KR950033501A - Signal pick-up circuit in instrument - Google Patents

Signal pick-up circuit in instrument Download PDF

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Publication number
KR950033501A
KR950033501A KR1019940011769A KR19940011769A KR950033501A KR 950033501 A KR950033501 A KR 950033501A KR 1019940011769 A KR1019940011769 A KR 1019940011769A KR 19940011769 A KR19940011769 A KR 19940011769A KR 950033501 A KR950033501 A KR 950033501A
Authority
KR
South Korea
Prior art keywords
signal
measurement target
circuit
output
target signal
Prior art date
Application number
KR1019940011769A
Other languages
Korean (ko)
Other versions
KR0160659B1 (en
Inventor
변상두
Original Assignee
김광호
삼성전자 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 김광호, 삼성전자 주식회사 filed Critical 김광호
Priority to KR1019940011769A priority Critical patent/KR0160659B1/en
Publication of KR950033501A publication Critical patent/KR950033501A/en
Application granted granted Critical
Publication of KR0160659B1 publication Critical patent/KR0160659B1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

Abstract

계측기에 있어서 본 발명에 다른 신호픽업회로에서는 입력신호에 해당하는 감쇄기를 선택하여 계측기의 입력제한조건에 따라 신호를 감쇄시키는 감쇄부와 주제어기의 명령에 따라 다수의 신호중에서 하나의 특정 측정 점을 선택하는 선택부와 입력신호의 크기에 다라 버퍼링 혹은 증폭하는 버퍼증폭기를 사용하여 신호를 측정함으로써 PBA를 사용하여 제작하는 제품의 검사공정 또는 조정공정의 자동화에 유용하게 사용할 수 있는 잇점이 있다.In the signal pick-up circuit according to the present invention, an attenuator corresponding to the input signal is selected in the measuring device, and one specific measuring point is selected from among a plurality of signals according to the command of the attenuator and the main controller to attenuate the signal according to the input limiting condition of the measuring device. By measuring the signal using a buffer amplifier that buffers or amplifies depending on the selector to be selected and the size of the input signal, it is useful to automate the inspection process or the adjustment process of a product manufactured using PBA.

Description

계측기에 있어서, 신호픽업신호로In the instrument, the signal pickup signal

본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.

제1도는 계측기에 있어서 종래의 신호픽업회로를 설명하기 위한 도면이다. 제2도는 계측기에 있어서 본 발명에 의한 신호픽업회로를 도시한 블럭도이다. 제3A, 3B는 제2도에 도시한 신호픽업회로를 설명하기 위한 도면이다.1 is a diagram for explaining a conventional signal pickup circuit in a measuring instrument. 2 is a block diagram showing a signal pickup circuit according to the present invention in a measuring instrument. 3A and 3B are diagrams for explaining the signal pickup circuit shown in FIG.

Claims (3)

계측 대상 PBA로부터 계측기의 게측대상신호를 픽업하기 위한 회로에 있어서, 상기 계측 대상 PBA에 연결된 복수개의 채널로부터 입력되는 계측대상신호를 상기 계측기의 입력제한조건에 따라 크기를 감쇄시키기 위한 감쇄부; 소정의 제어신호에 의해 상기 감쇄부에서 출력되는 복수개의 계측대상신호 중 하나의 계측대상신호를 선택하는 선택부; 및 상기 선택부에서 출력되는 계측대상신호를 버퍼링하거나, 상기 계측대상신호가 미소한 신호인 경우 증폭하여 상기 계측기로 전달하는 버퍼증폭기를 포함하는 것을 특징으로 하는 신호픽업회로.A circuit for picking up a measurement target signal of a measuring instrument from a measurement target PBA, comprising: an attenuator for attenuating a measurement target signal input from a plurality of channels connected to the measurement target PBA according to input limitation conditions of the measurement instrument; A selection unit for selecting one measurement target signal from among a plurality of measurement target signals output from the attenuation unit by a predetermined control signal; And a buffer amplifier for buffering the measurement target signal output from the selection unit or amplifying the measurement target signal if the measurement target signal is a minute signal. 제1항에 있어서, 상기 회로는 상기 버퍼증폭기에서 출력되는 계측대상신호와 외부입력단자를 통해 인가되는 신호를 상기 계측기로 선택적으로 공급하기 위하여 상기 버퍼증폭기와 상기 계측기 사이에 접속된 복수의 출력제어스위치를 더 포함하는 것을 특징으로 하는 신호픽업회로.2. The circuit of claim 1, wherein the circuit comprises a plurality of output controls connected between the buffer amplifier and the measuring instrument for selectively supplying a measurement target signal output from the buffer amplifier and a signal applied through an external input terminal to the measuring instrument. Signal pickup circuit further comprising a switch. 제1항에 있어서, 상기 선택부의 제어신호는 상기 모보드(MOTHERBOARD)에 접속된 주제어기로부터 출력되는 것을 특징으로 하는 신호픽업회로.The signal pickup circuit according to claim 1, wherein the control signal of the selector is output from a main controller connected to the MOTHERBOARD. ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.※ Note: The disclosure is based on the initial application.
KR1019940011769A 1994-05-28 1994-05-28 Signal pick up circuit for instrument KR0160659B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019940011769A KR0160659B1 (en) 1994-05-28 1994-05-28 Signal pick up circuit for instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019940011769A KR0160659B1 (en) 1994-05-28 1994-05-28 Signal pick up circuit for instrument

Publications (2)

Publication Number Publication Date
KR950033501A true KR950033501A (en) 1995-12-26
KR0160659B1 KR0160659B1 (en) 1999-03-20

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019940011769A KR0160659B1 (en) 1994-05-28 1994-05-28 Signal pick up circuit for instrument

Country Status (1)

Country Link
KR (1) KR0160659B1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100442857B1 (en) * 1997-11-18 2004-09-18 삼성전자주식회사 Square wave dc conversion circuit, especial measuring square wave within short time
KR101281634B1 (en) * 2012-04-04 2013-07-03 엘아이지넥스원 주식회사 Signal measurement apparatus and control method thereof

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100442857B1 (en) * 1997-11-18 2004-09-18 삼성전자주식회사 Square wave dc conversion circuit, especial measuring square wave within short time
KR101281634B1 (en) * 2012-04-04 2013-07-03 엘아이지넥스원 주식회사 Signal measurement apparatus and control method thereof

Also Published As

Publication number Publication date
KR0160659B1 (en) 1999-03-20

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