KR920021996A - Separate measuring device of R-C or R-L parallel circuit using multiplier - Google Patents
Separate measuring device of R-C or R-L parallel circuit using multiplier Download PDFInfo
- Publication number
- KR920021996A KR920021996A KR1019910008921A KR910008921A KR920021996A KR 920021996 A KR920021996 A KR 920021996A KR 1019910008921 A KR1019910008921 A KR 1019910008921A KR 910008921 A KR910008921 A KR 910008921A KR 920021996 A KR920021996 A KR 920021996A
- Authority
- KR
- South Korea
- Prior art keywords
- multiplier
- measuring device
- parallel circuit
- separate measuring
- converter
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2843—In-circuit-testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31915—In-circuit Testers
Abstract
내용 없음.No content.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제2도는 제1도에 따른 플로우 차트,2 is a flow chart according to FIG.
제3도는 본 발명 분리 측정 장치의 블럭도,3 is a block diagram of the separation measuring apparatus of the present invention,
제4도는 본 발명의 실시예를 나타낸 회로도.4 is a circuit diagram showing an embodiment of the present invention.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019910008921A KR940009817B1 (en) | 1991-05-30 | 1991-05-30 | R-c or r-l parallel circuit separating testing apparatus using multiplier |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019910008921A KR940009817B1 (en) | 1991-05-30 | 1991-05-30 | R-c or r-l parallel circuit separating testing apparatus using multiplier |
Publications (2)
Publication Number | Publication Date |
---|---|
KR920021996A true KR920021996A (en) | 1992-12-19 |
KR940009817B1 KR940009817B1 (en) | 1994-10-17 |
Family
ID=19315187
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910008921A KR940009817B1 (en) | 1991-05-30 | 1991-05-30 | R-c or r-l parallel circuit separating testing apparatus using multiplier |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR940009817B1 (en) |
-
1991
- 1991-05-30 KR KR1019910008921A patent/KR940009817B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR940009817B1 (en) | 1994-10-17 |
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A201 | Request for examination | ||
G160 | Decision to publish patent application | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20100927 Year of fee payment: 17 |
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EXPY | Expiration of term |