KR960011134B1 - Subscriber line test method in the isdn switching system - Google Patents

Abstract

The method for diagnosing digital sections including client lines in the ISDN, comprises the steps of: transmitting a class and No. of tested lines to an OMP(Operation and Maintenance Processor), a class to an OTEP(Out Test Equipment Processor); maintaining the tested lines available for a loop back test on line, maintaining them off line for the other available tests; reporting the test result to the OTEP; reporting an analyzed result to an operator via an ALTP(Analog Line Test Processor).

Description

Subscriber Line Test Method in ISDN Switching System

1 is a diagram illustrating a connection between a subscriber and a network in a general integrated information network (ISDN).

2 is a block diagram of a test apparatus for testing a subscriber line according to the present invention.

3 is a mounting diagram of a test apparatus for a subscriber line.

The present invention includes subscriber lines at the request of an operator in an Integrated Services Digital Network (ISDN) Electronic Switching System (TDX-1B). It is about subscriber line test method to determine the failure of digital section.

The basic connection between subscriber and network in ISDN is the B channel (64Kbps) used for information transmission and the D channel used for signal and packet information transmission for circuit switching using conventional subscriber lines. 1 is a diagram illustrating a connection configuration between a subscriber and a network in a general ISDN in a manner of exchanging between a subscriber station and a switching system.

ISDN Terminal Equipment (TE) has the connection standard of 'S' reference point as recommended by the International Telegraph Telephone Advisory Committee (CCITT), and terminates the line through the two-wire subscriber line via the NT (Network Terminaion). It is connected to ET (Exchange Termination).

The ISDN Switching System (TDX-1B) is designed to accommodate analog subscribers and ISDN subscribers at the same time, so it is necessary to test digital subscriber lines in addition to conventional subscriber line test functions for analog subscriber lines. Do.

Accordingly, an object of the present invention is to provide a subscriber line test method which can test the presence and failure of a line according to the digital characteristics and the transmission quality between the subscriber terminal and the line termination of the switching system.

The present invention for achieving the above object is a terminal that is a non-intelligent terminal that receives data from the operator, and outputs a test result, and an analog line test processor connected to the terminal and receiving a line test request from the operator to process it Analog Line Test Processor (ALTP), Operation and Maintenance Processor (OMP), an operation maintenance processor that manages the overall operation of the switching system, and OTP (Out Test Equipment) that performs out-test on subscriber lines. Processor and Line and Keyset Test Module-Digital (LKTM-D), a measuring device for testing digital subscriber lines, and switch circuits and TAEB-B for connecting the line under test to LKTM-D, a measuring device. (Test Access Equipment Board-B) and subscriber line applied to subscriber line test equipment of ISDN switch system with line termination In the test method, the ALTP receives a test request from an operator through a terminal, transmits the test request signal to the OMP with the test request signal and the number of the measured line requesting the test, and notifies the OTEP of the test type. ; After performing the first step, the OMP checks whether the test of the measured line requiring the test is possible, and if the test is possible, if the test type is the instant test, the detailed test, and the activation test, the control signal is transmitted to the switch circuit and the TAEB-B. A second step of causing the line under test to be switched off line of the LKTM-D and notifying the OTEP that the test line is ready for testing on the line under test; After performing the second step, the OTEP requests measurement to the LKTM-D to perform the test function requested by the operator, and the LKTN-D performs the measurement on the measured line and reports the result to the OTEP; After performing the third step, the OTEP analyzes the measurement result received from the LKTM-D, and then reports it to the operator through ALTP; After performing the first step, if the test type requested by the operator is a loopback test, the OMP determines whether the corresponding line under test can be tested and if the test is possible, controls the switch circuit and the TAEB-B on line. A fifth step of establishing a loopback test path to maintain the state and notifying the OTEP of the test readiness; After performing the fifth step, the OTEP requests the LKTM-D to start the loopback test, and the LKTM-D sends a pseudorandom pattern or a predetermined digital pattern designated by the operator, and loops back and receives the digital data received from the subscriber access device. A sixth step of measuring bit error by comparing the transmitted digital data and reporting the result to the OTEP; After performing the sixth step, the OTEP comprises a seventh step of analyzing the measurement results received from the LKTM-D, and reporting to the operator through the ALTP.

Hereinafter, with reference to the accompanying drawings will be described an embodiment of the present invention;

2 is a configuration diagram of a test apparatus for testing a subscriber line according to the present invention. In the drawing, '1' is a non-intelligent terminal, '2' is an ALTP (Alalog Line Test Processor), and '3' is an OMP ( Operation and Maintenance Processor (4), '4' is the Out Test Equipment Processor (OTEP), '5' is the Ring and Keyset Test Module-Digital (LKTM-D), '6' is the line under test, '7' is the switch circuit and Test Access Equipment Board-B (TAEB-B), '8' represents line terminations, '9' represents digital calls, '10' represents subscriber access devices, and '11' represents subscriber telephones.

The subscriber line test apparatus according to the present invention receives a data input from an operator, is a non-intelligent terminal for outputting test results, and is connected to the terminal 1 to receive a line test request from an operator and process the same. ALTP (2) which is an analog line test processor, OMP (3) which is an operation maintenance processor which manages the overall operating state of the switching system, OTEP (4) which performs out test function for subscriber lines, LKTM-D (5), a measuring device for testing digital subscriber lines, a switch circuit and TAEB-B (7), and line terminations, which perform the function of connecting the line under test to LKTM-D, a measuring device. The part 8 is provided.

Referring to the subscriber line test method configured as described above with reference to the subscriber line test method according to the present invention.

A plurality of terminals 1 may be connected to the ALTP 2, and when the operator wants to perform a test on the subscriber line, the operator selects the line to be measured 6 to be tested and connects the ALTP 2 to the ALTP 2 through the terminal 1. To).

When the ALTP (2) receives the test request from the operator through the terminal (1), the ALTP (2) and the number of the selected line (6) and the type of test (immediate test, detailed test, activation test, loopback test) is put on the request signal OMP ( 3), and notifying the OTEP 4 of the test type.

The OMP (3) checks if the test line under test is possible when the test request is received from the ALTP (2). If the test type is possible, the switch circuit and TAEB-B ( 7) The control signal is transmitted to the off-line of the LKTM-D (5), and the OTEP (4) is informed that the test preparation for the under-tested line is completed.

When OTEP (4) is notified from the OMP (3) that test preparation is complete, the OTEP (4) requests measurement from the LKTM-D (5) to perform the test function requested by the operator, and the LKTM-D (5) Take the measurement and report the result to OTEP (4).

The OTEP 4 analyzes the measurement results received from the LKTM-D 5 and reports them to the operator via the ALTP 2.

When the test type is a loopback test, the OMP 3 determines whether the corresponding line under test can be tested and if the test is possible, the B1 or B2 channel is terminated at the subscriber access device 10 through the line termination unit 8. Control to loop back to the side (8).

In addition, OMP (3) controls the digital communication path to connect the B channel between the line termination (9) and the LKTM-D (5), and control the switch circuit and TAEB-B (7) on-line state Is maintained, and the OTEP (4) is notified of the test readiness.

The OTEP (4) requests the LKTM-D (5) to start the loopback test when it is notified of the test preparation status from the OMP (3), and the LKTM-D (5) generates a pseudorandom pattern or a constant digital pattern designated by the operator. The bit error is measured by comparing the digital data transmitted and the digital data received by looping back from the subscriber access device 10. At this time, the transmission path of the digital data transmitted from the LKTM-D 5 is looped back from the subscriber access device 10 through the digital communication path 9, the line termination part 8, the switch circuit, and the TAEB-B 7; The digital data transmitted from the LKTM-D 5 is received through the reverse path.

Then, the LKTM-D (5) reports the result of performing the loopback test on the track under test to the OTEP (4), and the OTEP (4) analyzes the measurement result received from the LKTM-D (5), Report to the operator via ALTP (2).

The test function of the ISDN subscriber line according to the present invention is as follows.

Instant test is to test the condition of the subscriber line by measuring various electrical characteristics of the line under test (6), and TR (between tip and ring) and TG (Tip and Ground) of the subscriber line under test ), AC (AC) voltage, DC (DC) resistance, and capacitance against RG (between ring and ground), and determine the fault of the line based on the measured data, and report the result and measured value to the operator. Inform. The judgment results in the instant test are as follows.

TEST OK

OPEN

SHORT

CROSS

TIP, RING, BOTH GROUND

Busy

Special tests are tests of more detailed electrical characteristics or special functions than instant tests.

Spin test

Measure the AC voltage, DC voltage, DC resistance, and capacitance between TR, TG, and RG at once and output the result.

Step test

AC voltage, DC voltage, DC resistance and capacitance between TR, TG and RG are measured separately and the result is output.

Gamp-on test

It outputs the state where the core line contrast and the line changes in time with respect to AC voltage, DC voltage, DC resistance and capacitance between TR, TG and RG.

· Call path set-up function of subscriber line under test, and provides call path for call test with subscriber under test.

Sound Tone Sending Function

The sound (1KHz continuous sound) is transmitted so that the core line can be easily found.

Loop qualification tone transmission function

It transmits analog signal (40KHz) corresponding to the maximum power frequency of 2BIQ (2 Binary 1 Quarternary) frame to measure transmission quality.

The activation test requires activation from the test device to the subscriber access device 10 to test the normality of the line including the subscriber access device (NTE) 10. The activation test is an ISDN subscriber line and a subscriber access device (NTE). Since it can be used as an important test to determine the condition of (10), it should be implemented to be tested immediately.

Loopback test measures the transmission quality of the line accurately by looping back to the network side from the subscriber station (NTE) 10 in the ON LINE state and then transmitting / checking the signal pattern on the B channel for a long time (more than 15 minutes). In this test, when the subscriber makes a call during the loopback test using the B channel, the subscriber's calling information is received through the D channel, and the service is provided to the subscriber without interruption using another B channel which is not used in the test.

FIG. 3 shows a configuration in which a conventional tester for analog subscriber (LKTM) and a LKTM-D with test functions for analog subscribers and digital subscribers are mounted together.

The present invention made as described above has an effect that can provide an improved ISDN service with a low failure rate by adding a test function for the digital subscriber line as the TDX-1B accommodates the ISDN terminal.

Claims (1)

Terminal 1, a non-intelligent terminal that receives data from an operator and outputs a test result, and ALTP (Analog Line), an analog line test processor connected to the terminal 1 to receive and process a line test request from an operator. Test Processor (2), OMP (Operation and Maintenance Processor) (3), which is an operation maintenance processor that manages the overall operating status of the switching system, and OTEP (Out Test), which performs out test functions for subscriber lines. Test Equipment Processor (4), LKTM-D (Ling and Keyset Test Module-Digital) (5), a measuring device for testing digital subscriber lines, and LKTM-D (5), a measurement line. Subscriber applied to the subscriber line test apparatus of an integrated information network (ISDN) switching system having a switch circuit for performing a function to perform a function of the circuit and a Test Access Equipment Board-B (TAEB-B) (7), and a line terminator (8). Following the track method, ALT P (2) receives the test request from the operator via terminal (1) and transmits the test request signal to OMP (3) with the number and type of test line that requested the test, and sends the test to OTEP (4). A first step of notifying a kind; After performing the first step, the OMP (3) checks whether the test of the measured line requiring the test is possible, and if the test is possible, if the test type is an instant test, a detailed test, and an activation test, the switch circuit and the TAEB-B (7) Sending a control signal to the line under test so that the line under test is switched off line of the LKTM-D 5 and notifying the OTEP 4 that the test preparation for the line under test is complete; After performing the second step, the OTEP 4 requests measurement from the LKTM-D 5 so that the test function requested by the operator is performed, and the LKTM-D 5 performs a measurement on the line to be measured. A third step of reporting the result to the OTEP (4); After performing the third step, the OTEP 4 analyzes the measurement result received from the LKTM-D 5 and reports it to the operator through the ALTP 2; After performing the first step, if the test type requested by the operator is a loopback test, the OMP 3 determines whether the corresponding measured line is in a testable state and controls the switch circuit and the TAEB-B 7 if the test is possible. A fifth step of establishing a loopback test path by maintaining an on-line state and notifying the OTEP (4) of a test preparation completion state; After performing the fifth step, the OTEP 4 requests the LKTM-D 5 to start the loopback test, and the LKTM-D 5 sends out a pseudo random pattern or a constant digital pattern designated by the operator, and accesses the subscriber. A sixth step of measuring the error by comparing the received digital data with the received digital data looped back in the apparatus 10 and reporting the result to the OTEP 4; After the sixth step, the OTEP (4) comprises a seventh step of analyzing the measurement results received from the LKTM-D (5), and reporting to the operator through the ALTP (2) Track test method.