KR950000140U - A cigarette in the middle - Google Patents

A cigarette in the middle

Info

Publication number
KR950000140U
KR950000140U KR2019930010305U KR930010305U KR950000140U KR 950000140 U KR950000140 U KR 950000140U KR 2019930010305 U KR2019930010305 U KR 2019930010305U KR 930010305 U KR930010305 U KR 930010305U KR 950000140 U KR950000140 U KR 950000140U
Authority
KR
South Korea
Prior art keywords
cigarette
Prior art date
Application number
KR2019930010305U
Other languages
Korean (ko)
Inventor
변영휘
Original Assignee
변영휘
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 변영휘 filed Critical 변영휘
Priority to KR2019930010305U priority Critical patent/KR950000140U/en
Publication of KR950000140U publication Critical patent/KR950000140U/en

Links

KR2019930010305U 1993-06-10 1993-06-10 A cigarette in the middle KR950000140U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930010305U KR950000140U (en) 1993-06-10 1993-06-10 A cigarette in the middle

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930010305U KR950000140U (en) 1993-06-10 1993-06-10 A cigarette in the middle

Publications (1)

Publication Number Publication Date
KR950000140U true KR950000140U (en) 1995-01-03

Family

ID=60855677

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930010305U KR950000140U (en) 1993-06-10 1993-06-10 A cigarette in the middle

Country Status (1)

Country Link
KR (1) KR950000140U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100426445B1 (en) * 1997-06-18 2004-06-12 주식회사 하이닉스반도체 Built-in test method for peripheral circuit of semiconductor memory device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100426445B1 (en) * 1997-06-18 2004-06-12 주식회사 하이닉스반도체 Built-in test method for peripheral circuit of semiconductor memory device

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E601 Decision to refuse application