KR940019728U - X-선 장치의 x-선 필터구조 - Google Patents

X-선 장치의 x-선 필터구조

Info

Publication number
KR940019728U
KR940019728U KR2019930000210U KR930000210U KR940019728U KR 940019728 U KR940019728 U KR 940019728U KR 2019930000210 U KR2019930000210 U KR 2019930000210U KR 930000210 U KR930000210 U KR 930000210U KR 940019728 U KR940019728 U KR 940019728U
Authority
KR
South Korea
Prior art keywords
ray
filter structure
ray device
ray filter
filter
Prior art date
Application number
KR2019930000210U
Other languages
English (en)
Other versions
KR960003263Y1 (ko
Inventor
김수헌
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019930000210U priority Critical patent/KR960003263Y1/ko
Publication of KR940019728U publication Critical patent/KR940019728U/ko
Application granted granted Critical
Publication of KR960003263Y1 publication Critical patent/KR960003263Y1/ko

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
KR2019930000210U 1993-01-09 1993-01-09 X-선 장치의 x-선 필터구조 KR960003263Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019930000210U KR960003263Y1 (ko) 1993-01-09 1993-01-09 X-선 장치의 x-선 필터구조

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019930000210U KR960003263Y1 (ko) 1993-01-09 1993-01-09 X-선 장치의 x-선 필터구조

Publications (2)

Publication Number Publication Date
KR940019728U true KR940019728U (ko) 1994-08-22
KR960003263Y1 KR960003263Y1 (ko) 1996-04-19

Family

ID=19349480

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019930000210U KR960003263Y1 (ko) 1993-01-09 1993-01-09 X-선 장치의 x-선 필터구조

Country Status (1)

Country Link
KR (1) KR960003263Y1 (ko)

Also Published As

Publication number Publication date
KR960003263Y1 (ko) 1996-04-19

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