KR950004424U - 파형조정 및 동작검사 시스템 픽스처 구조 - Google Patents

파형조정 및 동작검사 시스템 픽스처 구조

Info

Publication number
KR950004424U
KR950004424U KR2019930012341U KR930012341U KR950004424U KR 950004424 U KR950004424 U KR 950004424U KR 2019930012341 U KR2019930012341 U KR 2019930012341U KR 930012341 U KR930012341 U KR 930012341U KR 950004424 U KR950004424 U KR 950004424U
Authority
KR
South Korea
Prior art keywords
inspection system
fixture structure
waveform adjustment
motion inspection
system fixture
Prior art date
Application number
KR2019930012341U
Other languages
English (en)
Other versions
KR0137369Y1 (ko
Inventor
이상의
염기건
Original Assignee
삼성전자주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전자주식회사 filed Critical 삼성전자주식회사
Priority to KR2019930012341U priority Critical patent/KR0137369Y1/ko
Publication of KR950004424U publication Critical patent/KR950004424U/ko
Application granted granted Critical
Publication of KR0137369Y1 publication Critical patent/KR0137369Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
KR2019930012341U 1993-07-06 1993-07-06 파형조정 및 동작검사 시스템 픽스처 구조 KR0137369Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930012341U KR0137369Y1 (ko) 1993-07-06 1993-07-06 파형조정 및 동작검사 시스템 픽스처 구조

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930012341U KR0137369Y1 (ko) 1993-07-06 1993-07-06 파형조정 및 동작검사 시스템 픽스처 구조

Publications (2)

Publication Number Publication Date
KR950004424U true KR950004424U (ko) 1995-02-17
KR0137369Y1 KR0137369Y1 (ko) 1999-04-01

Family

ID=19358557

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930012341U KR0137369Y1 (ko) 1993-07-06 1993-07-06 파형조정 및 동작검사 시스템 픽스처 구조

Country Status (1)

Country Link
KR (1) KR0137369Y1 (ko)

Also Published As

Publication number Publication date
KR0137369Y1 (ko) 1999-04-01

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