KR940009234B1 - Wire surface detecting method - Google Patents

Wire surface detecting method Download PDF

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Publication number
KR940009234B1
KR940009234B1 KR1019920001023A KR920001023A KR940009234B1 KR 940009234 B1 KR940009234 B1 KR 940009234B1 KR 1019920001023 A KR1019920001023 A KR 1019920001023A KR 920001023 A KR920001023 A KR 920001023A KR 940009234 B1 KR940009234 B1 KR 940009234B1
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South Korea
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light
wire rod
wire
average
instantaneous value
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KR1019920001023A
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Korean (ko)
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KR930016761A (en
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계광희
박종범
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금성전선 주식회사
박원근
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The detector for detecting the non-uniformity of the wire surface includes a light stabilizing circuit (1) providing the stable light, a light projector (2) converting the stable light to the parallel light through a LED (LD), a light collector (4) collecting the reflected light from the wire surface, a DC converter (5) converting the collected light to DC voltage, an integrator (7) calculating the average light quantity, a high speed amplifier (6) calculating the instantaneous light quantity, a comparator (9) comparing the average and instantaneous values to get the difference, and a detection circuit (10) determining the non-uniformity of the wire surface.

Description

선재표면 검출방법Wire Rod Detection Method

제1도는 선재표면의 불균일성을 검출하기 위한 본 발명의 회로 구성도.1 is a circuit diagram of the present invention for detecting the nonuniformity of the wire surface.

* 도면의 주요부분에 대한 부호의 설명* Explanation of symbols for main parts of the drawings

1 : 광 안정화 회로 2 : 투광기1: light stabilization circuit 2: floodlight

3 : 선재 4 : 집광기3: wire rod 4: condenser

5 :전류, 전압변환부5: current, voltage converter

6 : 하이 스피드 앰프(High Speed Amp)6: High Speed Amp

7 : 적분기 8 : 증폭부7: integrator 8: amplifier

9 : 비교부 10 : 검출부9 comparison unit 10 detection unit

LD : 레이저 다이오드 DA : 차동증폭기LD: Laser Diode DA: Differential Amplifier

OP1: 상한 비교기 OP2: 하한 비교기OP 1 : upper limit comparator OP 2 : lower limit comparator

본 발명은 광시스템에서의 선재표면의 불균일성을 검출하기 위한 선재표면 검출방법에 관한 것이다.The present invention relates to a wire rod surface detection method for detecting nonuniformity of a wire rod surface in an optical system.

종래에는 광산란을 이용하여 선재표면의 불균일성을 검출하는 방법이 있었으나, 이는 첫째, 광산란량이 비례하지 않기 때문에 현장 적용에 매우 어려움이 있고, 둘째, 검출기준의 정량화가 매우 어렵기 때문에 현장 적용에도 큰 어려움이 있다.Conventionally, there was a method of detecting the nonuniformity of the wire surface by using light scattering, but, firstly, it is very difficult in the field application because the light scattering amount is not proportional, and second, it is very difficult in the field application because the detection criteria are very difficult to quantify. There is this.

이로 인하여, 선재표면의 불균일에 대한 정확성과, 그에 따른 고속성 및 비접촉성을 실현시키지 못하는 것이다.Because of this, the accuracy of the non-uniformity of the wire surface, and therefore the high speed and non-contact is not realized.

본 발명은 광산란을 용하지 않고, 투시된 광량을 직접 검출해주는 검출회로부를 구성한 선재표면 검출방법을 제공해 주므로서, 선재표면의 불균일에 대한 정확성과, 그에 따른 고속성 및 비접촉성을 실현시키고자 한 것으로서, 이를 첨부된 실시예에 따라 본 발명을 상세히 설명하면 다음과 같다.The present invention provides a wire rod surface detection method comprising a detection circuit unit for directly detecting the amount of light emitted without using light scattering, and thus to realize the accuracy of non-uniformity of the wire rod surface, and thus high speed and non-contact. As described above, the present invention will be described in detail according to the attached embodiment.

제1도는 주지한 바와 같이, 선재표면의 불균일성을 검출하기 위한 본 발명의 회로구성도로서, 제1도에서와 같이 구성되어 있다.1 is a circuit configuration diagram of the present invention for detecting the nonuniformity of the wire surface, as is well known, and is configured as in FIG.

제1도에 도시한 바와 같이, 광원을 출사하는 광안정화 회로(1)와, 광안정화 회로에서 출사된 광은 레이저 다이오드(LD)를 통해 평행광선으로 변환시키는 투광기(2)와, 투광기로부터 변환된 광선은 선재(3)를 통해 집광된 광선으로 출사하는 집광기(4)와, 집광기로부터 집광된 광선은 수광소자를 통해 전류전압으로 변환시키는 전류, 전압변환부(5)와, 전류, 전압변환부(5)로부터 전류전압으로 변환된 광선을 선재의 평균 광량으로 산출하기 위한 적분기(7), 그리고 선재의 순시치로 산출하는 하이 스피트 앰프(6)와, 상기 하이 스피드 앰프에서 산출된 선재의 순시치와 적분기에서 산출된 선재의 평균 광량(평균값)을 증폭하는 증폭부(8)와, 선재의 순시치와 평균치 값을 비교하여 계수기 및 신호처리로 보내, 현재 진행중인 선재의 평균값의 차이를 명확히 가려낼 수 있도록 해주기 위한 비교부(9)로 구성된다.As shown in FIG. 1, a light stabilization circuit 1 for emitting a light source, a light emitter 2 for converting light emitted from the light stabilization circuit into parallel light through a laser diode LD, and a conversion from a light projector. The collected light beams are collected by the wires 3 as the light beams condensed by the light condenser 4, and the light beams condensed from the light concentrators are converted into a current voltage through the light receiving element. The integrator 7 for calculating the average light quantity of the wire rod from the light source 5 converted to the current voltage, the high speed amplifier 6 for calculating the instantaneous value of the wire rod, and the instantaneous time of the wire rod calculated from the high speed amplifier. The amplification unit 8 which amplifies the average light quantity (average value) of the wire rod calculated from the value and the integrator, and compares the instantaneous value and the average value of the wire rod to the counter and signal processing to clearly mask the difference between the average value of the wire rod currently in progress. It may consist of a comparison unit 9 for now to.

따라서, 선재의 순시치와 선재의 평균값을 증폭하는 상기 증폭부(8)는 차동 증폭기(DA)로 구성되고, 현재의 진행중인 선재의 평균값의 차이를 명확히 가려낼 수 있도록 해주기 위한 상기 비교부(9)는 상한 비교기(OP1) 및 하한 비교기(OP2)로 구성된다.Therefore, the amplifying unit 8 which amplifies the instantaneous value of the wire rod and the average value of the wire rod is constituted by a differential amplifier DA, and the comparison unit 9 allows to clearly discriminate the difference between the average value of the current wire rod. ) Is composed of an upper limit comparator OP 1 and a lower limit comparator OP 2 .

상기와 같이 구성된 본 발명의 작용효과를 일 실시예에 따라 상세히 설명하면 다음과 같다.If described in detail according to an embodiment the effect of the present invention configured as described above are as follows.

먼저, 광안정화 회로(1)로 부터 출사된 광원은 레이저 다이오드(LD)를 통해 투광기(2)에 의하여 평행 광선으로 변환되고, 변환된 광선은 선재(3)를 지나, 집광기(4)에 의하여, 집광된 광선을 출사한 후, 수광소자로 보내게 되면, 변환부(5)에서는 수광된 광선을 전류, 전압으로 변환시킨다.First, the light source emitted from the light stabilization circuit 1 is converted into parallel light beams by the projector 2 through the laser diode LD, and the converted light beams pass through the wire rod 3 and are collected by the light collector 4. When the collected light beam is emitted and sent to the light receiving element, the conversion unit 5 converts the received light beam into current and voltage.

이렇게 변환된 광선은, 검출부(10)내의 이득(A=1)이 ×1인, 하이 스피드 앰프(6)에 의하여, 선재의 순시치를 산출함과 동시에, 적분기(7)에서는 선재의 평균광량(평균값)을 각각 산출한다.The converted light beam calculates the instantaneous value of the wire rod by the high speed amplifier 6 whose gain (A = 1) in the detector 10 is x1, and at the integrator 7, the average amount of light of the wire rod ( The average value) is calculated.

이때, 증폭기(8)내의 차동증폭기(DA)에서는, 각각 산출된 선재의 순시치(A)와 선재의 평균치(B)를 증폭하여 출력한다.At this time, the differential amplifier DA in the amplifier 8 amplifies and outputs the calculated instantaneous value A of the wire rod and the average value B of the wire rod, respectively.

여기서 A는 선재가 지나갈때마다 선재에 따라 순시치가 변환하는 선재의 순시치를 나타내며, B는 적분기가 A점 순시치의 시정수 1,000배 이상으로 유지하여, 적분하게 되면, 현재 프로세스 중에 있는 선재의 평균값을 각각 나타낸다.Where A represents the instantaneous value of the wire that the instantaneous value is converted according to the wire every time the wire passes, and B indicates that the integrator maintains more than 1,000 times the time constant of the instantaneous point A, and when integrated, the average value of the wire currently in process Represent each.

따라서, 비교부(9)내의 상한 비교기(OP1)와, 하한 비교기(OP2)에서는, 상기 차동증폭기(DA)에서 증폭된 선재의 순시치와 평균치 값을 비교하여, 계수기 및 신호처리기로 보내 주므로서, 현재 진행중인 선재의 평균값과 차이를 명확히 가려낼 수가 있다.Therefore, the upper limit comparator OP 1 and the lower limit comparator OP 2 in the comparator 9 compare the instantaneous values and average values of the wire rods amplified by the differential amplifier DA, and send them to the counter and the signal processor. As a result, the average value and the difference of the current wire rod can be clearly identified.

그리고, 차동증폭기(DA)의 출력단을 카운터나 프로세서등에 연결하여, 유용하게 사용할 수도 있는 것이다.In addition, the output terminal of the differential amplifier DA may be connected to a counter or a processor to be useful.

이상에서와 같이, 본 고안은 기존과 같이 광산란을 이용하지 않고, 투시된 광량을 검출해주는 검출회로부를 구성한 선재표면 검출방법을 제공해 주므로서, 선재표면의 불균일에 대한 정확성과, 그에 따른 고속성 및 비접촉성을 실현시킬 수 있는 효과를 제공하는 것이다.As described above, the present invention provides a wire rod surface detection method including a detection circuit unit that detects the amount of light emitted without using light scattering as before, and thus, the accuracy of the wire rod surface and its high speed and It is to provide an effect that can realize contactlessness.

Claims (3)

광원을 출사하는 광안정화 회로(1)와 광안정화 회로에서 출사된 광은 레이저 다이오드(LD)를 통해 평행광선으로 변환시키는 투광기(2)와 상기 투광기로부터 변환된 광선은 선재(3)를 통해 집광된 광선으로 출사하는 집광기(4)와 이 집광기로부터 집광된 광선은 수광소자를 통해 전류전압으로 변환시키는 전류전압변환부(5)를 포함하는 공지의 선재표면 검출방법에 있어서, 상기 전류전압변환부(5)를 직류전압으로 변환된 광선을 선재의 평균감량으로 산출하는 적분기(7) 및 선재의 순시치로 산출하는 하이 스피드 앰프(6)와 상기 하이 스피드 앰프에서 산출된 선재의 순시치와 적분기에서 산출된 선재의 평균 광량을 증폭하는 증폭부(8)와 연결하고 상기 증폭부(8)는 선재의 순시치와 평균치를 비교하여 계수기 및 신호처리로 보내 현재 진행중인 선재의 평균값 차이를 명확히 가려내기 위해 비교부(9)와 연결 구성된 검출회로부(10)와 연결하여 선재표면의 불균일성을 검출하도록 한 것을 특징으로 하는 선재표면 검출방법.The light stabilization circuit 1 for emitting a light source and the light emitted from the light stabilization circuit are converted to parallel light through a laser diode LD, and the light beams converted from the light projector are focused through the wire 3. In the known wire-surface detection method according to a known wire rod surface detection method comprising a light concentrator 4 which emits a light beam and a light beam condensed from the light concentrator is converted into a current voltage through a light receiving element. (5) the integrator (7) for calculating the average weight loss of the wire rod, and the high speed amplifier (6) for calculating the instantaneous value of the wire rod, and the instantaneous value and integrator of the wire rod calculated from the high speed amplifier. It is connected to the amplifying unit 8 which amplifies the average amount of light of the wire rod, and the amplifying unit 8 compares the instantaneous value of the wire rod with the average value and sends it to the counter and the signal processing. Wire surface detection method in order to clarify the difference covered in connection with the comparing section 9 and the connection detecting circuit configured (10), characterized in that to detect the non-uniformity of the pre-existing surface. 제1항에 있어서 선재의 순시치와 선재의 평균치값을 증폭하는 상기 증폭부(8)는 차동증폭기(DA)로 구성한 것을 특징으로 하는 선재표면의 검출방법.The method according to claim 1, wherein the amplifying unit (8) for amplifying the instantaneous value of the wire rod and the average value of the wire rod is constituted by a differential amplifier (DA). 제1항에 있어서 현재의 진행중인 선재의 평균값의 차이를 가려내기 위한 상기 비교부(9)는 상한 비교기(OP1)로 구성한 것을 특징으로 하는 선재표면의 검출방법.The method of detecting a surface of a wire rod according to claim 1, wherein the comparator (9) is configured with an upper limit comparator (OP 1 ) for screening out the difference in the average value of the current ongoing wire rod.
KR1019920001023A 1992-01-24 1992-01-24 Wire surface detecting method KR940009234B1 (en)

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KR1019920001023A KR940009234B1 (en) 1992-01-24 1992-01-24 Wire surface detecting method

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KR1019920001023A KR940009234B1 (en) 1992-01-24 1992-01-24 Wire surface detecting method

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KR940009234B1 true KR940009234B1 (en) 1994-10-01

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