KR930012119U - Automatic measuring device for real surface temperature of semiconductor injection mold - Google Patents
Automatic measuring device for real surface temperature of semiconductor injection moldInfo
- Publication number
- KR930012119U KR930012119U KR2019910019478U KR910019478U KR930012119U KR 930012119 U KR930012119 U KR 930012119U KR 2019910019478 U KR2019910019478 U KR 2019910019478U KR 910019478 U KR910019478 U KR 910019478U KR 930012119 U KR930012119 U KR 930012119U
- Authority
- KR
- South Korea
- Prior art keywords
- measuring device
- surface temperature
- injection mold
- automatic measuring
- real surface
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2019910019478U KR940007812Y1 (en) | 1991-11-14 | 1991-11-14 | Temperature measuring apparatus of semiconductor moulding surface |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2019910019478U KR940007812Y1 (en) | 1991-11-14 | 1991-11-14 | Temperature measuring apparatus of semiconductor moulding surface |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR930012119U true KR930012119U (en) | 1993-06-25 |
| KR940007812Y1 KR940007812Y1 (en) | 1994-10-24 |
Family
ID=19322223
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR2019910019478U KR940007812Y1 (en) | 1991-11-14 | 1991-11-14 | Temperature measuring apparatus of semiconductor moulding surface |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR940007812Y1 (en) |
-
1991
- 1991-11-14 KR KR2019910019478U patent/KR940007812Y1/en not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR940007812Y1 (en) | 1994-10-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| E902 | Notification of reason for refusal | ||
| E701 | Decision to grant or registration of patent right | ||
| REGI | Registration of establishment | ||
| FPAY | Annual fee payment |
Payment date: 20050922 Year of fee payment: 12 |
|
| EXPY | Expiration of term |