KR940016987A - Waveguide coupling device - Google Patents
Waveguide coupling device Download PDFInfo
- Publication number
- KR940016987A KR940016987A KR1019920027383A KR920027383A KR940016987A KR 940016987 A KR940016987 A KR 940016987A KR 1019920027383 A KR1019920027383 A KR 1019920027383A KR 920027383 A KR920027383 A KR 920027383A KR 940016987 A KR940016987 A KR 940016987A
- Authority
- KR
- South Korea
- Prior art keywords
- probe
- band
- short circuit
- point
- circular waveguide
- Prior art date
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Abstract
본 발명은 수직 수평 편파된 C-밴드(C-Band)와 Ku-밴드(Ku-Band)의 주파수 밴드 신호를 동시에 수신 선택 가능하게 하는 도파관 결합장치에 관한 것으로, 소정 크기의 지름(D1)을 갖는 제 1 원형 도파관; 인입된 C-밴드의 초고주파 신호의 정재파(Standing Wave)가 형성되도록 하기 위해 상기 제 1 원형 도파관에 설치되며, 중심에 소정크기의 홀(hole)이 형성된 제 1 단락회로(A1면) ; 상기 제 1 단락회로(A1면)로 부터 입사방향쪽으로 상기 C-밴드에 대해 1/4파장 떨어진 지점에서 배치한 제 1 프로브(P1) ; 상기 제 1 프로브(P1) 설치위치로 부터 상기 C-밴드에 대해 1/2파장 떨어진 지점에 상기 제 1 프로브(P1 : Probe 1)와 수직 방향으로 설치하는 제 2 프로브(P2) ; 상기 제 1 단락회로(A1면)에 형성된 홀(hole)과 같은 크기의 지름(D2)을 갖는 제 2 원형 도파관 ; 인입된 Ku-밴드의 초고주파 신호의 정재파(Standing Wave)가 형성되도록 하기 위해 상기 제 2 원형 도파관에 설치한 제 2 단락회로(A2면) ; 상기 제 2 단락회로(A2면)로부터 입사방향쪽으로 상기 Ku-밴드에 대해 1/4파장 떨어진 지점에서 배치한 제 3 프로브(P3) ; 및 상기 제 3 프로브(P3) 설치위치로 부터 상기 Ku-밴드에 대해 1/2파장 떨어진 지점에서 상기 제 3 프로브(P3)와 수직방향으로 설치하는 제 4 프로브(P4)로 구성되어 있다.The present invention relates to a waveguide coupling device for simultaneously receiving and selecting vertically and horizontally polarized C-band and Ku-band frequency band signals. Having a first circular waveguide; A first short circuit (A1 surface) installed in the first circular waveguide to form a standing wave of an incoming C-band ultra-high frequency signal and having a hole having a predetermined size in a center thereof; A first probe (P1) disposed at a point 1/4 wavelength away from the first short circuit (A1 surface) with respect to the C-band in the direction of incidence; A second probe (P2) installed in a direction perpendicular to the first probe (P1: Probe 1) at a point 1/2 wavelength apart from the installation position of the first probe (P1); A second circular waveguide having a diameter D2 equal to a hole formed in the first short circuit A1 surface; A second short circuit (A2 surface) provided in the second circular waveguide to form a standing wave of the incoming Ku-band ultra-high frequency signal; A third probe (P3) disposed at a point 1/4 wavelength away from the second short circuit (A2 surface) with respect to the Ku-band in the direction of incidence; And a fourth probe P4 installed in a direction perpendicular to the third probe P3 at a point 1/2 wavelength apart from the Ku-band from the installation position of the third probe P3.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제 1 도의 (A)는 본 발명에 의한 도파관 결합장치의 구조를 개략적으로 나타낸 투시도, 제 1 도의 (B)는 상기 제 1 도의 도파관 결합장치의 측면 구조도.Figure 1 (A) is a perspective view schematically showing the structure of the waveguide coupling device according to the present invention, Figure 1 (B) is a side structure diagram of the waveguide coupling device of the first view.
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019920027383A KR940016987A (en) | 1992-12-31 | 1992-12-31 | Waveguide coupling device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019920027383A KR940016987A (en) | 1992-12-31 | 1992-12-31 | Waveguide coupling device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR940016987A true KR940016987A (en) | 1994-07-25 |
Family
ID=67220109
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019920027383A KR940016987A (en) | 1992-12-31 | 1992-12-31 | Waveguide coupling device |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR940016987A (en) |
-
1992
- 1992-12-31 KR KR1019920027383A patent/KR940016987A/en not_active Application Discontinuation
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| WITN | Withdrawal due to no request for examination |