KR950021434U - Probe card for package testing - Google Patents

Probe card for package testing

Info

Publication number
KR950021434U
KR950021434U KR2019930028386U KR930028386U KR950021434U KR 950021434 U KR950021434 U KR 950021434U KR 2019930028386 U KR2019930028386 U KR 2019930028386U KR 930028386 U KR930028386 U KR 930028386U KR 950021434 U KR950021434 U KR 950021434U
Authority
KR
South Korea
Prior art keywords
probe card
package testing
package
testing
probe
Prior art date
Application number
KR2019930028386U
Other languages
Korean (ko)
Other versions
KR970006518Y1 (en
Inventor
한정훈
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019930028386U priority Critical patent/KR970006518Y1/en
Publication of KR950021434U publication Critical patent/KR950021434U/en
Application granted granted Critical
Publication of KR970006518Y1 publication Critical patent/KR970006518Y1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
KR2019930028386U 1993-12-17 1993-12-17 Probe card of package test KR970006518Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930028386U KR970006518Y1 (en) 1993-12-17 1993-12-17 Probe card of package test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930028386U KR970006518Y1 (en) 1993-12-17 1993-12-17 Probe card of package test

Publications (2)

Publication Number Publication Date
KR950021434U true KR950021434U (en) 1995-07-28
KR970006518Y1 KR970006518Y1 (en) 1997-06-25

Family

ID=19371590

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930028386U KR970006518Y1 (en) 1993-12-17 1993-12-17 Probe card of package test

Country Status (1)

Country Link
KR (1) KR970006518Y1 (en)

Also Published As

Publication number Publication date
KR970006518Y1 (en) 1997-06-25

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Legal Events

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A201 Request for examination
E701 Decision to grant or registration of patent right
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Year of fee payment: 8

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