KR920020602A - Trench isolation method of semiconductor device - Google Patents
Trench isolation method of semiconductor device Download PDFInfo
- Publication number
- KR920020602A KR920020602A KR1019910005956A KR910005956A KR920020602A KR 920020602 A KR920020602 A KR 920020602A KR 1019910005956 A KR1019910005956 A KR 1019910005956A KR 910005956 A KR910005956 A KR 910005956A KR 920020602 A KR920020602 A KR 920020602A
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor device
- trench isolation
- isolation method
- sog
- forming
- Prior art date
Links
- 238000002955 isolation Methods 0.000 title claims description 3
- 239000004065 semiconductor Substances 0.000 title claims 2
- 238000000034 method Methods 0.000 claims description 2
- 238000005530 etching Methods 0.000 claims 2
- 238000000151 deposition Methods 0.000 claims 1
- 239000002019 doping agent Substances 0.000 claims 1
- 150000002500 ions Chemical class 0.000 claims 1
- 150000004767 nitrides Chemical class 0.000 claims 1
- 238000000059 patterning Methods 0.000 claims 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims 1
- 229920005591 polysilicon Polymers 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Element Separation (AREA)
Abstract
내용 없음No content
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제2도는 본 발명의 트렌치 격리 공정 단면도.2 is a cross-sectional view of a trench isolation process of the present invention.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019910005956A KR100192472B1 (en) | 1991-04-13 | 1991-04-13 | Trench isolation method of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019910005956A KR100192472B1 (en) | 1991-04-13 | 1991-04-13 | Trench isolation method of semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
KR920020602A true KR920020602A (en) | 1992-11-21 |
KR100192472B1 KR100192472B1 (en) | 1999-06-15 |
Family
ID=19313249
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019910005956A KR100192472B1 (en) | 1991-04-13 | 1991-04-13 | Trench isolation method of semiconductor device |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100192472B1 (en) |
-
1991
- 1991-04-13 KR KR1019910005956A patent/KR100192472B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR100192472B1 (en) | 1999-06-15 |
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A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
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FPAY | Annual fee payment |
Payment date: 20091222 Year of fee payment: 12 |
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