KR940016829U - Automatic thickness deviation measuring device - Google Patents
Automatic thickness deviation measuring deviceInfo
- Publication number
- KR940016829U KR940016829U KR2019920028212U KR920028212U KR940016829U KR 940016829 U KR940016829 U KR 940016829U KR 2019920028212 U KR2019920028212 U KR 2019920028212U KR 920028212 U KR920028212 U KR 920028212U KR 940016829 U KR940016829 U KR 940016829U
- Authority
- KR
- South Korea
- Prior art keywords
- measuring device
- thickness deviation
- deviation measuring
- automatic thickness
- automatic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR92028212U KR950003845Y1 (en) | 1992-12-31 | 1992-12-31 | Thickness mesearing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR92028212U KR950003845Y1 (en) | 1992-12-31 | 1992-12-31 | Thickness mesearing device |
Publications (2)
Publication Number | Publication Date |
---|---|
KR940016829U true KR940016829U (en) | 1994-07-25 |
KR950003845Y1 KR950003845Y1 (en) | 1995-05-16 |
Family
ID=19349063
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR92028212U KR950003845Y1 (en) | 1992-12-31 | 1992-12-31 | Thickness mesearing device |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR950003845Y1 (en) |
-
1992
- 1992-12-31 KR KR92028212U patent/KR950003845Y1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR950003845Y1 (en) | 1995-05-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
REGI | Registration of establishment | ||
FPAY | Annual fee payment |
Payment date: 20030428 Year of fee payment: 9 |
|
LAPS | Lapse due to unpaid annual fee |