이면 소정시간 동안 모니터링하는 제6단계, 일정시간이 지나도 계속 사용 중인 경우에는 테스트 버스비지상태를 저장하고 동작을 정지하는 제7단계를 추가로 이루어짐을 특징으로 하는 전전자교환기의 아날로그 가입자 회로 및 선로 동시시험방법.The method of claim 1, wherein the subscriber circuit and the line simultaneous test method detect a test bus state by accessing a corresponding test bus state from a database by a test subscriber number, and idle or subscriber circuit by the fourth step. A fifth step of changing to simultaneous testing of circuits and lines if the line test is in progress when the test request is inputted, and changing to simultaneous testing of circuits and lines if the circuit test is in progress when the subscriber line test request is entered; In the fifth step, if the test bus is in a busy state, a sixth step of monitoring for a predetermined time, and if the bus continues to be used after a predetermined time, a seventh step of storing a test bus busy state and stopping operation Simultaneous test method for analog subscriber circuit and line of all electronic switch. 제1항 또는 제2항에 있어서, 상기 시험장비의 사용이 종료된 경우에서는 시험장비 상태가 회로시험 중, 선로시험 중일때는 유휴상태로, 회로 및 선로 동시시험 중일 때 회로시험이 종료되는 시점이면 선로시험 중으로, 선로시험이 종료되는 시점이면, 회로시험 중으로 상태를 변경하여 저장함을 특징으로 하는 전전자교환기의 아날로그 가입자 회로 및 선로 동시시험방법.The method according to claim 1 or 2, wherein when the use of the test equipment is terminated, when the state of the test equipment is in the idle state during the circuit test, the line test, and when the circuit test is finished during the simultaneous test of the circuit and the line. A method for simultaneous testing of analog subscriber circuits and lines of an electronic switching system, characterized in that during a line test, when the line test is completed, the state is changed and stored during the circuit test. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR94023335A 1994-09-15 1994-09-15 Circuit and method for line simultaneous testing in a full electronic switching system KR970008998B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR94023335A KR970008998B1 (en) 1994-09-15 1994-09-15 Circuit and method for line simultaneous testing in a full electronic switching system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR94023335A KR970008998B1 (en) 1994-09-15 1994-09-15 Circuit and method for line simultaneous testing in a full electronic switching system

Publications (2)

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KR960013101A true KR960013101A (en) 1996-04-20
KR970008998B1 KR970008998B1 (en) 1997-06-03

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100315643B1 (en) * 1998-12-31 2002-02-28 박하구 Apparatus for testing subscriber line and subscriber circuit of analog loop
KR100617838B1 (en) * 1999-06-10 2006-08-28 삼성전자주식회사 A control method of the test unit in the transmission system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100315643B1 (en) * 1998-12-31 2002-02-28 박하구 Apparatus for testing subscriber line and subscriber circuit of analog loop
KR100617838B1 (en) * 1999-06-10 2006-08-28 삼성전자주식회사 A control method of the test unit in the transmission system

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Publication number Publication date
KR970008998B1 (en) 1997-06-03

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