KR940016829U - Automatic thickness deviation measuring device - Google Patents

Automatic thickness deviation measuring device

Info

Publication number
KR940016829U
KR940016829U KR2019920028212U KR920028212U KR940016829U KR 940016829 U KR940016829 U KR 940016829U KR 2019920028212 U KR2019920028212 U KR 2019920028212U KR 920028212 U KR920028212 U KR 920028212U KR 940016829 U KR940016829 U KR 940016829U
Authority
KR
South Korea
Prior art keywords
measuring device
thickness deviation
deviation measuring
automatic thickness
automatic
Prior art date
Application number
KR2019920028212U
Other languages
Korean (ko)
Other versions
KR950003845Y1 (en
Inventor
이태만
Original Assignee
포항종합제철 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 포항종합제철 주식회사 filed Critical 포항종합제철 주식회사
Priority to KR92028212U priority Critical patent/KR950003845Y1/en
Publication of KR940016829U publication Critical patent/KR940016829U/en
Application granted granted Critical
Publication of KR950003845Y1 publication Critical patent/KR950003845Y1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
KR92028212U 1992-12-31 1992-12-31 Thickness mesearing device KR950003845Y1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR92028212U KR950003845Y1 (en) 1992-12-31 1992-12-31 Thickness mesearing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR92028212U KR950003845Y1 (en) 1992-12-31 1992-12-31 Thickness mesearing device

Publications (2)

Publication Number Publication Date
KR940016829U true KR940016829U (en) 1994-07-25
KR950003845Y1 KR950003845Y1 (en) 1995-05-16

Family

ID=19349063

Family Applications (1)

Application Number Title Priority Date Filing Date
KR92028212U KR950003845Y1 (en) 1992-12-31 1992-12-31 Thickness mesearing device

Country Status (1)

Country Link
KR (1) KR950003845Y1 (en)

Also Published As

Publication number Publication date
KR950003845Y1 (en) 1995-05-16

Similar Documents

Publication Publication Date Title
DE59302175D1 (en) Optoelectronic measuring device
DE59108629D1 (en) Distance measuring device
DE69314474T2 (en) AUTOMATIC DOSING DEVICE
DE69127038T2 (en) Distance measuring device
DE59107958D1 (en) MEASURING DEVICE
DE69232149D1 (en) Measuring device
DK68189A (en) DEVICE FOR MEASUREMENT OF THE THICKNESS OF PROVIDED SECURITIES
DE69215884T2 (en) Measuring device
DE69121216D1 (en) Device for determining the direction
DE69117617D1 (en) Distance measuring device
DE69411970T2 (en) Deviation measuring device
NO934527D0 (en) Device for distance measurement
DE69428287D1 (en) MEASURING DEVICE
ATA39392A (en) MEASURING DEVICE
DE69309960T2 (en) HUMIDITY MEASURING DEVICE
DE59207010D1 (en) Measuring device
KR940016829U (en) Automatic thickness deviation measuring device
FI942582A (en) Measuring device
DE9307681U1 (en) Measuring device
ATA222893A (en) BEHAVIORAL-KINESIOLOGICAL MEASURING DEVICE
KR940023201U (en) Viscosity Automatic Measuring Device
DE9321274U1 (en) Position measuring device
KR930024658U (en) Automatic counting device
DE59406961D1 (en) Measuring device
DE9316077U1 (en) Measuring device

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
FPAY Annual fee payment

Payment date: 20030428

Year of fee payment: 9

LAPS Lapse due to unpaid annual fee