KR940017841U - Large Specimen Support for Electron Microscopy (EPMA) - Google Patents

Large Specimen Support for Electron Microscopy (EPMA)

Info

Publication number
KR940017841U
KR940017841U KR2019920024610U KR920024610U KR940017841U KR 940017841 U KR940017841 U KR 940017841U KR 2019920024610 U KR2019920024610 U KR 2019920024610U KR 920024610 U KR920024610 U KR 920024610U KR 940017841 U KR940017841 U KR 940017841U
Authority
KR
South Korea
Prior art keywords
epma
electron microscopy
specimen support
large specimen
support
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
KR2019920024610U
Other languages
Korean (ko)
Other versions
KR950003424Y1 (en
Inventor
류길열
Original Assignee
포항종합제철 주식회사
재단법인산업과학기술연구소
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 포항종합제철 주식회사, 재단법인산업과학기술연구소 filed Critical 포항종합제철 주식회사
Priority to KR92024610U priority Critical patent/KR950003424Y1/en
Publication of KR940017841U publication Critical patent/KR940017841U/en
Application granted granted Critical
Publication of KR950003424Y1 publication Critical patent/KR950003424Y1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/261—Details

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
KR92024610U 1992-12-07 1992-12-07 Large Specimen Support for Electron Microscopy (EPMA) Expired - Fee Related KR950003424Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR92024610U KR950003424Y1 (en) 1992-12-07 1992-12-07 Large Specimen Support for Electron Microscopy (EPMA)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR92024610U KR950003424Y1 (en) 1992-12-07 1992-12-07 Large Specimen Support for Electron Microscopy (EPMA)

Publications (2)

Publication Number Publication Date
KR940017841U true KR940017841U (en) 1994-07-28
KR950003424Y1 KR950003424Y1 (en) 1995-04-28

Family

ID=19345873

Family Applications (1)

Application Number Title Priority Date Filing Date
KR92024610U Expired - Fee Related KR950003424Y1 (en) 1992-12-07 1992-12-07 Large Specimen Support for Electron Microscopy (EPMA)

Country Status (1)

Country Link
KR (1) KR950003424Y1 (en)

Also Published As

Publication number Publication date
KR950003424Y1 (en) 1995-04-28

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