KR930011615U - 인덕턴스 측정 장치 - Google Patents

인덕턴스 측정 장치

Info

Publication number
KR930011615U
KR930011615U KR2019910019328U KR910019328U KR930011615U KR 930011615 U KR930011615 U KR 930011615U KR 2019910019328 U KR2019910019328 U KR 2019910019328U KR 910019328 U KR910019328 U KR 910019328U KR 930011615 U KR930011615 U KR 930011615U
Authority
KR
South Korea
Prior art keywords
measuring device
inductance measuring
inductance
measuring
Prior art date
Application number
KR2019910019328U
Other languages
English (en)
Other versions
KR950006425Y1 (ko
Inventor
이재승
Original Assignee
삼성전기 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 삼성전기 주식회사 filed Critical 삼성전기 주식회사
Priority to KR2019910019328U priority Critical patent/KR950006425Y1/ko
Publication of KR930011615U publication Critical patent/KR930011615U/ko
Application granted granted Critical
Publication of KR950006425Y1 publication Critical patent/KR950006425Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2611—Measuring inductance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • General Engineering & Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
KR2019910019328U 1991-11-13 1991-11-13 인덕턴스 측정 장치 KR950006425Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019910019328U KR950006425Y1 (ko) 1991-11-13 1991-11-13 인덕턴스 측정 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019910019328U KR950006425Y1 (ko) 1991-11-13 1991-11-13 인덕턴스 측정 장치

Publications (2)

Publication Number Publication Date
KR930011615U true KR930011615U (ko) 1993-06-25
KR950006425Y1 KR950006425Y1 (ko) 1995-08-10

Family

ID=19322102

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019910019328U KR950006425Y1 (ko) 1991-11-13 1991-11-13 인덕턴스 측정 장치

Country Status (1)

Country Link
KR (1) KR950006425Y1 (ko)

Also Published As

Publication number Publication date
KR950006425Y1 (ko) 1995-08-10

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Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
REGI Registration of establishment
LAPS Lapse due to unpaid annual fee